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    Test handler and method for operating the same for testing semiconductor devices
    5.
    发明授权
    Test handler and method for operating the same for testing semiconductor devices 有权
    用于测试半导体器件的测试处理器和操作方法

    公开(公告)号：US08653845B2

    公开(公告)日：2014-02-18

    申请号：US13296421

    申请日：2011-11-15

    申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

    发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

    IPC分类号： G01R31/20

    CPC分类号： G01R31/2893 ,  G01R31/2886

    摘要： A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.

    摘要翻译： 提供了一种测试处理器，其包括测试托盘，至少一个打开单元和位置改变装置。 测试盘在其侧面对准多个插入件。 每个插件在其上载入至少一个半导体器件。 打开单元在测试托盘的一侧的一部分打开插入件。 位置改变装置移动至少一个开口单元，使得至少一个开口单元可以位于测试托盘的一侧的另一部分，使得至少一个开口单元可以在所述另一个开口单元处打开插入件 测试托盘一侧的一部分。 本发明可以根据半导体器件尺寸，生产成本和部件更换时间的变化来减少更换部件的数量。

    Opener and buffer table for test handler
    7.
    发明授权
    Opener and buffer table for test handler 有权
    打开器和缓冲表用于测试处理程序

    公开(公告)号：US08523158B2

    公开(公告)日：2013-09-03

    申请号：US12666124

    申请日：2008-07-02

    申请人： Yun-Sung Na ,  In-Gu Jeon ,  Seung-Chul Ahn ,  Dong-Han Kim ,  Jae-Hyun Son

    发明人： Yun-Sung Na ,  In-Gu Jeon ,  Seung-Chul Ahn ,  Dong-Han Kim ,  Jae-Hyun Son

    IPC分类号： B23Q1/64 ,  B23Q3/00 ,  B23Q3/02 ,  B25B1/22 ,  B25B1/00 ,  B25B11/00 ,  G01R31/00 ,  H01R13/648

    CPC分类号： G01R31/2893

    摘要： An opener and a buffer table for a test handler are disclosed. The opener includes an opening plate, a plurality of pin blocks forming pairs, and at least one or more interval retaining apparatus for retaining an interval between the pin blocks forming a pair. Each of the pin blocks is movably coupled to the opening plate, and includes opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board. Although semiconductor devices to be tested are altered in size and a carrier board loading with the semiconductor devices is thus replaced, the opener does not need to be replaced, thereby reducing the replacement cost and the waste of resources.

    摘要翻译： 公开了用于测试处理器的开启器和缓冲表。 开启器包括开口板，多个成对的销块，以及用于保持形成一对的销块之间的间隔的至少一个或多个间隔保持装置。 每个销块可移动地联接到开启板，并且包括用于释放将半导体器件保持在承载板中的保持装置的保持状态的打开销。 尽管要测试的半导体器件的尺寸被改变，并且因此更换了与半导体器件的载体板，但是开关器不需要更换，从而降低了重置成本和浪费资源。

    Test handler and method for operating the same for testing semiconductor devices
    9.
    发明授权
    Test handler and method for operating the same for testing semiconductor devices 有权
    用于测试半导体器件的测试处理器和操作方法

    公开(公告)号：US08159252B2

    公开(公告)日：2012-04-17

    申请号：US12097398

    申请日：2007-02-09

    申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

    发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

    IPC分类号： G01R31/20

    CPC分类号： G01R31/2893 ,  G01R31/2886

    摘要： A test handler and method for operating a test handler for testing semiconductor devices are provided. The test handler includes a test tray located on one side of an opening apparatus in which a plurality of inserts are arrayed, wherein each insert comprises at least one semiconductor device loaded thereon, at least one opening unit for opening inserts at one part of the one side of the test tray, and a position changing apparatus comprises a motor including a driving pulley for moving at least one opening unit along a contact surface of the test tray such that the at least one opening unit changes positions on the test tray and is located at another part of the one side of the test tray in order to open inserts at the other part of the one side of the test tray.

    摘要翻译： 提供了一种用于操作用于测试半导体器件的测试处理器的测试处理器和方法。 测试处理器包括位于打开装置的一侧的测试托盘，其中排列有多个插入件，其中每个插入件包括装载在其上的至少一个半导体器件，至少一个开口单元，用于在一个部分处打开插入件 并且位置改变装置包括电动机，其包括用于沿着测试托盘的接触表面移动至少一个开口单元的驱动滑轮，使得至少一个打开单元改变测试托盘上的位置并且位于 在测试托盘的一侧的另一部分，以便在测试托盘的一侧的另一部分处打开插入件。

    Reciprocating compressor
    10.
    发明授权
    Reciprocating compressor 有权
    往复式压缩机

    公开(公告)号：US08109199B2

    公开(公告)日：2012-02-07

    申请号：US12219548

    申请日：2008-07-23

    申请人： Sung-Gi Kim ,  Dong-Han Kim

    发明人： Sung-Gi Kim ,  Dong-Han Kim

    IPC分类号： F01B31/10 ,  F16J10/02

    CPC分类号： F04B39/0276 ,  F04B35/045 ,  F04B39/02 ,  F16J1/08 ,  F16J10/04

    摘要： A reciprocating compressor comprises: a cylinder having an oil pocket on an inner circumferential surface of a piston insertion hole for inserting a piston with a predetermined width and depth; and a piston having a bearing portion protruding so as to slidably contact an inner circumferential surface of the piston insertion hole, and inserted into the piston insertion hole of the cylinder, wherein the bearing portion is formed to have a length shorter than that of the oil pocket of the cylinder. Accordingly, a frictional loss between the cylinder and the piston is reduced.

    摘要翻译： 往复式压缩机包括：缸体，其在活塞插入孔的内周面上具有用于插入具有预定宽度和深度的活塞的油口; 以及活塞，其具有突出的滑动接触活塞插入孔的内周面并插入到所述气缸的活塞插入孔中的轴承部，其中，所述轴承部形成为具有比所述油的长度短的长度 圆筒的口袋。 因此，气缸和活塞之间的摩擦损失减小。