Process for preparation of aliphatic diisocyanate compounds
    2.
    发明授权
    Process for preparation of aliphatic diisocyanate compounds 失效
    脂族二异氰酸酯化合物的制备方法

    公开(公告)号:US5789614A

    公开(公告)日:1998-08-04

    申请号:US940364

    申请日:1997-09-30

    IPC分类号: C07C269/04 C07C263/00

    CPC分类号: C07C269/04

    摘要: An aliphatic diisocyante compound is prepared in a high yield by reacting dimethyl carbonate with an aliphatic diamine in the presence of an alkali catalyst to produce a corresponding urethene compound; and, within 48 hours after the completion of the preparation of the urethane compound, thermally decomposing the urethane compound under a reduced pressure of 1 to 700 Torr in a high-boiling-point solvent.

    摘要翻译: 通过在碱催化剂的存在下使碳酸二甲酯与脂肪族二胺反应,以高产率制备脂族二异氰酸酯化合物,生成相应的脲基化合物; 在氨基甲酸酯化合物的制备完成后48小时内,在高沸点溶剂中,在1〜700乇的减压下热分解氨基甲酸酯化合物。

    Pupil detection device and pupil detection method
    3.
    发明授权
    Pupil detection device and pupil detection method 有权
    瞳孔检测装置和瞳孔检测方法

    公开(公告)号:US08649583B2

    公开(公告)日:2014-02-11

    申请号:US13496713

    申请日:2011-06-15

    IPC分类号: G06K9/00

    摘要: A pupil detection device and a pupil detection method, which are capable of stably detecting the pupil by actively using information of cornea-reflected image even when most of the pupil is hidden by the cornea-reflected image. In pupil detection device (100), peripheral state evaluating section (105) sets a plurality of line segments having a reference point of a cornea-reflected image as one end and having a predetermined length, and calculates a luminance evaluation value based on luminance of each pixel in each line segment and reference luminance. Pupil center straight line calculation section (106) specifies a pupil center straight line passing through a center of a pupil image from among a plurality of line segments based on a luminance evaluation value. Pupil search section (107) detects a pupil image based on a luminance state around the pupil center straight line.

    摘要翻译: 瞳孔检测装置和瞳孔检测方法,即使当大部分瞳孔被角膜反射图像隐藏时,也能够通过主动使用角膜反射图像的信息来稳定地检测瞳孔。 在瞳孔检测装置(100)中,周边状态评价部(105)将具有角膜反射图像的基准点的多个线段设定为一端并具有规定长度,并且基于亮度 每个线段中的每个像素和参考亮度。 瞳孔中心直线计算部分(106)基于亮度评估值指定从多个线段中通过瞳孔图像的中心的瞳孔中心直线。 瞳孔搜索部(107)基于瞳孔中心直线周围的亮度状态来检测瞳孔图像。

    EXTERNAL LIGHT GLARE ASSESSMENT DEVICE, LINE OF SIGHT DETECTION DEVICE AND EXTERNAL LIGHT GLARE ASSESSMENT METHOD
    6.
    发明申请
    EXTERNAL LIGHT GLARE ASSESSMENT DEVICE, LINE OF SIGHT DETECTION DEVICE AND EXTERNAL LIGHT GLARE ASSESSMENT METHOD 有权
    外部光眼评估装置,视线检测装置和外部光眼评估方法

    公开(公告)号:US20120170027A1

    公开(公告)日:2012-07-05

    申请号:US13390169

    申请日:2011-06-07

    IPC分类号: G01N21/55

    摘要: Disclosed are an ambient light reflection determination apparatus and an ambient light reflection determination method enabling to determine reflection without using an edge and even in a case where luminance of a reflection generating part in eyeglasses is low. In a reflection determination apparatus (100), a luminance histogram calculation section (102) calculates a luminance histogram representing a luminance distribution of an eye area image, a difference calculation section (104) calculates a difference histogram by finding a difference between the two luminance histograms calculated from the two eye area images having different photographing timings, an evaluation value calculation section (105) calculates an evaluation value regarding reflection of ambient light based on the difference histogram and a weight in accordance with luminance, and a reflection determination section (107) determines the reflection of ambient light based on the calculated evaluation value.

    摘要翻译: 公开了环境光反射确定装置和环境光反射确定方法,其能够在不使用边缘的情况下确定反射,并且即使在眼镜中的反射产生部的亮度低的情况下也是如此。 在反射判定装置(100)中,亮度直方图计算部(102)计算表示眼睛区域图像的亮度分布的亮度直方图,差分计算部(104)通过求出两个亮度 根据具有不同拍摄定时的两个眼睛区域图像计算的直方图,评估值计算部(105)根据差异直方图和根据亮度的权重来计算关于环境光的反射的评价值,以及反射判定部 )根据计算的评估值确定环境光的反射。

    SURFACE INSPECTING APPARATUS AND METHOD FOR CALIBRATING SAME
    7.
    发明申请
    SURFACE INSPECTING APPARATUS AND METHOD FOR CALIBRATING SAME 有权
    表面检查装置及其校准方法

    公开(公告)号:US20120046884A1

    公开(公告)日:2012-02-23

    申请号:US13202734

    申请日:2010-02-02

    IPC分类号: G01N21/94 G01N21/93

    摘要: While an illumination optical system 2 is irradiating the surface of a contaminated standard wafer 110 with illumination light, this illumination light is scanned over the surface of the contaminated standard wafer 110, then detectors 31 to 34 of a detection optical system 3 each detect the light scattered from the surface of the contaminated standard wafer 110, next a predefined reference value in addition to detection results on the scattered light is used to calculate a compensation parameter “Comp” for detection sensitivity correction of photomultiplier tubes 331 to 334 of the detectors 31 to 34, and the compensation parameter “Comp” is separated into a time-varying deterioration parameter “P”, an optical characteristics parameter “Opt”, and a sensor characteristics parameter “Lr”, and correspondingly managed.This makes it easy to calibrate the detection sensitivity.

    摘要翻译: 当照明光学系统2用照明光照射受污染的标准晶片110的表面时,该照明光被扫描在污染的标准晶片110的表面上,然后检测光学系统3的检测器31至34检测光 从受污染的标准晶片110的表面散射的下一个预定的参考值,除了散射光的检测结果之外,还用于计算用于检测器31到...的光电倍增管331至334的检测灵敏度校正的补偿参数“Comp” 34,补偿参数“Comp”被分离为时变劣化参数“P”,光学特性参数“Opt”和传感器特性参数“Lr”,并相应地被管理。 这样可以轻松校准检测灵敏度。