A-D convert apparatus and control method

    公开(公告)号:US08068047B2

    公开(公告)日:2011-11-29

    申请号:US12687525

    申请日:2010-01-14

    IPC分类号: H03M1/12

    摘要: Provided is an AD conversion apparatus including: a differential amplifier that generates a differential input voltage according to an analog input signal; a differential DA converter of a charge redistribution type, which outputs a differential output voltage resulting from subtracting the differential input voltage from a differential comparison voltage that is in accordance with comparison data; a comparator that compares a positive output voltage and a negative output voltage in the differential output voltage; a control section that identifies the comparison data at which the differential output voltage becomes substantially 0 based on a comparison result of the comparator, and outputs the identified comparison data as output data; and a setting section that sets at least one of a common potential of the differential amplifier and a common potential of the differential DA converter, according to a targeted value of a common potential of the comparator

    Signal generating apparatus and test apparatus
    2.
    发明授权
    Signal generating apparatus and test apparatus 有权
    信号发生装置和试验装置

    公开(公告)号:US08094053B2

    公开(公告)日:2012-01-10

    申请号:US12635169

    申请日:2009-12-10

    IPC分类号: H03M1/66

    CPC分类号: H03M1/1038 H03M1/66

    摘要: Provided is a signal generating apparatus comprising a DA converter that outputs an output signal corresponding to input data supplied thereto; a sample/hold unit that is provided between the DA converter and an output end of the signal generating apparatus, and that samples an output voltage of the DA converter and holds the sampled output voltage; a comparing section that compares (i) a level of a signal output from an analog circuit that propagates the output signal to output a signal corresponding to the input data to (ii) a level of the signal output by the DA converter; and a control section that, during a holding period, (iii) provides the DA converter with comparison data instead of the input data to cause the DA converter to output a comparison voltage corresponding to the comparison data, (iv) causes the comparing section to compare a voltage of the signal output by the analog circuit to the comparison voltage, and (v) adjusts the output voltage of the DA converter based on a comparison result of the comparing section.

    摘要翻译: 提供了一种信号发生装置,包括DA转换器,其输出与提供给其的输入数据相对应的输出信号; 采样/保持单元,设置在DA转换器和信号发生装置的输出端之间,并且对DA转换器的输出电压进行采样并保持采样的输出电压; 比较部分,其比较(i)从传播输出信号的模拟电路输出的信号的电平,以输出对应于输入数据的信号,以(ii)由DA转换器输出的信号的电平; 以及控制部,在保持期间,(iii)向DA转换器提供代替输入数据的比较数据,使DA转换器输出与比较数据对应的比较电压,(iv)使比较部分 将模拟电路输出的信号的电压与比较电压进行比较,(v)根据比较部分的比较结果调整DA转换器的输出电压。

    Signal generating apparatus and test apparatus
    3.
    发明授权
    Signal generating apparatus and test apparatus 有权
    信号发生装置和试验装置

    公开(公告)号:US07982520B2

    公开(公告)日:2011-07-19

    申请号:US12642706

    申请日:2009-12-18

    IPC分类号: H03L5/00

    CPC分类号: H03M1/06 H03M1/804

    摘要: Provided is a signal generating apparatus that outputs from an output end thereof an output voltage corresponding to input data supplied thereto, comprising: a DA converter that outputs a voltage corresponding to data supplied thereto; a capacitor section that is provided between the output end and a standard potential; a transmission switch that provides a connection or a disconnect between a voltage generating end of the DA converter and the output end; and a control section that causes the DA converter to charge the capacitor section with a voltage corresponding to the input data by repeatedly connecting and disconnecting the transmission switch, thereby causing the voltage of the capacitor section to gradually approach the output voltage corresponding to the input data.

    摘要翻译: 提供一种信号发生装置,从其输出端输出与提供给其的输入数据相对应的输出电压,包括:DA转换器,输出与提供给其的数据相对应的电压; 电容器部分,其设置在输出端和标准电位之间; 传输开关,其提供DA转换器的电压产生端与输出端之间的连接或断开; 以及控制部,其使得DA转换器通过重复地连接和断开所述传输开关而对与所述输入数据相对应的电压对所述电容器部分充电,从而使所述电容器部分的电压逐渐接近与所述输入数据相对应的输出电压 。

    Device, test apparatus and test method
    4.
    发明授权
    Device, test apparatus and test method 有权
    装置,试验装置及试验方法

    公开(公告)号:US08179154B2

    公开(公告)日:2012-05-15

    申请号:US12261056

    申请日:2008-10-30

    IPC分类号: G01R31/26

    CPC分类号: G01R31/31926

    摘要: Provided is a test apparatus that tests a device under test. The device under test includes: a circuit under test; and a switching section that that connects an internal terminal being tested, from among one or more internal terminals of the circuit under test, to external terminals connected to the test apparatus. The test apparatus includes: a measuring section that controls a relay section, which provides a connection or a disconnect between two of the external terminals such that a transmission characteristic of the relay section in a connected state serves as a basis for calculating the transmission characteristic between each external terminal and each internal terminal of the circuit under test, to be in a connected state and measures the transmission characteristic of the relay section via the two external terminals; and a compensating section that compensates a signal to be supplied to the circuit under test via an external terminal and the switching section and/or a signal acquired from the circuit under test via the switching section and an external terminal, based on the measured transmission characteristic of the relay section.

    摘要翻译: 提供了测试被测设备的测试装置。 被测设备包括:被测电路; 以及切换部,其将被测试电路的内部端子从被测试电路的一个或多个内部端子连接到与测试装置连接的外部端子。 测试装置包括:测量部分,其控制中继部分,其提供两个外部终端之间的连接或断开,使得处于连接状态的中继部分的传输特性用作计算第二传输特性之间的传输特性的基础 被测电路的每个外部端子和每个内部端子处于连接状态,并通过两个外部端子测量继电器部分的传输特性; 以及补偿部,其基于所测量的传输特性,经由所述切换部和外部端子,经由外部端子和所述开关部和/或从所述被测试电路获取的信号,补偿要提供给被测试电路的信号 的继电器部分。

    Waveform generator, waveform shaper, and testing apparatus
    5.
    发明授权
    Waveform generator, waveform shaper, and testing apparatus 有权
    波形发生器,波形整形器和测试装置

    公开(公告)号:US07342524B2

    公开(公告)日:2008-03-11

    申请号:US11442884

    申请日:2006-05-30

    申请人: Masayuki Kawabata

    发明人: Masayuki Kawabata

    IPC分类号: H03M1/10

    CPC分类号: H03K4/08

    摘要: There is provided a waveform generator that generates a waveform. The waveform generator includes: a lamp waveform generating section that generates a lamp wave of which a signal value linearly changes for a predetermined period; a square wave generating section that generates a square wave of which pulse width is generally equivalent to the predetermined period; a waveform adding section that generally accords a timing at which a signal value in the lamp wave begins to be changed and a timing at a leading edge of the square wave, to add the lamp wave and the square wave; and a low-pass filter that removes a predetermined frequency band component from a waveform output from the waveform adding section.

    摘要翻译: 提供了一个产生波形的波形发生器。 波形发生器包括:灯波形生成部,其生成信号值线性变化了规定期间的灯波; 方波生成部,其生成脉冲宽度大致等于规定期间的方波; 波形加法部分通常符合灯波中的信号值开始改变的定时和方波前缘的定时,以增加灯波和方波; 以及从波形加法部分输出的波形中去除预定频带分量的低通滤波器。

    Arbitrary waveform generator, arbitrary waveform generate method, testing apparatus, and program
    6.
    发明授权
    Arbitrary waveform generator, arbitrary waveform generate method, testing apparatus, and program 有权
    任意波形发生器,任意波形生成方法,测试仪器和程序

    公开(公告)号:US07348913B2

    公开(公告)日:2008-03-25

    申请号:US11443684

    申请日:2006-05-31

    申请人: Masayuki Kawabata

    发明人: Masayuki Kawabata

    IPC分类号: H03M1/76

    CPC分类号: H03M1/1071 G06F1/0321

    摘要: There is provided an arbitrary waveform generator that generates an arbitrary waveform. The arbitrary waveform generator includes a waveform pattern generating section that generates pattern data showing a pattern of the arbitrary waveform, a digital-analog converting section that outputs the arbitrary waveform based on the pattern data, and a correction processing section that corrects the pattern data and inputs the corrected data into the digital-analog converting section based on a value made by differentiating the pattern data and a time constant of a path through which the arbitrary waveform output from the digital-analog converting section passes.

    摘要翻译: 提供产生任意波形的任意波形发生器。 任意波形发生器包括产生表示任意波形图案的图形数据的波形图形生成部,基于图形数据输出任意波形的数模转换部,以及修正图案数据的校正处理部, 基于通过区分图案数据和通过数字 - 模拟转换部输出的任意波形通过的路径的时间常数,将校正后的数据输入到数模转换部。

    Waveform input circuit, waveform observation unit and semiconductor test apparatus
    7.
    发明申请
    Waveform input circuit, waveform observation unit and semiconductor test apparatus 失效
    波形输入电路,波形观察单元和半导体测试仪

    公开(公告)号:US20070268012A1

    公开(公告)日:2007-11-22

    申请号:US11368208

    申请日:2006-03-03

    申请人: Masayuki Kawabata

    发明人: Masayuki Kawabata

    IPC分类号: G01R19/18

    CPC分类号: G01R31/31926 G01R31/31924

    摘要: An output waveform of a device under test with high output impedance and low load driving capability is faithfully observed. A waveform input circuit 10 comprises a high input impedance terminating resistance which receives an input signal from a transmission line 11, selection means (relay) 12 which selects any one of this terminating resistance and other terminating resistances, and an input buffer 13 which is connected when the high input impedance terminating resistance is selected in the selection means 12, wherein switch means 16 is provided to switch the reference potential of the transmission line 11 to at least two kinds of reference potentials, and one reference potential which is switched by the switch means 16 is “a potential controlled to be in phase with the input signal by an output voltage of the input buffer 13 which is connected when the high input impedance terminating resistance is selected in the selection means 12”.

    摘要翻译: 忠实地观察到具有高输出阻抗和低负载驱动能力的被测器件的输出波形。 波形输入电路10包括接收来自传输线11的输入信号的高输入阻抗终端电阻,选择该终端电阻和其它终端电阻中的任何一个的选择装置(继电器)12以及连接的输入缓冲器13 当在选择装置12中选择高输入阻抗终端电阻时,其中提供开关装置16以将传输线11的基准电位切换到至少两种参考电位,以及由开关切换的一个参考电位 装置16是“当在选择装置12”中选择高输入阻抗终端电阻时连接的输入缓冲器13的输出电压被控制为与输入信号同相的电位。

    Waveform generator and testing device
    8.
    发明授权
    Waveform generator and testing device 失效
    波形发生器和测试装置

    公开(公告)号:US06404371B2

    公开(公告)日:2002-06-11

    申请号:US09801787

    申请日:2001-03-09

    IPC分类号: H03M166

    CPC分类号: G01R31/2841 G06F1/022

    摘要: A waveform generator 30 for generating a desired waveform includes a plurality of rectangular wave generators (40a to 40n) for generating a plurality of rectangular waves and a waveform synthesizing unit 42 for synthesizing the rectangular waves to generate a multi-level synthesized wave, and generate the desired wave based on the synthesized wave.

    摘要翻译: 用于产生期望波形的波形发生器30包括用于产生多个矩形波的多个矩形波发生器(40a至40n)和用于合成矩形波以产生多电平合成波的波形合成单元42,并产生 基于合成波的期望波。

    Waveform input circuit, waveform observation unit and semiconductor test apparatus
    9.
    发明授权
    Waveform input circuit, waveform observation unit and semiconductor test apparatus 失效
    波形输入电路,波形观察单元和半导体测试仪

    公开(公告)号:US07634370B2

    公开(公告)日:2009-12-15

    申请号:US11368208

    申请日:2006-03-03

    申请人: Masayuki Kawabata

    发明人: Masayuki Kawabata

    IPC分类号: G01R31/02

    CPC分类号: G01R31/31926 G01R31/31924

    摘要: A waveform input circuit, waveform observation unit and semiconductor test apparatus allow to faithfully observe waveform of a device under test with high output impedance and low load driving capability. A waveform input circuit includes a high input impedance terminating resistance which receives an input signal from a transmission line, a relay which selects a terminating resistance, an input buffer which is connected when the high input impedance terminating resistance is selected. A reference potential switch is further provided to select a reference potential of the transmission line where one reference potential is controlled to be in phase with the input signal by an input buffer which is connected when the high input impedance terminating resistance is selected.

    摘要翻译: 波形输入电路,波形观察单元和半导体测试装置允许忠实地观察被测器件的波形,具有高输出阻抗和低负载驱动能力。 波形输入电路包括接收来自传输线的输入信号的高输入阻抗终端电阻,选择终端电阻的继电器,当选择高输入阻抗终端电阻时连接的输入缓冲器。 还提供参考电位开关,用于选择一个参考电位的参考电位,其中一个参考电位被控制为与当输入高阻抗终端电阻被选择时连接的输入缓冲器与输入信号同相。

    A-D converting apparatus, and calibration unit and method therefor
    10.
    发明授权
    A-D converting apparatus, and calibration unit and method therefor 失效
    A-D转换装置及其校准单元及其方法

    公开(公告)号:US06452518B1

    公开(公告)日:2002-09-17

    申请号:US09534322

    申请日:2000-03-24

    申请人: Masayuki Kawabata

    发明人: Masayuki Kawabata

    IPC分类号: H03M106

    CPC分类号: H03M1/1009 H03M1/1215

    摘要: Analog-to-digital (A-D) converting apparatus (100, 120, 130) for calibrating a time error includes: an analog signal input portion (10); a plurality of analog-to-digital converters (12); a sampling clock signal generator (14) which supplies either a synchronous sampling clock signal or an alternate sampling clock signal; an averaging processing unit (18b) which performs the averaging process on a digital signal output from the A-D converters, based on the synchronous sampling clock signal; and an interleave processing unit (118a) which interleaves a digital signal output from the sampling operated A-D converters, based on the alternate sampling clock signal. The A-D converting apparatus includes an error calculation unit (72) for calculating the time error, and an error calibration value calculating unit (74) and an error calibrating unit (70b) which performs calibration operation. Method of calibrating an error caused between a plurality of the A-D converters.

    摘要翻译: 用于校准时间误差的模拟数字(A-D)转换装置(100,120,130)包括:模拟信号输入部分(10); 多个模数转换器(12); 采样时钟信号发生器(14),其提供同步采样时钟信号或交替采样时钟信号; 平均处理单元,根据同步采样时钟信号对从A-D转换器输出的数字信号进行平均处理; 以及交替处理单元(118a),其基于所述交替采样时钟信号来交织从所述采样操作的A-D转换器输出的数字信号。 A-D转换装置包括用于计算时间误差的误差计算单元(72)和执行校准操作的误差校准值计算单元(74)和误差校准单元(70b)。 校准多个A-D转换器之间引起的误差的方法。