摘要:
The present invention provides a protective maintenance service system capable of raising an alarm for the replacement of a part when the degradation of an inspection required part reaches the prescribed criteria of replacement. Of the respective inspection required parts stored in the vehicle inspection parts database for the respective vehicles stored in the vehicle database provided by a business unit in advance, the time of part replacement is determined on the basis of the data detected by a part condition sensor for a part having a part condition sensor, and on the basis of the time, which is obtained from the service life compensated with an actual service environment, for a part without a part condition sensor.
摘要:
In a system wherein, a point value is set as a consideration for a service to be offered, a point value to be received as a consideration when a service is given is informed to a service user who desires to receive the service and when the service has been offered, the service provider receives the point value from the service user as the consideration of the service offering, thereby, a service providing system or a processing method of providing services is realized which can provides services more easily to service users.
摘要:
An image forming apparatus removably having an operation panel having a display unit, an imaging unit and a wireless communication unit communicable with the image forming apparatus. In a status where the operation panel is not mounted on the image forming apparatus, an image indicating an operation method is combined with a video image obtained by the imaging unit and displayed on the display unit, and the combined image is displayed.
摘要:
An image-forming method includes a first image-forming step of forming an image on a fabric with a first ink composition and a second image-forming step of forming an image on the fabric with a second ink composition subsequently to the first image-forming step. The first ink composition contains a first colorant. The second ink composition contains a second colorant. The first colorant has an average particle size less than that of the second colorant.
摘要:
A multivariable transmitter has a microprocessor for executing a computation processing task such as calculating a differential pressure value and static pressure with using a plurality of physical quantity signals. The microprocessor executes a processing for obtaining data from a sensor every computation processing task and executes the computation processing task in a time-division manner.
摘要:
An object of the present invention is to provide a microcapsule for an electrophoretic display device which can suppress reduction in later contrast even when the electrophoretic display device is allowed to stand under the high temperature and high humidity condition, favorably, under the high temperature and high humidity condition for a long time (e.g. under 60° C., 90% RH for 24 hours). As a means of achieving this object, a microcapsule according to the present invention for an electrophoretic display device comprises an electrophoretic fine particle and a solvent both of which are encapsulated in a shell, and is characterized in that an amount of an alkaline metal ion in the whole microcapsule is 150 ppm or smaller.
摘要:
A device for injecting a substance into a cell includes a flow path through which a cell is transported, a transported-cell detecting unit that detects the cell transported through the flow path, a cell capturing unit that captures the cell detected by the transported-cell detecting unit, a captured-cell detecting unit that detects the cell captured by the cell capturing unit and determines a position of the cell captured, and a substance injecting unit that injects a substance into the cell captured by the cell capturing unit based on the position determined.
摘要:
An image forming apparatus is arranged to form an image with laser light emitted from a semiconductor laser source, and is constructed so as to protect the laser source from a breakdown, by regulating electric current flowing to the laser source no matter when an adjusting circuit for adjusting the light amount of the semiconductor laser source is apt to supply the electric current that could break the laser source, to the laser source. The apparatus is constructed in such structure that during an automatic light amount control period the laser light amount emitted from the semiconductor laser source is detected and a current source circuit is made inactive when the light amount detected is over a set light amount and that during periods other than the control period the electric current flowing to the semiconductor laser is detected and the current source circuit is made inactive when the light amount detected becomes over a fixed ratio times the current detected during the automatic light amount control period. In this way, the protection circuit can operate effectively anytime of emission of the laser source, so as to protect the laser source from the breakdown.
摘要:
An image processing apparatus includes an image processing unit, a counter, and a determining unit. The image processing unit processes image data between first and second color values of an input image. The counter counts generation frequencies of the respective color values of the input image. The determining unit determines the first and second color values on the basis of the count result obtained by the counter.
摘要:
An electron beam tester scans a sample with an electron beam to provide a secondary electron image, matches wiring patterns of the secondary electron image with wiring patterns prepared from CAD data, measures voltages of the wiring patterns, and corrects deformation of the secondary electron image. The electron beam tester comprises a pattern matching unit, a wiring pattern tester, a secondary electron image corrector, a wiring pattern inspection unit, and a pattern matching processor. The pattern matching unit simply and quickly matches the wiring patterns of the secondary electron image with the wiring patterns prepared from the CAD data. The wiring pattern tester detects slippage between layers of a multilayered semiconductor chip and correctly positions the electron beam on the chip during a pattern matching operation. The secondary electron image corrector accurately and automatically corrects deformation of the secondary electron image. The wiring pattern inspection unit simply and correctly determines a threshold used for preparing a binary image, to correctly carry out a pattern matching operation. The pattern matching processor accurately detects edges out of a blurred image, to correctly carry out a pattern matching operation.