METHOD FOR MANUFACTURING OPTICAL DEVICE AND OPTICAL DEVICE
    1.
    发明申请
    METHOD FOR MANUFACTURING OPTICAL DEVICE AND OPTICAL DEVICE 审中-公开
    制造光学器件和光学器件的方法

    公开(公告)号:US20150214423A1

    公开(公告)日:2015-07-30

    申请号:US14481971

    申请日:2014-09-10

    CPC classification number: H01L33/42 H01L33/007 H01L33/06 H01L33/18 H01L33/24

    Abstract: A method for manufacturing an optical device includes forming a mask on main surface of a first GaN layer such that the mask has one or more openings in first region on the main surface of the first layer, selectively growing first GaN in the opening such that core including the first GaN is formed on exposed portion of the first layer, forming an active layer on the core such that active region is formed, forming a second GaN layer on the active region, removing a portion of the mask covering second region, forming a first electrode in the second region on the first layer, forming a second electrode covering the second layer and extending onto the mask in third region on the first layer, forming a first pad on the first electrode, and forming a second pad in a pad-forming region of the second electrode in the third region.

    Abstract translation: 一种光学器件的制造方法包括在第一GaN层的主表面上形成掩模,使得掩模在第一层的主表面上的第一区域中具有一个或多个开口,在开口中选择性地生长第一GaN,使得芯 包括在所述第一层的暴露部分上形成所述第一GaN,在所述芯上形成有源层,使得形成有源区,在所述有源区上形成第二GaN层,去除所述掩模覆盖第二区的一部分,形成 在第一层上的第二区域中的第一电极,形成覆盖第二层并在第一层上的第三区域延伸到掩模上的第二电极,在第一电极上形成第一焊盘, 在第三区域中形成第二电极的区域。

    FILM FORMING METHOD AND FILM FORMING APPARATUS

    公开(公告)号:US20240052483A1

    公开(公告)日:2024-02-15

    申请号:US18232926

    申请日:2023-08-11

    CPC classification number: C23C16/32 C23C16/45553

    Abstract: A method of forming a SiOC-based film includes: preparing a substrate; forming a SiC-based film on the substrate by using a carbon precursor made of a carbon-containing gas and a silicon precursor made of a silicon-containing gas; forming the SiOC-based film by performing oxidation process on the SiC-based film on the substrate; and performing a processing with plasma of a gas containing a H2 gas on the SiOC-based film on the substrate, wherein the forming the SiC-based film is performed before the SiC-based film has a first given film thickness, the forming the SiC-based film and the forming the SiOC-based film by the oxidation process are executed once or multiple times before the SiOC-based film has a second given film thickness, and an operation of forming the SiOC-based film to have the second given film thickness and the performing the processing with the plasma are executed once or multiple times.

    FILM FORMING METHOD
    4.
    发明公开
    FILM FORMING METHOD 审中-公开

    公开(公告)号:US20230357923A1

    公开(公告)日:2023-11-09

    申请号:US18043766

    申请日:2021-08-30

    Abstract: A film forming method of forming a metal-containing aluminum oxide layer on a substrate having at least a metal layer on a surface thereof includes: a first operation of forming an aluminum oxide layer on the substrate with an aluminum-containing precursor and an oxidant; and a second operation of forming a metal oxide layer on the substrate with the oxidant and a precursor including a first metal other than aluminum. Assuming that a dielectric constant of only an oxide of the first metal is ε1 and a molar ratio of the first metal to all metals in the metal-containing aluminum oxide layer is X, the formed metal-containing aluminum oxide layer satisfies a following condition (1) or (2): X>⅓ and ε1

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