摘要:
A method of automated image calibration that corrects for non-uniform illumination and calibrates color that is simple, fast, automated, accurate and reliable. A gray balance algorithm is applied to correct for non-uniform illumination and a color calibration algorithm is then applied to calibrate the human subject data. The system has been applied in multiple clinical sites with different instruments.
摘要:
A method of automated image calibration that corrects for non-uniform illumination and calibrates color that is simple, fast, automated, accurate and reliable. A gray balance algorithm is applied to correct for non-uniform illumination and a color calibration algorithm is then applied to calibrate the human subject data. The system has been applied in multiple clinical sites with different instruments.
摘要:
A method of contrast enhancement for improved visualization of diagnostically important tissue structures, such as blood vessels. A texture analysis algorithm is applied to identify regions with a high likelihood of disease. Mathematical morphology operations are applied to identify areas of high and low brightness (intensity). The low intensity areas are then subtracted, and controllably variable amounts of the high intensity areas are added, controlled by a selectable tuning parameter, to produce an image with controllably variable visualization enhancement.
摘要:
A method of contrast enhancement for improved visualization of diagnostically important tissue structures, such as blood vessels. A texture analysis algorithm is applied to identify regions with a high likelihood of disease. Mathematical morphology operations are applied to identify areas of high and low brightness (intensity). The low intensity areas are then subtracted, and controllably variable amounts of the high intensity areas are added, controlled by a selectable tuning parameter, to produce an image with controllably variable visualization enhancement.
摘要:
The image registration systems and methods according to this invention register reflectance and fluorescence hyperspectral imagery and provide the spatial image transformation between the reflectance and fluorescence hyperspectral imagery. A reflectance image is embedded into the fluorescence hyperspectral imagery and thereby resolves the resemblance problem of reflectance and fluorescence hyperspectral imagery. The reflectance image is embedded into the fluorescence hyperspectral imagery using (1) light from a narrow-band source embedded in Ultraviolet (UV) excitation light, (2) second order diffracted light, and/or (3) Ultraviolet (UV) excitation light reflectance. Resembling reflectance images are calculated from the reflectance hyperspectral imagery and the embedded reflectance image in the fluorescence hyperspectral imagery. The two respective reflectance images are pre-processed to maximize the resemblance between them. Image registration algorithms use the two pre-processed reflectance images and calculate the spatial image transformation that allows to map the spatial coordinates from the reflectance to the fluorescence hyperspectral imagery (and vice versa).
摘要:
A semiconductor component comprises a pn junction in which both the p-conducting and the n-conducting layers of the pn junction are doped silicon carbide layers and the edge of at least one of the conducting layers of the pn junction exhibits a stepwise or uniformly decreasing total charge or effective surface charge density from the initial value at the defined working junction to a zero or almost zero total charge at the outermost edge of the junction following a radial direction from the central part of the junction towards its outermost edge.
摘要:
A semiconductor device of planar structure, comprises a pn junction, formed of a first type conducting layer and on top thereof a second type conducting layer, both layers of doped silicon carbide, the edge of the second of the layers being provided with an edge termination (JTE), enclosing stepwise or continuously decreasing effective sheet charge density towards the outer border of the termination, wherein the pn junction and its JTE are covered by a doped or undoped SiC third layer.
摘要:
A transistor of SiC for high voltage and high switching frequency applications is a MISFET or an IGBT. This transistor comprises a plurality of laterally spaced active regions. The center to center distance of two adjacent active regions defines a lateral width of a cell of the transistor. The relation of the lateral width of an accumulation region defined as the region in the drift layer connecting to a gate-insulating layer in each individual cell and the lateral cell width is selected so as to keep the power losses in the transistor as a consequence of switching below a determined proportion to the power losses relating to conduction of the transistor for a predetermined switching frequency and on-state voltage for which the transistor is designed.
摘要:
A transistor of SiC having a drain and a highly doped substrate layer is formed on the drain. A highly n type buffer layer may optionally be formed on the substrate layer. A low doped n-type drift layer, a p-type base layer, a high doped n-type source region layer and a source are formed on the substrate layer. An insulating layer with a gate electrode is arranged on top of the base layer and extends substantially laterally from at least the source region layer to a n-type layer. When a voltage is applied to the gate electrode, a conducting inversion channel is formed extending substantially laterally in the base layer at an interface of the p-type base layer and the insulating layer. The p-type base layer is low doped in a region next to the interface to the insulating layer at which the inversion channel is formed and highly doped in a region thereunder next to the drift layer.
摘要:
A semiconductor device of SiC is adapted to hold high voltages in the blocking state thereof. The device comprises two parts (1, 2) each comprising one or more semiconductor layers of SiC and connected in series between two opposite terminals of the device, namely a sub-semiconductor device (1) able to withstand only low voltages in the blocking state thereof and a voltage-limiting part (2) able to withstand high voltages in the blocking state of the device and adapted to protect said sub-semiconductor device by taking a major part of the voltage over the device in the blocking state thereof.