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公开(公告)号：US07633725B2
公开(公告)日：2009-12-15
申请号：US11314879
申请日：2005-12-20
申请人： William James Premerlani , Kanakasabapathi Subramanian , Christopher Keimel , John N. Park , Ajit Achuthan , Wensen Wang , Joshua Isaac Wright , Kristina Margaret Korosi , Somashekhar Basavaraj
发明人： William James Premerlani , Kanakasabapathi Subramanian , Christopher Keimel , John N. Park , Ajit Achuthan , Wensen Wang , Joshua Isaac Wright , Kristina Margaret Korosi , Somashekhar Basavaraj
CPC分类号： H02H3/025 , H01H1/0036 , H01H9/40 , H01H9/54 , H01H9/56 , H01H2071/008
摘要： A system is presented. The system includes detection circuitry configured to detect occurrence of a zero crossing of an alternating source voltage or an alternating load current. The system also includes switching circuitry coupled to the detection circuitry and comprising a micro-electromechanical system switch. Additionally, the system includes control circuitry coupled to the detection circuitry and the switching circuitry and configured to perform arc-less switching of the micro-electromechanical system switch responsive to a detected zero crossing of an alternating source voltage or alternating load current.
摘要翻译： 提出了一个系统。 该系统包括被配置为检测交流源电压或交流负载电流的零交叉的发生的检测电路。 该系统还包括耦合到检测电路并包括微机电系统开关的开关电路。 另外，该系统包括耦合到检测电路和开关电路的控制电路，并被配置为响应于检测到的交流源电压或交流负载电流的过零点而执行微机电系统开关的无弧切换。
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公开(公告)号：US20070139830A1
公开(公告)日：2007-06-21
申请号：US11314879
申请日：2005-12-20
申请人： William Premerlani , Kanakasabapathi Subramanian , Christopher Keimel , John Park , Ajit Achuthan , Wensen Wang , Joshua Wright , Kristina Korosi , Somashekhar Basavaraj
发明人： William Premerlani , Kanakasabapathi Subramanian , Christopher Keimel , John Park , Ajit Achuthan , Wensen Wang , Joshua Wright , Kristina Korosi , Somashekhar Basavaraj
IPC分类号： H02H3/00
CPC分类号： H02H3/025 , H01H1/0036 , H01H9/40 , H01H9/54 , H01H9/56 , H01H2071/008
摘要： A system is presented. The system includes detection circuitry configured to detect occurrence of a zero crossing of an alternating source voltage or an alternating load current. The system also includes switching circuitry coupled to the detection circuitry and comprising a micro-electromechanical system switch. Additionally, the system includes control circuitry coupled to the detection circuitry and the switching circuitry and configured to perform arc-less switching of the micro-electromechanical system switch responsive to a detected zero crossing of an alternating source voltage or alternating load current.
摘要翻译： 提出了一个系统。 该系统包括被配置为检测交流源电压或交流负载电流的零交叉的发生的检测电路。 该系统还包括耦合到检测电路并包括微机电系统开关的开关电路。 另外，该系统包括耦合到检测电路和开关电路的控制电路，并被配置为响应于检测到的交流源电压或交流负载电流的过零点而执行微机电系统开关的无弧切换。
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公开(公告)号：US20070139829A1
公开(公告)日：2007-06-21
申请号：US11314336
申请日：2005-12-20
申请人： Stephen Arthur , Kanakasabapathi Subramanian , William Premerlani , John Park , Ajit Achuthan , Wensen Wang , Joshua Wright , Kristina Korosi , Somashekhar Basavaraj
发明人： Stephen Arthur , Kanakasabapathi Subramanian , William Premerlani , John Park , Ajit Achuthan , Wensen Wang , Joshua Wright , Kristina Korosi , Somashekhar Basavaraj
IPC分类号： H02H7/00
CPC分类号： H01H59/0009 , H01H9/541 , H01H2071/008
摘要： A system is presented. The system includes a first micro-electromechanical system switch. Further, the system includes arc suppression circuitry coupled to the first micro-electromechanical system switch, wherein the arc suppression circuitry comprises a balanced diode bridge and is configured to facilitate suppression of an arc formation between contacts of the first micro-electromechanical system switch.
摘要翻译： 提出了一个系统。 该系统包括第一微机电系统开关。 此外，该系统包括耦合到第一微机电系统开关的消弧电路，其中消弧电路包括平衡二极管桥，并且被配置为便于抑制第一微机电系统开关的触点之间的电弧形成。
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4.发明申请公开(公告)号：US20080084565A1
公开(公告)日：2008-04-10
申请号：US11538885
申请日：2006-10-05
申请人： Anis Zribi , Min-Yi Shih , Guiju Song , Ajit Achuthan , Glenn Scott Claydon , Stacey Joy Kennerly , Kuna Venkat Satya Rama Kishore , Jianming Zheng , Kevin George Harding , Hua Xia
发明人： Anis Zribi , Min-Yi Shih , Guiju Song , Ajit Achuthan , Glenn Scott Claydon , Stacey Joy Kennerly , Kuna Venkat Satya Rama Kishore , Jianming Zheng , Kevin George Harding , Hua Xia
IPC分类号： G01B9/02
CPC分类号： G01D5/35303 , G01D5/268 , G01N17/008 , G01N21/45 , G01N21/8422 , G01N2021/458 , G01N2021/9546
摘要： A interferometer-based fouling detection system and method are described. The system may include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, and at least one interferometric spectrometer. The fiber optic cable may include a long period grating and a fiber Bragg grating or it may include a facet edge. The system may instead include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, a fiber coupler, a reference probe including a mirror, a sample probe, and an interferometer.
摘要翻译： 描述了基于干涉仪的结垢检测系统和方法。 该系统可以包括光纤电缆，与光纤电缆通信的光源，与光纤电缆通信的至少一个光电检测器，以及至少一个干涉光谱仪。 光纤电缆可以包括长周期光栅和光纤布拉格光栅，或者它可以包括小面边缘。 该系统可以替代地包括光纤电缆，与光纤电缆通信的光源，与光纤电缆通信的至少一个光电检测器，光纤耦合器，包括反射镜的参考探针，样本探针和 干涉仪。
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5.发明申请Methods for Modifying and Enhancing Material Properties of Additive Manufactured Metallic Parts 审中-公开改进和增强添加剂制造金属零件材料性能的方法公开(公告)号：US20160355904A1
公开(公告)日：2016-12-08
申请号：US15171619
申请日：2016-06-02
申请人： Ajit Achuthan , Joshua D. Gale
发明人： Ajit Achuthan , Joshua D. Gale
IPC分类号： C21D10/00 , B33Y30/00 , B23K15/00 , C22F3/00 , B23K26/00 , B22F3/105 , B22F3/24 , B33Y10/00 , B23K26/342
CPC分类号： C21D10/00 , B22F3/1055 , B22F2003/1056 , B22F2998/10 , B23K15/0086 , B23K20/10 , B23K26/0093 , B23K26/0876 , B23K26/34 , B23K2103/05 , B33Y10/00 , B33Y30/00 , C21D1/06 , C22F3/00 , Y02P10/295 , B22F2202/01 , B22F2202/11 , C21D1/00
摘要： A device for additive manufacturing of an object. The device includes: a first probe configured to form the object; and a work-hardening second probe, where the work-hardening second probe is an ultrasonic probe, and further where the second probe is configured to emit ultrasonic energy to modify a substructure of the object during manufacture; wherein the first probe is configured to increase a temperature of at least a portion of a first layer of the object facing the first probe, to a first depth; and wherein the second probe is configured to work-harden the at least a portion of the first layer of the object facing the first probe, to a second depth, the second depth being greater than the first depth.
摘要翻译： 一种用于对象的附加制造的装置。 该装置包括：构造成形成该对象的第一探针; 以及加固硬化第二探针，其中所述加固硬化第二探针是超声波探针，并且其中所述第二探针被配置为在制造期间发射超声能量以修改所述物体的子结构; 其中所述第一探针被配置为将面向所述第一探针的所述物体的第一层的至少一部分的温度增加到第一深度; 并且其中所述第二探针被配置为将面向所述第一探针的所述物体的所述第一层的所述至少一部分加工硬化到第二深度，所述第二深度大于所述第一深度。
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公开(公告)号：US07495227B2
公开(公告)日：2009-02-24
申请号：US11775454
申请日：2007-07-10
申请人： William Andrew Hennessy , Habib Vafi , Donald Earl Castleberry , Michael John Utschig , Mahadevan Balasubramaniam , Jie Jiang , Virendra Vilas Gaikwad , Ajit Achuthan , Le Yan
发明人： William Andrew Hennessy , Habib Vafi , Donald Earl Castleberry , Michael John Utschig , Mahadevan Balasubramaniam , Jie Jiang , Virendra Vilas Gaikwad , Ajit Achuthan , Le Yan
IPC分类号： G01T1/24
CPC分类号： G03B42/04 , G01T1/2018
摘要： An x-ray detector is provided for use in imaging systems. The x-ray detector includes a detector subsystem configured to output electrical signals in response to reception of x-rays. The detector subsystem includes an imaging panel, a support layer and a low density core disposed between the imaging panel and the support layer.
摘要翻译： 提供了用于成像系统的x射线检测器。 x射线检测器包括检测器子系统，被配置为响应于X射线的接收而输出电信号。 检测器子系统包括成像面板，支撑层和设置在成像面板和支撑层之间的低密度芯。
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公开(公告)号：US20090014659A1
公开(公告)日：2009-01-15
申请号：US11775454
申请日：2007-07-10
申请人： William Andrew Hennessy , Habib Vafi , Donald Earl Castleberry , Michael John Utschig , Mahadevan Balasubramaniam , Jie Jiang , Virendra Vilas Gaikwad , Ajit Achuthan , Le Yan
发明人： William Andrew Hennessy , Habib Vafi , Donald Earl Castleberry , Michael John Utschig , Mahadevan Balasubramaniam , Jie Jiang , Virendra Vilas Gaikwad , Ajit Achuthan , Le Yan
IPC分类号： G01T1/16
CPC分类号： G03B42/04 , G01T1/2018
摘要： An x-ray detector is provided for use in imaging systems. The x-ray detector includes a detector subsystem configured to output electrical signals in response to reception of x-rays. The detector subsystem includes an imaging panel, a support layer and a low density core disposed between the imaging panel and the support layer.
摘要翻译： 提供了用于成像系统的x射线检测器。 x射线检测器包括检测器子系统，被配置为响应于X射线的接收而输出电信号。 检测器子系统包括成像面板，支撑层和设置在成像面板和支撑层之间的低密度芯。
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8.发明授权公开(公告)号：US07428055B2
公开(公告)日：2008-09-23
申请号：US11538885
申请日：2006-10-05
申请人： Anis Zribi , Min-Yi Shih , Guiju Song , Ajit Achuthan , Glenn Scott Claydon , Stacey Joy Kennerly , Kuna Venkat Satya Rama Kishore , Jianming Zheng , Kevin George Harding , Hua Xia
发明人： Anis Zribi , Min-Yi Shih , Guiju Song , Ajit Achuthan , Glenn Scott Claydon , Stacey Joy Kennerly , Kuna Venkat Satya Rama Kishore , Jianming Zheng , Kevin George Harding , Hua Xia
CPC分类号： G01D5/35303 , G01D5/268 , G01N17/008 , G01N21/45 , G01N21/8422 , G01N2021/458 , G01N2021/9546
摘要： A interferometer-based fouling detection system and method are described. The system may include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, and at least one interferometric spectrometer. The fiber optic cable may include a long period grating and a fiber Bragg grating or it may include a facet edge. The system may instead include a fiber optic cable, a light source in communication with the fiber optic cable, at least one photo detector in communication with the fiber optic cable, a fiber coupler, a reference probe including a mirror, a sample probe, and an interferometer.
摘要翻译： 描述了基于干涉仪的结垢检测系统和方法。 该系统可以包括光纤电缆，与光纤电缆通信的光源，与光纤电缆通信的至少一个光电检测器，以及至少一个干涉光谱仪。 光纤电缆可以包括长周期光栅和光纤布拉格光栅，或者它可以包括小面边缘。 该系统可以替代地包括光纤电缆，与光纤电缆通信的光源，与光纤电缆通信的至少一个光电检测器，光纤耦合器，包括反射镜的参考探针，样本探针和 干涉仪。
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公开(公告)号：US07652586B2
公开(公告)日：2010-01-26
申请号：US11504739
申请日：2006-08-15
申请人： Marko Baller , Marcin Alexy , Glenn S. Claydon , Peter Joseph Codella , Stacey Kennerly , Kuna Kishore , Anis Zribi , Guiju Song , Shivappa Goravar , Ajit Achuthan
发明人： Marko Baller , Marcin Alexy , Glenn S. Claydon , Peter Joseph Codella , Stacey Kennerly , Kuna Kishore , Anis Zribi , Guiju Song , Shivappa Goravar , Ajit Achuthan
CPC分类号： G01N27/22 , G01N17/008
摘要： According to one embodiment, a first capacitive element may be provided and associated with a surface where a fouling layer is to be detected. A second capacitive element may also be provided, and a capacitance between the first and second capacitive elements may be used to detect formation of the fouling layer. According to another embodiment, a thermal device is provided proximate to a surface where a fouling layer is to be detected. A detector (e.g., a thermometer or vibration detector) may detect a condition associated with the surface, and formation of the fouling layer may be determined based at least in part on the condition.
摘要翻译： 根据一个实施例，可以提供第一电容元件并与待检测污垢层的表面相关联。 还可以提供第二电容元件，并且可以使用第一和第二电容元件之间的电容来检测污垢层的形成。 根据另一个实施例，热敏装置设置在要被检测污垢层的表面附近。 检测器（例如，温度计或振动检测器）可以检测与表面相关联的状况，并且可以至少部分地基于条件来确定结垢层的形成。
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公开(公告)号：US20080041139A1
公开(公告)日：2008-02-21
申请号：US11504739
申请日：2006-08-15
申请人： Marko Baller , Marcin Alexy , Glenn S. Claydon , Peter Joseph Codella , Stacey Kennerly , Kuna Kishore , Anis Zribi , Guiju Song , Shivappa Goravar , Ajit Achuthan
发明人： Marko Baller , Marcin Alexy , Glenn S. Claydon , Peter Joseph Codella , Stacey Kennerly , Kuna Kishore , Anis Zribi , Guiju Song , Shivappa Goravar , Ajit Achuthan
CPC分类号： G01N27/22 , G01N17/008
摘要： According to one embodiment, a first capacitive element may be provided and associated with a surface where a fouling layer is to be detected. A second capacitive element may also be provided, and a capacitance between the first and second capacitive elements may be used to detect formation of the fouling layer. According to another embodiment, a thermal device is provided proximate to a surface where a fouling layer is to be detected. A detector (e.g., a thermometer or vibration detector) may detect a condition associated with the surface, and formation of the fouling layer may be determined based at least in part on the condition.
摘要翻译： 根据一个实施例，可以提供第一电容元件并与待检测污垢层的表面相关联。 还可以提供第二电容元件，并且可以使用第一和第二电容元件之间的电容来检测污垢层的形成。 根据另一个实施例，热敏装置设置在要被检测污垢层的表面附近。 检测器（例如，温度计或振动检测器）可以检测与表面相关联的状况，并且可以至少部分地基于条件来确定结垢层的形成。
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