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    SEMICONDUCTOR DEVICES WITH 2DEG AND 2DHG
    2.
    发明申请
    SEMICONDUCTOR DEVICES WITH 2DEG AND 2DHG 有权
    具有2DEG和2DHG的半导体器件

    公开(公告)号：US20130221409A1

    公开(公告)日：2013-08-29

    申请号：US13812725

    申请日：2011-06-07

    申请人： Akira Nakajima ,  Sankara Narayanan Ekkanath Madathil

    发明人： Akira Nakajima ,  Sankara Narayanan Ekkanath Madathil

    IPC分类号： H01L29/778

    CPC分类号： H01L29/7782 ,  H01L27/095 ,  H01L29/1029 ,  H01L29/2003 ,  H01L29/42316 ,  H01L29/7786 ,  H01L29/7787 ,  H01L29/782 ,  H01L29/872

    摘要： A semiconductor device comprises three semiconductor layers. The semiconductor layers are arranged to form a 2DHG and a 2DEG separated by a polarization layer. The device comprises a plurality of electrodes: first and second electrodes electrically connected to the 2DHG so that current can flow between them via the 2DHG and a third electrode electrically connected to the 2DEG so that when a positive voltage is applied to the third electrode, with respect to at least one of the other electrodes, the 2DEG and the 2DHG will be at least partially depleted.

    摘要翻译： 半导体器件包括三个半导体层。 半导体层被布置成形成由偏振层分离的2DHG和2DEG。 该装置包括多个电极：电连接到2DHG的第一和第二电极，使得电流可以经由2DHG在它们之间流动，第三电极与2DEG电连接，使得当正电压施加到第三电极时， 相对于至少一个其它电极，2DEG和2DHG将至少部分耗尽。

    Board inspection apparatus and method and apparatus for setting inspection logic thereof
    4.
    发明授权
    Board inspection apparatus and method and apparatus for setting inspection logic thereof 有权
    板检查装置及其检查逻辑的设置方法和装置

    公开(公告)号：US07720274B2

    公开(公告)日：2010-05-18

    申请号：US11377938

    申请日：2006-03-16

    申请人： Takatoshi Katahata ,  Hirotaka Wada ,  Toshihiro Moriya ,  Atsushi Shimizu ,  Akira Nakajima

    发明人： Takatoshi Katahata ,  Hirotaka Wada ,  Toshihiro Moriya ,  Atsushi Shimizu ,  Akira Nakajima

    IPC分类号： G06K9/00

    CPC分类号： G06T7/001 ,  G06T2207/30141 ,  G06T2207/30148 ,  G06T2207/30152

    摘要： In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.

    摘要翻译： 在生成新分量的检验逻辑时，获得新分量的图像，计算出新分量聚焦区域选定特征的趋势数据; 通过将新组件的趋势数据与先前检查的组件的趋势数据进行比较来选择具有与新组件类似的特征的先前检查的组件，从存储设备读取所选（先前检查）组件的图像， 并且使用新组件的图像和先前检查的组件的图像作为教学数据来生成新组件的检查逻辑。

    PC board inspecting method and apparatus and inspection logic setting method and apparatus
    5.
    发明授权
    PC board inspecting method and apparatus and inspection logic setting method and apparatus 有权
    PC板检查方法及装置及检查逻辑设定方法及装置

    公开(公告)号：US07715616B2

    公开(公告)日：2010-05-11

    申请号：US11358914

    申请日：2006-02-21

    申请人： Toshihiro Moriya ,  Hirotaka Wada ,  Takako Onishi ,  Atsushi Shimizu ,  Akira Nakajima

    发明人： Toshihiro Moriya ,  Hirotaka Wada ,  Takako Onishi ,  Atsushi Shimizu ,  Akira Nakajima

    IPC分类号： G06K9/00

    CPC分类号： H05K13/08

    摘要： A PC board inspecting method capable of detecting deviation of an IC component at high speed with small storage capacity utilizes inspection logic particular to a component to be inspected. The inspection logic includes a color condition for specifying a color appearing in the body of the component to be inspected. The component is radiated with a plurality of color rays at different angles of incidence. An image formed by reflection light of the color rays is captured, and an inspection image including at least part of an edge of the body of the component to be inspected is captured. By using the color condition, a component body area satisfying the color condition is extracted from the inspection image by an image process.

    摘要翻译： 能够以小的存储容量检测IC组件在高速下的偏差的PC板检查方法利用要检查的部件特有的检查逻辑。 检查逻辑包括用于指定出现在要检查的部件的主体中的颜色的颜色条件。 该组件以不同入射角的多根彩色光线照射。 捕获由彩色光线的反射光形成的图像，并且捕获包括要检查的部件的主体的边缘的至少一部分的检查图像。 通过使用颜色条件，通过图像处理从检查图像中提取满足色彩条件的部件体区域。

    Light emitting device, driving method thereof, and image forming apparatus
    7.
    发明申请
    Light emitting device, driving method thereof, and image forming apparatus 有权

    公开(公告)号：US20090114858A1

    公开(公告)日：2009-05-07

    申请号：US12314985

    申请日：2008-12-19

    申请人： Akira Nakajima

    发明人： Akira Nakajima

    IPC分类号： G09G3/36 ,  H04N1/00

    CPC分类号： H04N1/40031 ,  H04N1/4015

    摘要： A light emitting device includes: a plurality of light emitting elements that emit light to have luminosity depending on the magnitude of a driving signal; a plurality of holding units that are respectively disposed in the plurality of light emitting elements, and respectively hold the driving signal to maintain a magnitude regulated such that the luminosity of the plurality of light emitting elements becomes uniform; and a plurality of supply units that are respectively disposed in the plurality of light emitting elements, and supply the driving signal, which is held by the holding units to have a certain magnitude for a period of time according to a gradation of light to be emitted, to a corresponding light emitting element.

    Light emitting device, driving method thereof, and image forming apparatus
    8.
    发明授权
    Light emitting device, driving method thereof, and image forming apparatus 有权
    发光装置及其驱动方法以及图像形成装置

    公开(公告)号：US07485886B2

    公开(公告)日：2009-02-03

    申请号：US11467359

    申请日：2006-08-25

    申请人： Akira Nakajima

    发明人： Akira Nakajima

    IPC分类号： G09G3/36

    CPC分类号： H04N1/40031 ,  H04N1/4015

    摘要： A light emitting device includes: a plurality of light emitting elements that emit light to have luminosity depending on the magnitude of a driving signal; a plurality of holding units that are respectively disposed in the plurality of light emitting elements, and respectively hold the driving signal to maintain a magnitude regulated such that the luminosity of the plurality of light emitting elements becomes uniform; and a plurality of supply units that are respectively disposed in the plurality of light emitting elements, and supply the driving signal, which is held by the holding units to have a certain magnitude for a period of time according to a gradation of light to be emitted, to a corresponding light emitting element.

    摘要翻译： 发光器件包括：多个发光元件，其发光，具有取决于驱动信号的大小的亮度; 多个保持单元分别设置在多个发光元件中，并分别保持驱动信号以保持调节幅度，使得多个发光元件的亮度均匀; 以及分别设置在所述多个发光元件中的多个供给单元，并且根据要发射的光的灰度将由所述保持单元保持的驱动信号提供一定时间长度的驱动信号 ，到相应的发光元件。

    Ultrasonic sensor
    9.
    发明授权
    Ultrasonic sensor 有权
    超声波传感器

    公开(公告)号：US07398687B2

    公开(公告)日：2008-07-15

    申请号：US11715395

    申请日：2007-03-08

    申请人： Akira Nakajima ,  Yasuhiro Kawashima ,  Hiroyuki Kani ,  Tadao Shimizu

    发明人： Akira Nakajima ,  Yasuhiro Kawashima ,  Hiroyuki Kani ,  Tadao Shimizu

    IPC分类号： G01N9/18 ,  B60Q1/00

    CPC分类号： G01N29/24 ,  B60R19/483 ,  G01N29/223 ,  G01S7/521 ,  G10K11/004

    摘要： A cover member of an ultrasonic sensor has a first engagement portion and a second engagement portion, which are respectively engaged with a third engagement portion and a fourth engagement portion of a sensor body. The engagement portions are arranged in such a manner that a force applied to the cover member due to an engagement between the first engagement portion and the third engagement portion and a force applied to the cover member due to an engagement between the second engagement portion and the fourth engagement portion respectively have opposite directions to be substantially countervailed when the sensor body is attached to the cover member. Thus, the cover member can be restricted from slanting when the sensor body is fixed to the cover member.

    摘要翻译： 超声波传感器的盖部件具有分别与传感器主体的第三接合部和第四接合部接合的第一接合部和第二接合部。 接合部分被布置成使得由于第一接合部分和第三接合部分之间的接合而施加到盖部件的力和由于第二接合部分和第二接合部分之间的接合而施加到盖部件的力 当传感器主体附接到盖构件时，第四接合部分别具有相反的方向以基本上相反的方式。 因此，当传感器主体固定到盖构件时，可以限制盖构件的倾斜。