摘要:
The present invention discloses a system for analyzing elements contained in a sample in very slight amounts, such as C, S, O, N, H and the like in materials, such as steel and ceramics. An element analyzer can gasify the sample elements in an appropriate gas, such as oxygen gas in a high-frequency heating furnace or an electric resistant furnace. Resulting gas can be introduced into a mass spectrometer to permit a quantitative analysis of the sample elements. A metal sample can be levitated and heated and melted with induction current for producing the resultant gas for introduction to a mass spectrometer.
摘要:
In situ monitoring of a degradation level of refined oil during use is provided. An excitation light irradiation part varies intensity of excitation light to irradiate the excitation light onto the refined oil with a resulting fluorescence. A fluorescence intensity detection part detects the intensity of fluorescence generated by the irradiation of the excitation light, and a time lag characteristic calculation part calculates a time lag characteristic of a fluorescence intensity variation with respect to the intensity variation of the excitation light. A degradation index value acquisition part provides to a predetermined correlation between a degradation index value indicating a degradation level of the refined oil and the time lag characteristic is used to acquire a degradation index value from a time lag characteristic calculated in the time lag characteristic calculation part t determine the current degradation status of the oil.
摘要:
An infrared microscopic spectrometer includes an optical system which allows for a shifting of the optical path interactive with a sample from a sample transmissive optical path to an optical path through an ATR crystal using ATR analysis. In the shown embodiment, the shift in the optical path is in a direction perpendicular to a transmissive optical axis, at least along a portion of the shift adjacent to the transmissive optical axis. The shift is undertaken by a moving means which moves the collecting element providing the infrared rays. A sample-holding structure allows the ATR crystal to be rotated or detachably removed, as necessary.
摘要:
An infrared spectrometer disperses a radiation ray from a catalyst which has been exposed to a gas for evaluation to adsorb adsorbates thereon, and outputs spectral data in accordance with a wavenumber of the radiation ray to a computer storing reference data. The computer normalizes the spectral data and the reference data, and then, it calculates a product of the normalized spectral data and the reference data. Thereafter, a function of the product is differentiated with respect to the wavenumber to obtain a differential function. Accordingly, a specified wavenumber for which the differential function is zero is determined, so that the common peak of the spectral data and the reference data at the specified wavenumber is accurately determined.
摘要:
A microscopic spectrometer having a separate optical path for masking light from a sample for spectrometric measurements. In the preferred embodiment, a beam splitter is disposed behind an object lens to form two branched optical paths. One of the optical paths is provided with masks at a point of focus along the path, allowing part of the image to be masked. The second optical path allows optical throughput and observation of the entire image. These two optical paths are rejoined, and a final image is obtained for visual inspection by synthesizing the two optical paths.
摘要:
A microscopic spectrometer is disclosed wherein a sample can be irradiated with light from a first light source and either transmitted or reflected through the sample to a spectrometrical measuring system. A half mirror can be detachably provided in the optical system to form two branched optical paths. A second light source can be positioned to irradiate the sample 2 with light through a masking system. The half mirror can transmit the image of the masking system to superimpose it upon the sample and a composite image can then be reflected from the half mirror onto a branched optical path to be observed by the operator. The operator can adjust the actual positions of the masks assembly, while, at the same time, see the entire field of view of the specimen to therefore define in an easy and convenient manner the portion of the specimen to be tested. The respective half mirror and second light source can then be removed prior to performing a spectrometric measurement.
摘要:
Provided is an optical analyzer which can promote enhancement of measurement sensitivity, cost reduction, size reduction, structural flexibility, disturbance resistance, and the like, at the same time. A laser device to be used in such optical analyzer is also provided. An optical analyzer comprises a laser light source (2); a wavelength selection element (3) for selecting and leading out light having a wavelength substantially equal to the absorption wavelength of an analysis object from among light outputted from the laser light source (2); an optical detection means (5) for detecting the intensity of light red out from the wavelength selection element (3); and a drive current control means (6) for increasing or decreasing the drive current of the laser light source (2) near a specified current value thereof for outputting light of the absorption wavelength, and setting the drive current at such a current value as the intensity of light detected by the optical detection means (5) has a peak value. The laser light source (2), the wavelength selection element (3), and the optical detection means (5) are mounted on a single substrate (11) which can regulate the temperature to a constant level.
摘要:
A method for monitoring and/or controlling the positioning and/or condition of a plasma in a plasma spectrometer, which comprises: acquiring image data of the plasma through a video-camera (7), and a) displaying on a display device (10) a plasma image from the acquired image data; and/or b) storing the image data in a computer unit (9). Application to inductively coupled high frequency plasma optical emission and mass spectrometers.
摘要:
An analytical system capable of analyzing data by means of an analytical machine or tool and providing that analytical data to a computer for processing is provided. A protocol conversion radio machine is provided corresponding to each analytical machine and tool to be controlled and data can be communicated in a wireless manner between the analytical machine and tool and a plurality of computers. The protocol conversion radio machines cannot only mutually communicate with the plurality of computers but also can give and receive control signals to assist in the accumulation and transmission of analytical data between the computers and the analytical machines and tools.
摘要:
An analytical method capable of easily, rapidly, and accurately determining concentrations of a multi-component aqueous solution. Near-infrared spectra of a standard solution containing k components of known concentrations are measured n times within a range of 1,500 to 1,850 nm. A loading matrix of p columns by m rows and an intermediate matrix of k columns by m rows for an appointed factor number m are obtained from a response matrix of p columns by n rows consisting of p absorbance values of the respective spectra in a calibration stage and p absorbance values of a near-infrared spectrum within a wavelength range of 1,500 to 1,850 nm of a test liquid. The test liquid contains k components including pure water of unknown concentrations. The concentrations of the k components are determined from a group of absorbance values and the loading and intermediate matrices obtained in the calibration stage by a matrix operation in an prediction stage. In the calibration stage, k+1 characteristic contents can be obtained by adding a solution temperature as one of characteristic items, and k concentration values and one temperature value can be obtained in the prediction stage.