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公开(公告)号:US20200117874A1
公开(公告)日:2020-04-16
申请号:US16710478
申请日:2019-12-11
发明人: Chen-Hua Yu , Yu-Feng Chen , Chih-Hua Chen , Hao-Yi Tsai , Chung-Shi Liu
IPC分类号: G06K9/00 , H01L25/16 , H01L23/00 , H01L23/498 , H01L23/48 , H01L23/31 , H01L21/768 , H01L21/56
摘要: A fingerprint sensor package and method are provided. The fingerprint sensor package comprises a fingerprint sensor along with a fingerprint sensor surface material and electrical connections from a first side of the fingerprint sensor to a second side of the fingerprint sensor. A high voltage chip is connected to the fingerprint sensor and then the fingerprint sensor package with the high voltage chip are connected to a substrate, wherein the substrate has an opening to accommodate the presence of the high voltage chip.
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公开(公告)号:US20190067179A1
公开(公告)日:2019-02-28
申请号:US16108535
申请日:2018-08-22
发明人: Chia-Ching Tsai , Yi-Wei Chiu , Hung Jui Chang , Li-Te Hsu
IPC分类号: H01L23/498 , H01L21/768
摘要: A dielectric layer is formed over a substrate, an anti-reflective layer is formed over the porous dielectric layer, and a first hardmask is formed over the anti-reflective layer. A via opening and a trench opening are formed within the porous dielectric layer using the anti-reflective layer and the first hardmask as masking materials. After the formation of the trench opening and the via opening, the first hardmask is removed. An interconnect is formed within the openings, and the interconnect has a via with a profile angle of between about 70° and about 80° and a depth ratio of between about 65% and about 70%.
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公开(公告)号:US20190252294A1
公开(公告)日:2019-08-15
申请号:US16390669
申请日:2019-04-22
发明人: Cheng-Chieh Hsieh , Chi-Hsi Wu , Shin-Puu Jeng , Tsung-Yu Chen , Wensen Hung
IPC分类号: H01L23/427 , H01L23/367 , H01L25/10 , H01L23/00
CPC分类号: H01L23/4275 , H01L23/3128 , H01L23/3675 , H01L23/427 , H01L24/19 , H01L24/20 , H01L25/105 , H01L2224/04105 , H01L2224/12105 , H01L2224/24137 , H01L2224/32145 , H01L2224/32225 , H01L2224/32245 , H01L2224/73204 , H01L2224/73267 , H01L2224/9222
摘要: Cooling devices, packaged semiconductor devices, and methods of packaging semiconductor devices are disclosed. In some embodiments, a cooling device for a semiconductor device includes a reservoir having a first plate and a second plate coupled to the first plate. A cavity is between the first plate and the second plate. A phase change material (PCM) is in the cavity. The cooling device is adapted to dissipate heat from a packaged semiconductor device.
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公开(公告)号:US20230140731A1
公开(公告)日:2023-05-04
申请号:US17668392
申请日:2022-02-10
发明人: Huai-Ying Huang , Yu-Ming Lin
IPC分类号: H01L27/11 , G11C11/4091 , H01L27/108 , G11C11/419 , G11C16/26 , H01L27/11526 , H01L27/11573
摘要: A semiconductor device includes a semiconductor substrate, ground level circuitry, a plurality of stacked memory arrays and a plurality of sense amplifier units. The ground level circuitry is disposed on the semiconductor substrate. The stacked memory arrays are disposed at an elevated level over the ground level circuitry. The sense amplifier units are disposed on the semiconductor substrate and electrically coupled to the stacked memory arrays, wherein at least a portion of each of the sense amplifier units is disposed at the elevated level over the ground level circuitry.
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公开(公告)号:US20230140053A1
公开(公告)日:2023-05-04
申请号:US17580595
申请日:2022-01-20
发明人: Yu-Chao Lin , Chih-Sheng Chang
IPC分类号: H01L27/1159 , H01L27/24 , H01L29/66 , H01L23/522 , H01L45/00
摘要: A semiconductor structure includes a base layer, a metal-containing gate, a high-k layer and a spacer. The metal-containing gate is disposed over the base layer. The high-k layer is disposed between the base layer and the metal-containing gate. The high-k layer has a protruding portion that protrudes out from a bottom of the metal-containing gate. The spacer is disposed on the sidewall of the metal-containing gate and covers the protruding portion of the high-k layer.
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公开(公告)号:US20230138401A1
公开(公告)日:2023-05-04
申请号:US17577952
申请日:2022-01-18
发明人: Cheng-Wei CHANG , Shahaji B. MORE , Yi-Ying LIU , Yueh-Ching PAI
IPC分类号: H01L29/66 , H01L21/28 , H01L21/285
摘要: In method of manufacturing a semiconductor device, a source/drain epitaxial layer is formed, one or more dielectric layers are formed over the source/drain epitaxial layer, an opening is formed in the one or more dielectric layers to expose the source/drain epitaxial layer, a first silicide layer is formed on the exposed source/drain epitaxial layer, a second silicide layer different from the first silicide layer is formed on the first silicide layer, and a source/drain contact is formed over the second silicide layer.
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公开(公告)号:US20230138216A1
公开(公告)日:2023-05-04
申请号:US17682254
申请日:2022-02-28
发明人: En-Tian LIN , Chwen YU
摘要: A method for making a filter membrane includes: forming a polymer layer; applying a plurality of nanoparticles on the polymer layer, the nanoparticles being self-assembled to form a closed pack arrangement on the polymer layer; heating the nanoparticles such that a portion of the polymer layer contacting the nanoparticles is softened so that the nanoparticles are sunk into the polymer layer; and removing the nanoparticles from the polymer layer so that the polymer layer is formed with a plurality of pores penetrating the polymer layer and being arranged in a honeycomb pattern.
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公开(公告)号:US20230134975A1
公开(公告)日:2023-05-04
申请号:US17684951
申请日:2022-03-02
IPC分类号: G11C11/4097 , G11C11/4091
摘要: A memory device is provided. A first sub-block of the memory device includes first memory cells arranged in a first row and connected to a first bit line and second of memory cells arranged in a second row and connected to a first complementary bit line. The first memory cells and the second memory cells are connected to word lines in a first connection pattern. A second sub-block of the memory device includes third memory cells arranged in a third row and connected to a second bit line and fourth memory cells arranged in a fourth row and connected to a complementary second bit line. The third memory cells and the fourth memory cells are connected to the word lines in a second connection pattern that is different from the first connection pattern.
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公开(公告)号:US20230134560A1
公开(公告)日:2023-05-04
申请号:US17693983
申请日:2022-03-14
发明人: Chia-Wen Zhong , Yen-Liang Lin , Yao-Wen Chang
摘要: The present disclosure relates an integrated chip structure. The integrated chip structure includes a bottom electrode disposed within a dielectric structure over a substrate. A top electrode is disposed within the dielectric structure over the bottom electrode. A switching layer and an ion source layer are between the bottom electrode and the top electrode. A barrier structure is between the bottom electrode and the top electrode. The barrier structure includes a metal nitride configured to mitigate a thermal diffusion of metal during a high temperature fabrication process.
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公开(公告)号:US11640962B2
公开(公告)日:2023-05-02
申请号:US17385626
申请日:2021-07-26
发明人: Jhon-Jhy Liaw
IPC分类号: H01L27/092 , H01L27/11 , H01L23/532 , H01L29/78 , H01L29/423 , H01L29/08 , H01L21/8238 , H01L23/522 , H01L29/66
摘要: Semiconductor structures are provided. A first logic cell includes a plurality of first transistors over a substrate. The first transistor includes a first gate electrode across a first channel region. The first gate electrode is electrically connected to a first conductive line in a first dielectric layer through a first contact in a second dielectric layer and a first via in the first dielectric layer. A second logic cell includes a plurality of second transistors over the substrate. The second transistor includes a second gate electrode across a second channel region, wherein the second gate electrode is electrically connected to a second conductive line in the first dielectric layer through a second via. The first dielectric layer is formed over the second dielectric layer, and the second via extends from the second conductive line to the second gate electrode and penetrates the first and second dielectric layers.
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