Group III-Nitride Crystal, Manufacturing Method Thereof, Group III-Nitride Crystal Substrate and Semiconductor Device
    2.
    发明申请
    Group III-Nitride Crystal, Manufacturing Method Thereof, Group III-Nitride Crystal Substrate and Semiconductor Device 有权
    第III族氮化物晶体及其制造方法,III族氮化物晶体基板和半导体器件

    公开(公告)号:US20080022921A1

    公开(公告)日:2008-01-31

    申请号:US11628253

    申请日:2005-04-15

    摘要: A method of manufacturing a group III-nitride crystal substrate including the steps of introducing an alkali-metal-element-containing substance, a group III-element-containing substance and a nitrogen-element-containing substance into a reactor, forming a melt containing at least the alkali metal element, the group III-element and the nitrogen element in the reactor, and growing group III-nitride crystal from the melt, and characterized by handling the alkali-metal-element-containing substance in a drying container in which moisture concentration is controlled to at most 1.0 ppm at least in the step of introducing the alkali-metal-element-containing substance into the reactor is provided. A group III-nitride crystal substrate attaining a small absorption coefficient and the method of manufacturing the same, as well as a group III-nitride semiconductor device can thus be provided.

    摘要翻译: 一种制造III族氮化物晶体基板的方法,包括以下步骤:将含碱金属元素的物质,含III族元素的物质和含氮元素的物质引入反应器中,形成含有 至少反应器中的碱金属元素,III族元素和氮元素,以及来自熔体的生长III族氮化物晶体,其特征在于在干燥容器中处理含碱金属元素的物质,其中 至少在将含碱金属元素的物质引入反应器的步骤中,水分浓度被控制在至多1.0ppm。 可以提供获得小吸收系数的III族氮化物晶体基板及其制造方法,以及III族氮化物半导体器件。

    Method of manufacturing group-III nitride crystal
    3.
    发明授权
    Method of manufacturing group-III nitride crystal 有权
    III族氮化物晶体的制造方法

    公开(公告)号:US07288151B2

    公开(公告)日:2007-10-30

    申请号:US10999338

    申请日:2004-11-29

    IPC分类号: C30B11/14

    摘要: There is provided a method of manufacturing a group-III nitride crystal in which a nitrogen plasma is brought into contact with a melt containing a group-III element and an alkali metal to grow the group-III nitride crystal. Furthermore, there is also provided a method of manufacturing a group-III nitride crystal in which the group-III nitride crystal is grown on a substrate placed in a melt containing a group-III element and an alkali metal, with a minimal distance between a surface of the melt and a surface of the substrate set to be at most 50 mm.

    摘要翻译: 提供了一种制造III族氮化物晶体的方法,其中使氮等离子体与含有III族元素和碱金属的熔体接触以生长III族氮化物晶体。 此外,还提供了一种III族氮化物晶体的制造方法,其中III族氮化物晶体在放置在含有III族元素和碱金属的熔体中的基板上生长,其中 熔体的表面和基板的表面设定为至多50mm。

    Group III-Nitride Crystal Substrate and Manufacturing Method Thereof, and Group III-Nitride Semiconductor Device
    4.
    发明申请
    Group III-Nitride Crystal Substrate and Manufacturing Method Thereof, and Group III-Nitride Semiconductor Device 审中-公开
    III族氮化物晶体基板及其制造方法和III-III族氮化物半导体器件

    公开(公告)号:US20070296061A1

    公开(公告)日:2007-12-27

    申请号:US11578242

    申请日:2005-03-30

    IPC分类号: H01L29/20 C03B17/00

    摘要: A method of manufacturing a group III-nitride crystal substrate including the steps of introducing an alkali-metal-element-containing substance, a group III-element-containing substance and a nitrogen-element-containing substance into a reactor, forming a melt containing at least the alkali metal element, the group III-element and the nitrogen element in the reactor, and growing group III-nitride crystal from the melt, and characterized by handling the alkali-metal-element-containing substance in a drying container in which moisture concentration is controlled to at most 1.0 ppm at least in the step of introducing the alkali-metal-element-containing substance into the reactor is provided. A group III-nitride crystal substrate attaining a small absorption coefficient and the method of manufacturing the same, as well as a group III-nitride semiconductor device can thus be provided.

    摘要翻译: 一种制造III族氮化物晶体基板的方法,包括以下步骤:将含碱金属元素的物质,含III族元素的物质和含氮元素的物质引入反应器中,形成含有 至少反应器中的碱金属元素,III族元素和氮元素,以及来自熔体的生长III族氮化物晶体,其特征在于在干燥容器中处理含碱金属元素的物质,其中 至少在将含碱金属元素的物质引入反应器的步骤中,水分浓度被控制在至多1.0ppm。 可以提供获得小吸收系数的III族氮化物晶体基板及其制造方法,以及III族氮化物半导体器件。

    Group III-nitride crystal, manufacturing method thereof, group III-nitride crystal substrate and semiconductor device
    5.
    发明授权
    Group III-nitride crystal, manufacturing method thereof, group III-nitride crystal substrate and semiconductor device 有权
    III族氮化物晶体,其制造方法,III族氮化物晶体衬底和半导体器件

    公开(公告)号:US08038794B2

    公开(公告)日:2011-10-18

    申请号:US11628253

    申请日:2005-04-15

    IPC分类号: C30B29/38

    摘要: A method of manufacturing a group III-nitride crystal substrate including the steps of introducing an alkali-metal-element-containing substance, a group III-element-containing substance and a nitrogen-element-containing substance into a reactor, forming a melt containing at least the alkali metal element, the group III-element and the nitrogen element in the reactor, and growing group III-nitride crystal from the melt, and characterized by handling the alkali-metal-element-containing substance in a drying container in which moisture concentration is controlled to at most 1.0 ppm at least in the step of introducing the alkali-metal-element-containing substance into the reactor is provided. A group III-nitride crystal substrate attaining a small absorption coefficient and the method of manufacturing the same, as well as a group III-nitride semiconductor device can thus be provided.

    摘要翻译: 一种制造III族氮化物晶体基板的方法,包括以下步骤:将含碱金属元素的物质,含III族元素的物质和含氮元素的物质引入反应器中,形成含有 至少反应器中的碱金属元素,III族元素和氮元素,以及来自熔体的生长III族氮化物晶体,其特征在于在干燥容器中处理含碱金属元素的物质,其中 至少在将含碱金属元素的物质引入反应器的步骤中,水分浓度被控制在至多1.0ppm。 可以提供获得小吸收系数的III族氮化物晶体基板及其制造方法,以及III族氮化物半导体器件。