Polymers containing sulphonyl and carboxylic ester groups
    1.
    发明授权
    Polymers containing sulphonyl and carboxylic ester groups 失效
    含有磺酰基和羧酸酯基团的聚合物

    公开(公告)号:US4535139A

    公开(公告)日:1985-08-13

    申请号:US491682

    申请日:1983-05-05

    CPC classification number: C08F228/02

    Abstract: Polymers obtained by radical polymerization and containing(A) from 0.1 to 80 mole percent of polymerized units corresponding to the following formula ##STR1## in which R.sub.1 represents hydrogen or methyl,R.sub.2 represents alkyl, particularly primary or secondary alkyl containing from 1 to 4 carbon atoms, andR.sub.3 represents hydrogen or alkyl, particularly primary or secondary alkyl containing from 1 to 4 carbon atoms, and in which the sulphonic acid group may be present in the form of a salt, and(B) from 20 to 99.9 mole percent of polymerized units of one or more ethylenically unsaturated monomers, are particularly suitable for the production of filaments, fibres and films having a high absorption capacity for basic dyes.

    Abstract translation: 通过自由基聚合获得的聚合物,其含有(A)0.1至80摩尔%的对应于下式的成像单元(IMAGE),其中R 1表示氢或甲基,R 2表示烷基,特别是含有1至4个碳原子的伯或仲烷基 原子,R 3表示氢或烷基,特别是含有1至4个碳原子的伯或仲烷基,其中磺酸基团可以盐形式存在,(B)20-99.9摩尔% 一种或多种烯键式不饱和单体的聚合单元特别适用于生产碱性染料具有高吸收能力的长丝,纤维和薄膜。

    System and method for localizing and passivating defects in a photovoltaic element
    10.
    发明申请
    System and method for localizing and passivating defects in a photovoltaic element 审中-公开
    用于定位和钝化光伏元件中的缺陷的系统和方法

    公开(公告)号:US20110156716A1

    公开(公告)日:2011-06-30

    申请号:US13060412

    申请日:2009-08-28

    CPC classification number: H02S50/10 G01R31/025

    Abstract: The present invention relates to a system and method for localizing defects causing leakage currents in a photovoltaic element (100), a system and method for passivating defects causing leakage currents in a photovoltaic element and a system and method for passivating a shunt in a roll-to-roll photovoltaic element comprising the steps of illuminating an area (130), having at least a minimum size, of the photovoltaic element; measuring at least one electrical value of an electrical potential between electrodes of the photovoltaic element at least one specific measurement position within the illuminated area on one of the electrodes of the photovoltaic element; and determining a position of a defect based on the measured at least one photomduced electrical value and the at least one specific measurement position.

    Abstract translation: 本发明涉及用于定位导致光电元件(100)中的漏电流的缺陷的系统和方法,用于钝化导致光伏元件中的漏电流的缺陷的系统和方法以及用于钝化光伏元件中的分流的方法, 所述光伏元件包括以下步骤:照射具有至少最小尺寸的光伏元件的区域(130); 测量所述光伏元件的电极之间的电位的至少一个电值,所述光电元件的所述电极中的一个电极中的所述照明区域内的至少一个特定测量位置; 以及基于所测量的至少一个光致电值和所述至少一个特定测量位置来确定缺陷的位置。

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