公开(公告)号：US12250776B2

公开(公告)日：2025-03-11

申请号：US18317756

申请日：2023-05-15

Applicant: UNIMICRON TECHNOLOGY CORP.

Inventor： Jeng-Ting Li ,  Chi-Hai Kuo ,  Cheng-Ta Ko ,  Pu-Ju Lin

IPC: H05K3/00 ,  C03C15/00 ,  C03C23/00 ,  H05K1/03

Abstract: A substrate structure and a cutting method thereof are provided. The cutting method includes the following steps. A first substrate structure is provided, wherein the first substrate structure includes a glass substrate and a redistribution layer disposed on the glass substrate. A laser process is performed on the glass substrate to form a modified region on the glass substrate. A wet etching process is performed on the modified region of the glass substrate to remove the modified region and form a plurality of second substrate structures.

公开(公告)号：US12185479B2

公开(公告)日：2024-12-31

申请号：US17945106

申请日：2022-09-15

Applicant: Unimicron Technology Corp.

Inventor： Cheng-Ta Ko ,  Pu-Ju Lin ,  Shih-Chieh Chen ,  Chi-Hai Kuo ,  Jeng-Ting Li

IPC: H05K1/03 ,  H05K1/11 ,  H05K3/06 ,  H05K3/46

Abstract: A flexible circuit board and a manufacturing method thereof are provided. The flexible circuit board includes a circuit structure, a first cover layer, and a second cover layer. The circuit structure has a top surface and a bottom surface opposite to the top surface. The circuit structure includes multiple circuit layers and multiple insulating layers stacked alternately. A material of the insulating layers is a photosensitive dielectric material and a Young's modulus of the insulating layers is between 0.36 GPa and 8 GPa. The first cover layer is disposed on the top surface of the circuit structure. The second cover layer is disposed on the bottom surface of the circuit structure.

公开(公告)号：US11710690B2

公开(公告)日：2023-07-25

申请号：US17233551

申请日：2021-04-19

Applicant: Unimicron Technology Corp.

Inventor： John Hon-Shing Lau ,  Cheng-Ta Ko ,  Pu-Ju Lin ,  Kai-Ming Yang ,  Chia-Yu Peng ,  Chi-Hai Kuo ,  Tzyy-Jang Tseng

IPC: H01L23/498 ,  H01L21/48 ,  H01L23/00

CPC classification number: H01L23/49816 ,  H01L21/486 ,  H01L21/4857 ,  H01L23/49822 ,  H01L23/49838 ,  H01L24/13 ,  H01L24/16 ,  H01L2224/13147 ,  H01L2224/16235 ,  H01L2224/16237 ,  H01L2224/16238

Abstract: A package structure includes at least one first redistribution layer, at least one second redistribution layer, a chip pad, a solder ball pad, a chip, a solder ball, and a molding compound. The first redistribution layer includes a first dielectric layer and a first redistribution circuit that fills a first opening and a second opening of the first dielectric layer. The first dielectric layer is aligned with the first redistribution circuit. The second redistribution layer includes a second and a third dielectric layers and a second redistribution circuit. The third dielectric layer is aligned with the second redistribution circuit. The chip pad and the solder ball pad are electrically connected to the first and the second redistribution circuits respectively. The chip and the solder ball are disposed on the chip pad and the solder ball pad respectively. The molding compound at least covers the chip and the chip pad.

公开(公告)号：US11690180B2

公开(公告)日：2023-06-27

申请号：US17147474

申请日：2021-01-13

Applicant: Unimicron Technology Corp.

Inventor： Tzyy-Jang Tseng ,  Cheng-Ta Ko ,  Pu-Ju Lin ,  Tse-Wei Wang

IPC: H05K3/46 ,  H05K1/11 ,  H05K1/03 ,  H05K3/40

CPC classification number: H05K3/4644 ,  H05K1/0306 ,  H05K1/112 ,  H05K3/4007 ,  H05K3/4038 ,  H05K2201/0175

Abstract: A manufacturing method of a carrier structure includes: A build-up circuit layer is formed on a carrier. The build-up circuit layer includes at least one first circuit layer, at least one first dielectric layer, a second circuit layer, a second dielectric layer, and a plurality of conductive vias. The first circuit layer is located on the carrier and includes at least one first pad, which is disposed relative to at least one through hole of the carrier. The first dielectric layer is located on the first circuit layer. The second circuit layer is located on the first dielectric layer and includes at least one second pad. The second dielectric layer is located on the second circuit layer and includes at least one opening exposing the second pad. The conductive via penetrates the first dielectric layer and is electrically connected to the first circuit layer and the second circuit layer.

公开(公告)号：US11682612B2

公开(公告)日：2023-06-20

申请号：US17235944

申请日：2021-04-21

Applicant: Unimicron Technology Corp.

Inventor： John Hon-Shing Lau ,  Cheng-Ta Ko ,  Pu-Ju Lin ,  Kai-Ming Yang ,  Chi-Hai Kuo ,  Chia-Yu Peng ,  Tzyy-Jang Tseng

IPC: H01L23/538 ,  H01L23/498 ,  H01L23/00 ,  H01L23/31 ,  H01L21/48 ,  H01L21/56 ,  H01L25/065

CPC classification number: H01L23/49816 ,  H01L21/486 ,  H01L21/4857 ,  H01L21/565 ,  H01L23/3135 ,  H01L23/49822 ,  H01L23/49833 ,  H01L23/49838 ,  H01L23/5385 ,  H01L23/5386 ,  H01L24/13 ,  H01L24/16 ,  H01L24/73 ,  H01L25/0655 ,  H01L2224/13147 ,  H01L2224/13582 ,  H01L2224/16227 ,  H01L2224/16235 ,  H01L2224/73204 ,  H01L2924/1434 ,  H01L2924/14335 ,  H01L2924/35

Abstract: A package structure includes a redistribution layer, a chip assembly, a plurality of solder balls, and a molding compound. The redistribution layer includes redistribution circuits, photoimageable dielectric layers, conductive through holes, and chip pads. One of the photoimageable dielectric layers located on opposite two outermost sides has an upper surface and openings. The chip pads are located on the upper surface and are electrically connected to the redistribution circuits through the conductive through holes. The openings expose portions of the redistribution circuits to define solder ball pads. Line widths and line spacings of the redistribution circuits decrease in a direction from the solder ball pads towards the chip pads. The chip assembly is disposed on the chip pads and includes at least two chips with different sizes. The solder balls are disposed on the solder ball pads, and the molding compound at least covers the chip assembly.

公开(公告)号：US11516910B1

公开(公告)日：2022-11-29

申请号：US17371114

申请日：2021-07-09

Applicant: Unimicron Technology Corp.

Inventor： Chia-Yu Peng ,  John Hon-Shing Lau ,  Kai-Ming Yang ,  Pu-Ju Lin ,  Cheng-Ta Ko ,  Tzyy-Jang Tseng

IPC: H01R12/52 ,  H05K1/02 ,  H05K1/11 ,  H05K3/24 ,  H05K3/06 ,  H05K3/40

Abstract: A circuit board structure includes a redistribution structure layer, a build-up circuit structure layer, and a connection structure layer. The redistribution structure layer has a first and second surface, and includes an inner and outer dielectric layer, first connecting pads, and chip pads. A bottom surface of each first connecting pad is aligned with the first surface, and the chip pads are protruded from and located on the second surface. The build-up circuit structure layer includes second connecting pads. The connection structure layer is disposed between the redistribution structure layer and the build-up circuit structure layer and includes a substrate and conductive paste pillars penetrating the substrate. The first connecting pads are electrically connected to the second connecting pads via the conductive paste pillars, respectively. A top surface of each conductive paste pillar is aligned with the first surface of the redistribution structure layer.

公开(公告)号：US20220367307A1

公开(公告)日：2022-11-17

申请号：US17875443

申请日：2022-07-28

Applicant: Unimicron Technology Corp.

Inventor： Pu-Ju Lin ,  Kai-Ming Yang ,  Cheng-Ta Ko

IPC: H01L23/31 ,  H01L23/522 ,  H01L23/00 ,  H01L21/56 ,  H01L21/78

Abstract: A manufacturing method of a chip package structure includes the following steps. A plurality of chips is disposed on a first insulating layer. The back surface of each of the chips is in direct contact with the first insulating layer. A stress buffer layer is formed to extend and cover the active surface and the peripheral surface of each of the chips, and a bottom surface of the stress buffer layer is aligned with the back surface of each of the chips. The stress buffer layer has an opening exposing a part of the active surface of each of the chips, and the redistribution layer is electrically connected to each of the chips through the opening. A plurality of solder balls is electrically connected to the redistribution layer exposed by the blind holes. A singularizing process is performed to form a plurality of chip package structures separated from each other.

公开(公告)号：US11462452B2

公开(公告)日：2022-10-04

申请号：US17156626

申请日：2021-01-24

Applicant: Unimicron Technology Corp.

Inventor： Pu-Ju Lin ,  Kai-Ming Yang ,  Cheng-Ta Ko

IPC: H01L23/00 ,  H01L23/31 ,  H01L23/522 ,  H01L21/56 ,  H01L21/78

Abstract: A chip package structure including a chip, a stress buffer layer, a first insulating layer, a redistribution layer, a second insulating layer, and a solder ball is provided. The chip has an active surface, a back surface and a peripheral surface. The stress buffer layer covers the active surface and the peripheral surface, and the first insulating layer is disposed on the back surface. A bottom surface of the stress buffer layer is aligned with the back surface of the chip. The redistribution layer is electrically connected to the chip through an opening of the stress buffer layer. The second insulating layer covers the stress buffer layer and the redistribution layer. The solder ball is disposed in a blind hole of the second insulating layer and electrically connected to the redistribution layer. A top surface of the solder ball protrudes from an upper surface of the second insulating layer.

公开(公告)号：US11410940B2

公开(公告)日：2022-08-09

申请号：US17170736

申请日：2021-02-08

Applicant: Unimicron Technology Corp.

Inventor： Pu-Ju Lin ,  Cheng-Ta Ko ,  Yu-Hua Chen ,  Tzyy-Jang Tseng ,  Ra-Min Tain

IPC: H01L23/16 ,  H01L23/66 ,  H01L23/00 ,  H01L23/31

Abstract: A package structure includes a redistribution structure, a chip, one or more structural reinforcing elements, and a protective layer. The redistribution structure includes a first circuit layer and a second circuit layer disposed over the first circuit layer. The first circuit layer is electrically connected to the second circuit layer. The chip is disposed over the redistribution structure and electrically connected to the second circuit layer. The one or more structural reinforcing elements are disposed over the redistribution structure. The structural reinforcing element has a Young's modulus in a range of 30 to 200 GPa. The protective layer overlays the chip and a sidewall of the structural reinforcing element.

公开(公告)号：US20220068872A1

公开(公告)日：2022-03-03

申请号：US17030380

申请日：2020-09-24

Applicant: Unimicron Technology Corp.

Inventor： Chia-Fu Hsu ,  Kai-Ming Yang ,  Pu-Ju Lin ,  Cheng-Ta Ko

IPC: H01L23/00

Abstract: A fabrication method of an electronic device bonding structure includes the following steps. A first electronic component including a first conductive bonding portion is provided. A second electronic component including a second conductive bonding portion is provided. A first organic polymer layer is formed on the first conductive bonding portion. A second organic polymer layer is formed on the second conductive bonding portion. Bonding is performed on the first electronic component and the second electronic component through the first conductive bonding portion and the second conductive bonding portion, such that the first electronic component and the second electronic component are electrically connected. The first organic polymer layer and the second organic polymer layer diffuse into the first conductive bonding portion and the second conductive bonding portion after the bonding. An electronic device bonding structure is also provided.