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公开(公告)号:US20210280620A1
公开(公告)日:2021-09-09
申请号:US17308332
申请日:2021-05-05
发明人: Seiji Takahashi , Chen-Jong Wang , Dun-Nian Yaung , Feng-Chi Hung , Feng-Jia Shiu , Jen-Cheng Liu , Jhy-Jyi Sze , Chun-Wei Chang , Wei-Cheng Hsu , Wei Chuang Wu , Yimin Huang
IPC分类号: H01L27/146
摘要: In some embodiments, a pixel sensor is provided. The pixel sensor includes a first photodetector arranged in a semiconductor substrate. A second photodetector is arranged in the semiconductor substrate, where a first substantially straight line axis intersects a center point of the first photodetector and a center point of the second photodetector. A floating diffusion node is arranged in the semiconductor substrate at a point that is a substantially equal distance from the first photodetector and the second photodetector. A pick-up well contact region is arranged in the semiconductor substrate, where a second substantially straight line axis that is substantially perpendicular to the first substantially straight line axis intersects a center point of the floating diffusion node and a center point of the pick-up well contact region.
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公开(公告)号:US20200266229A1
公开(公告)日:2020-08-20
申请号:US16526030
申请日:2019-07-30
发明人: Seiji Takahashi , Jhy-Jyi Sze
IPC分类号: H01L27/146
摘要: Various embodiments of the present disclosure are directed towards an image sensor. The image sensor includes a first semiconductor substrate having a photodetector and a floating diffusion node. A transfer gate is disposed over the first semiconductor substrate, where the transfer gate is at least partially disposed between opposite sides of the photodetector. A second semiconductor substrate is vertically spaced from the first semiconductor substrate, where the second semiconductor substrate comprises a first surface and a second surface opposite the first surface. A readout transistor is disposed on the second semiconductor substrate, where the second surface is disposed between the transfer gate and a gate of the readout transistor. A first conductive contact is electrically coupled to the transfer gate and extending vertically from the transfer gate through both the first surface and the second surface.
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3.
公开(公告)号:US09659987B2
公开(公告)日:2017-05-23
申请号:US14490824
申请日:2014-09-19
IPC分类号: H01L27/146
CPC分类号: H01L27/1463 , H01L27/14603 , H01L27/14614 , H01L27/14638 , H01L27/14641 , H01L27/14643 , H01L27/14687 , H01L27/14689
摘要: An active pixel sensor (APS) with a vertical transfer gate and a pixel transistor (e.g., a transfer transistor, a source follower transistor, a reset transistor, or a row select transistor) electrically isolated by an implant isolation region is provided. A semiconductor substrate has a photodetector buried therein. The vertical transfer gate extends into the semiconductor substrate with a channel region in electrical communication with the photodetector. The pixel transistor is arranged over the photodetector and configured to facilitate the pixel operation (e.g., reset, signal readout, etc.). The implant isolation region is arranged in the semiconductor substrate and surrounds and electrically isolates the pixel transistor. A method for manufacturing the APS is also provided.
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公开(公告)号:US20210005649A1
公开(公告)日:2021-01-07
申请号:US17022456
申请日:2020-09-16
发明人: Seiji Takahashi , Chen-Jong Wang , Dun-Nian Yaung , Feng-Chi Hung , Feng-Jia Shiu , Jen-Cheng Liu , Jhy-Jyi Sze , Chun-Wei Chang , Wei-Cheng Hsu , Wei Chuang Wu , Yimin Huang
IPC分类号: H01L27/146
摘要: In some embodiments, a pixel sensor is provided. The pixel sensor includes a first photodetector arranged in a semiconductor substrate. A second photodetector is arranged in the semiconductor substrate, where a first substantially straight line axis intersects a center point of the first photodetector and a center point of the second photodetector. A floating diffusion node is arranged in the semiconductor substrate at a point that is a substantially equal distance from the first photodetector and the second photodetector. A pick-up well contact region is arranged in the semiconductor substrate, where a second substantially straight line axis that is substantially perpendicular to the first substantially straight line axis intersects a center point of the floating diffusion node and a center point of the pick-up well contact region.
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公开(公告)号:US20200135779A1
公开(公告)日:2020-04-30
申请号:US16364478
申请日:2019-03-26
发明人: Seiji Takahashi
IPC分类号: H01L27/146 , H04N5/374
摘要: Various embodiments of the present disclosure are directed towards a pixel sensor including a first and second pair of photodetectors. The pixel sensor includes the first and second pair of photodetectors in a semiconductor substrate. The first pair of photodetectors are reflection symmetric with respect to a first line positioned at a midpoint between the first pair of photodetectors. The second pair of photodetectors are reflection symmetric with respect to a second line that intersects the first line at a center point. A first plurality of transistors overlying the semiconductor substrate laterally offset the first pair of photodetectors. A second plurality of transistors overlying the semiconductor substrate laterally offset the first plurality of transistors. The first and second pair of photodetectors are laterally between the first and second plurality of transistors. The first and second plurality of transistors are point symmetric with respect to the center point.
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公开(公告)号:US20190371838A1
公开(公告)日:2019-12-05
申请号:US16113101
申请日:2018-08-27
发明人: Seiji Takahashi , Chen-Jong Wang , Dun-Nian Yaung , Feng-Chi Hung , Feng-Jia Shiu , Jen-Cheng Liu , Jhy-Jyi Sze , Chun-Wei Chang , Wei-Cheng Hsu , Wei Chuang Wu , Yimin Huang
IPC分类号: H01L27/146
摘要: In some embodiments, a pixel sensor is provided. The pixel sensor includes a first photodetector arranged in a semiconductor substrate. A second photodetector is arranged in the semiconductor substrate, where a first substantially straight line axis intersects a center point of the first photodetector and a center point of the second photodetector. A floating diffusion node is arranged in the semiconductor substrate at a point that is a substantially equal distance from the first photodetector and the second photodetector. A pick-up well contact region is arranged in the semiconductor substrate, where a second substantially straight line axis that is substantially perpendicular to the first substantially straight line axis intersects a center point of the floating diffusion node and a center point of the pick-up well contact region.
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公开(公告)号:US11538837B2
公开(公告)日:2022-12-27
申请号:US17308332
申请日:2021-05-05
发明人: Seiji Takahashi , Chen-Jong Wang , Dun-Nian Yaung , Feng-Chi Hung , Feng-Jia Shiu , Jen-Cheng Liu , Jhy-Jyi Sze , Chun-Wei Chang , Wei-Cheng Hsu , Wei Chuang Wu , Yimin Huang
IPC分类号: H01L27/146
摘要: In some embodiments, a pixel sensor is provided. The pixel sensor includes a first photodetector arranged in a semiconductor substrate. A second photodetector is arranged in the semiconductor substrate, where a first substantially straight line axis intersects a center point of the first photodetector and a center point of the second photodetector. A floating diffusion node is arranged in the semiconductor substrate at a point that is a substantially equal distance from the first photodetector and the second photodetector. A pick-up well contact region is arranged in the semiconductor substrate, where a second substantially straight line axis that is substantially perpendicular to the first substantially straight line axis intersects a center point of the floating diffusion node and a center point of the pick-up well contact region.
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公开(公告)号:US11004880B2
公开(公告)日:2021-05-11
申请号:US17022456
申请日:2020-09-16
发明人: Seiji Takahashi , Chen-Jong Wang , Dun-Nian Yaung , Feng-Chi Hung , Feng-Jia Shiu , Jen-Cheng Liu , Jhy-Jyi Sze , Chun-Wei Chang , Wei-Cheng Hsu , Wei Chuang Wu , Yimin Huang
IPC分类号: H01L27/146
摘要: In some embodiments, a pixel sensor is provided. The pixel sensor includes a first photodetector arranged in a semiconductor substrate. A second photodetector is arranged in the semiconductor substrate, where a first substantially straight line axis intersects a center point of the first photodetector and a center point of the second photodetector. A floating diffusion node is arranged in the semiconductor substrate at a point that is a substantially equal distance from the first photodetector and the second photodetector. A pick-up well contact region is arranged in the semiconductor substrate, where a second substantially straight line axis that is substantially perpendicular to the first substantially straight line axis intersects a center point of the floating diffusion node and a center point of the pick-up well contact region.
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公开(公告)号:US20200266223A1
公开(公告)日:2020-08-20
申请号:US16547739
申请日:2019-08-22
发明人: Seiji Takahashi
IPC分类号: H01L27/146
摘要: Various embodiments of the present disclosure are directed towards an image sensor including a photodetector disposed in a semiconductor substrate. A floating diffusion node is disposed in the semiconductor substrate and is above the photodetector. A transfer gate electrode overlies the photodetector. The transfer gate electrode has a top conductive body overlying a top surface of the semiconductor substrate and a bottom conductive body extending from the top conductive body to below the floating diffusion node. A portion of the top conductive body directly overlies the floating diffusion node. A first sidewall of the top conductive body directly overlies the bottom conductive body.
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公开(公告)号:US10734419B2
公开(公告)日:2020-08-04
申请号:US16364478
申请日:2019-03-26
发明人: Seiji Takahashi
IPC分类号: H01L27/146 , H04N5/374
摘要: Various embodiments of the present disclosure are directed towards a pixel sensor including a first and second pair of photodetectors. The pixel sensor includes the first and second pair of photodetectors in a semiconductor substrate. The first pair of photodetectors are reflection symmetric with respect to a first line positioned at a midpoint between the first pair of photodetectors. The second pair of photodetectors are reflection symmetric with respect to a second line that intersects the first line at a center point. A first plurality of transistors overlying the semiconductor substrate laterally offset the first pair of photodetectors. A second plurality of transistors overlying the semiconductor substrate laterally offset the first plurality of transistors. The first and second pair of photodetectors are laterally between the first and second plurality of transistors. The first and second plurality of transistors are point symmetric with respect to the center point.
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