摘要:
Provided is an AD conversion apparatus including: a differential amplifier that generates a differential input voltage according to an analog input signal; a differential DA converter of a charge redistribution type, which outputs a differential output voltage resulting from subtracting the differential input voltage from a differential comparison voltage that is in accordance with comparison data; a comparator that compares a positive output voltage and a negative output voltage in the differential output voltage; a control section that identifies the comparison data at which the differential output voltage becomes substantially 0 based on a comparison result of the comparator, and outputs the identified comparison data as output data; and a setting section that sets at least one of a common potential of the differential amplifier and a common potential of the differential DA converter, according to a targeted value of a common potential of the comparator
摘要:
Provided is a signal generating apparatus comprising a DA converter that outputs an output signal corresponding to input data supplied thereto; a sample/hold unit that is provided between the DA converter and an output end of the signal generating apparatus, and that samples an output voltage of the DA converter and holds the sampled output voltage; a comparing section that compares (i) a level of a signal output from an analog circuit that propagates the output signal to output a signal corresponding to the input data to (ii) a level of the signal output by the DA converter; and a control section that, during a holding period, (iii) provides the DA converter with comparison data instead of the input data to cause the DA converter to output a comparison voltage corresponding to the comparison data, (iv) causes the comparing section to compare a voltage of the signal output by the analog circuit to the comparison voltage, and (v) adjusts the output voltage of the DA converter based on a comparison result of the comparing section.
摘要:
Provided is a signal generating apparatus that outputs from an output end thereof an output voltage corresponding to input data supplied thereto, comprising: a DA converter that outputs a voltage corresponding to data supplied thereto; a capacitor section that is provided between the output end and a standard potential; a transmission switch that provides a connection or a disconnect between a voltage generating end of the DA converter and the output end; and a control section that causes the DA converter to charge the capacitor section with a voltage corresponding to the input data by repeatedly connecting and disconnecting the transmission switch, thereby causing the voltage of the capacitor section to gradually approach the output voltage corresponding to the input data.
摘要:
Provided is a test apparatus that tests a device under test. The device under test includes: a circuit under test; and a switching section that that connects an internal terminal being tested, from among one or more internal terminals of the circuit under test, to external terminals connected to the test apparatus. The test apparatus includes: a measuring section that controls a relay section, which provides a connection or a disconnect between two of the external terminals such that a transmission characteristic of the relay section in a connected state serves as a basis for calculating the transmission characteristic between each external terminal and each internal terminal of the circuit under test, to be in a connected state and measures the transmission characteristic of the relay section via the two external terminals; and a compensating section that compensates a signal to be supplied to the circuit under test via an external terminal and the switching section and/or a signal acquired from the circuit under test via the switching section and an external terminal, based on the measured transmission characteristic of the relay section.
摘要:
There is provided a waveform generator that generates a waveform. The waveform generator includes: a lamp waveform generating section that generates a lamp wave of which a signal value linearly changes for a predetermined period; a square wave generating section that generates a square wave of which pulse width is generally equivalent to the predetermined period; a waveform adding section that generally accords a timing at which a signal value in the lamp wave begins to be changed and a timing at a leading edge of the square wave, to add the lamp wave and the square wave; and a low-pass filter that removes a predetermined frequency band component from a waveform output from the waveform adding section.
摘要:
There is provided an arbitrary waveform generator that generates an arbitrary waveform. The arbitrary waveform generator includes a waveform pattern generating section that generates pattern data showing a pattern of the arbitrary waveform, a digital-analog converting section that outputs the arbitrary waveform based on the pattern data, and a correction processing section that corrects the pattern data and inputs the corrected data into the digital-analog converting section based on a value made by differentiating the pattern data and a time constant of a path through which the arbitrary waveform output from the digital-analog converting section passes.
摘要:
An output waveform of a device under test with high output impedance and low load driving capability is faithfully observed. A waveform input circuit 10 comprises a high input impedance terminating resistance which receives an input signal from a transmission line 11, selection means (relay) 12 which selects any one of this terminating resistance and other terminating resistances, and an input buffer 13 which is connected when the high input impedance terminating resistance is selected in the selection means 12, wherein switch means 16 is provided to switch the reference potential of the transmission line 11 to at least two kinds of reference potentials, and one reference potential which is switched by the switch means 16 is “a potential controlled to be in phase with the input signal by an output voltage of the input buffer 13 which is connected when the high input impedance terminating resistance is selected in the selection means 12”.
摘要:
A waveform generator 30 for generating a desired waveform includes a plurality of rectangular wave generators (40a to 40n) for generating a plurality of rectangular waves and a waveform synthesizing unit 42 for synthesizing the rectangular waves to generate a multi-level synthesized wave, and generate the desired wave based on the synthesized wave.
摘要:
A waveform input circuit, waveform observation unit and semiconductor test apparatus allow to faithfully observe waveform of a device under test with high output impedance and low load driving capability. A waveform input circuit includes a high input impedance terminating resistance which receives an input signal from a transmission line, a relay which selects a terminating resistance, an input buffer which is connected when the high input impedance terminating resistance is selected. A reference potential switch is further provided to select a reference potential of the transmission line where one reference potential is controlled to be in phase with the input signal by an input buffer which is connected when the high input impedance terminating resistance is selected.
摘要:
Analog-to-digital (A-D) converting apparatus (100, 120, 130) for calibrating a time error includes: an analog signal input portion (10); a plurality of analog-to-digital converters (12); a sampling clock signal generator (14) which supplies either a synchronous sampling clock signal or an alternate sampling clock signal; an averaging processing unit (18b) which performs the averaging process on a digital signal output from the A-D converters, based on the synchronous sampling clock signal; and an interleave processing unit (118a) which interleaves a digital signal output from the sampling operated A-D converters, based on the alternate sampling clock signal. The A-D converting apparatus includes an error calculation unit (72) for calculating the time error, and an error calibration value calculating unit (74) and an error calibrating unit (70b) which performs calibration operation. Method of calibrating an error caused between a plurality of the A-D converters.