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239 条记录 (耗时 0.017 秒)

    CLAMP-TYPE PROBE DEVICE
    1.
    发明申请
    CLAMP-TYPE PROBE DEVICE 审中-公开

    公开(公告)号：US20180011146A1

    公开(公告)日：2018-01-11

    申请号：US15604602

    申请日：2017-05-24

    申请人： CHROMA ATE INC.

    发明人： Peng-Fei CHEN ,  Mao-Sheng LIU

    IPC分类号： G01R31/36 ,  G01R1/067

    CPC分类号： G01R31/3644 ,  G01R1/02 ,  G01R1/067 ,  G01R1/06788

    摘要： A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.

    NON-CONTACT TYPE CURRENT SENSOR AND ASSOCIATED METHODS
    2.
    发明申请
    NON-CONTACT TYPE CURRENT SENSOR AND ASSOCIATED METHODS 有权

    公开(公告)号：US20170123036A1

    公开(公告)日：2017-05-04

    申请号：US14930252

    申请日：2015-11-02

    申请人： Keysight Technologies, Inc.

    发明人： Yasuhiro Miyake

    IPC分类号： G01R35/00 ,  G01R19/00

    CPC分类号： G01R35/005 ,  G01R1/02 ,  G01R19/0092

    摘要： A current measurement device is provided for use with a measurement target having a conductive path. The current measurement device includes a non-contact current sensor to be positioned adjacent the conductive path of the measurement target. A calibration current superimposing unit, including a first electrode and a second electrode to be positioned in contact with the conductive path of the measurement target, is configured to output a calibration current to flow through the conductive path between the first electrode and the second electrode. A controller, coupled to the non-contact current sensor and the calibration current superimposing unit, is configured to control the output of the calibration current from the calibration current superimposing unit, and is configured to sample a signal from the non-contact current sensor positioned adjacent the conductive path of the measurement target.

    Handling system for testing electronic components
    5.
    发明授权
    Handling system for testing electronic components 有权
    电子元件检测系统

    公开(公告)号：US09519007B2

    公开(公告)日：2016-12-13

    申请号：US13753706

    申请日：2013-01-30

    申请人： Chi Wah Cheng ,  Wang Lung Tse ,  Chi Kit Cheung ,  Cho Tao Cheung

    发明人： Chi Wah Cheng ,  Wang Lung Tse ,  Chi Kit Cheung ,  Cho Tao Cheung

    IPC分类号： G01R31/01 ,  G01R1/02 ,  G01R31/28

    CPC分类号： G01R1/02 ,  G01R31/01 ,  G01R31/2891 ,  G01R31/2893

    摘要： A handling system for testing electronic components comprises a rotary turret and pick heads mounted on the rotary turret, each pick head being configured to hold a respective electronic component provided by a supply source. A carrier system which is positionable adjacent to the rotary turret is configured to carry a plurality of electronic components. The carrier system is receivable by a testing station that is operative to simultaneously test a plurality of the electronic components which have been arranged on the carrier system. The pick heads or other transfer mechanism may transfer the electronic components onto the carrier system prior to testing the same at the testing station and remove electronic components from the carrier system after testing the same at the testing station.

    摘要翻译： 用于测试电子部件的处理系统包括安装在旋转转台上的旋转转台和拾取头，每个拾取头构造成保持由供应源提供的相应电子部件。 可相对于旋转转台定位的载体系统构造成承载多个电子部件。 载波系统可由测试台接收，该测试台可操作以同时测试已经布置在载波系统上的多个电子部件。 拾取头或其他传送机构可以在测试台进行测试之前将电子部件转移到载体系统上，并在测试台上对其进行测试之后从载体系统中移除电子部件。

    FLEXIBLE CIRCUIT ROGOWSKI COIL
    6.
    发明申请
    FLEXIBLE CIRCUIT ROGOWSKI COIL 有权
    柔性电路罗格斯基线圈

    公开(公告)号：US20150271909A1

    公开(公告)日：2015-09-24

    申请号：US14217796

    申请日：2014-03-18

    申请人： Eaton Corporation

    发明人： ROBERT FREDERICK BROOKS ,  Theodore J. Miller

    IPC分类号： H05K1/02 ,  G01R1/02 ,  G01R15/18

    CPC分类号： H05K1/028 ,  G01R1/02 ,  G01R15/181

    摘要： A flexible circuit current measuring apparatus includes a flexible substrate member having a top side and a bottom side, a plurality of first conductive traces disposed on the top side of the flexible substrate member and spaced along a length of the flexible substrate member, and a plurality of second conductive traces disposed on the bottom side of the flexible substrate member and spaced along the length of the flexible substrate member. The first conductive traces and the second conducive traces are electrically connected to one another to form a serpentine pattern having a number of windings about and along the flexible substrate member, and the current measuring apparatus is structured to be wrapped around a conductor for measuring a current carried by the conductor.

    摘要翻译： 柔性电路电流测量装置包括具有顶侧和底侧的柔性基板构件，设置在柔性基板构件的顶侧上并沿柔性基板构件的长度间隔开的多个第一导电迹线，以及多个 第二导电迹线设置在柔性基底构件的底侧上并且沿柔性基底构件的长度间隔开。 第一导电迹线和第二导电迹线彼此电连接以形成绕柔性衬底构件具有多个绕组的蛇形图案，并且电流测量装置构造成围绕导体缠绕以测量电流 由导体承担。

    OPTIMIZED CURRENT BUS
    7.
    发明申请
    OPTIMIZED CURRENT BUS 有权
    优化电流总线

    公开(公告)号：US20150236493A1

    公开(公告)日：2015-08-20

    申请号：US14599851

    申请日：2015-01-19

    申请人： Honeywell International Inc.

    发明人： Andy Peczalski

    IPC分类号： H02G5/02 ,  G01R15/18

    CPC分类号： H02G5/02 ,  G01R1/02 ,  G01R15/148 ,  G01R15/18 ,  G01R15/207 ,  H02M7/003 ,  H02M2001/0009

    摘要： A current bus that includes an opening that extends from one side of the current bus to an opposing side of the current bus. The opening changes in size as the opening extends from one side of the current bus to the opposing side of the current bus. The opening may include a first diameter and a second diameter that is different than the first diameter. The opening may include a first thickness at the first diameter of the opening which may be much smaller than a second thickness of the current bus. A high accuracy current measurement of the current bus may require that the magnetic field profile of the current bus within the opening be non-linear (e.g., 3rd order polynomial with the highest value of the 3rd degree coefficient).

    摘要翻译： 一种当前总线，其包括从当前总线的一侧延伸到当前总线的相对侧的开口。 当开口从当前总线的一侧延伸到当前总线的相对侧时，开口的尺寸改变。 开口可以包括不同于第一直径的第一直径和第二直径。 开口可以包括在开口的第一直径处的第一厚度，其可以远小于当前总线的第二厚度。 当前总线的高精度电流测量可能要求开口内的当前总线的磁场分布是非线性的（例如，具有最高3度系数的三阶多项式）。

    Handler for conveying a plurality of devices under test to a socket for a test and test apparatus
    8.
    发明授权
    Handler for conveying a plurality of devices under test to a socket for a test and test apparatus 有权
    处理器，用于将被测试的多个设备传送到用于测试和测试设备的插座

    公开(公告)号：US09024648B2

    公开(公告)日：2015-05-05

    申请号：US13669464

    申请日：2012-11-06

    申请人： Advantest Corporation

    发明人： Hiromitsu Horino ,  Masataka Onozawa

    IPC分类号： G01R31/00 ,  G01R31/20 ,  G01R1/02 ,  G01R31/01 ,  G01R31/28

    CPC分类号： G01R1/02 ,  G01R31/01 ,  G01R31/2867 ,  G01R31/2874 ,  G01R31/2891 ,  G01R31/2893

    摘要： A handler for conveying DUTs to a socket for a test that can reduce a test time includes: a test section including the socket; a heat applying section into which a tray having plural DUTs placed on its surface is conveyed and that controls the temperature of the DUTs to a predetermined test temperature and conveys the tray into the test section; and a device image capturing section that includes imaging elements arranged along a first direction the number of which is equal to DUTs arranged along the first direction and that in the heat applying section, captures images of the DUTs by moving the imaging elements relative to the surface of the tray in a second direction non-parallel with the first direction; and a position adjusting section that adjusts the positions of the DUTs relative to the socket based on their images captured by the device image capturing section.

    摘要翻译： 用于将DUT传送到插座以用于可以减少测试时间的测试的处理器包括：包括插座的测试部分; 传送具有放置在其表面上的多个DUT的托盘的热施加部，并且将DUT的温度控制到预定的测试温度并将托盘输送到测试部分中; 以及装置图像拍摄部，其包括沿着第一方向布置的成像元件，所述成像元件的数量等于沿着所述第一方向布置的DUT，并且所述加热部中的成像元件通过相对于所述表面移动所述成像元件来捕获所述DUT的图像 的托盘在与第一方向不平行的第二方向上; 以及位置调整部，其基于由所述装置图像拍摄部拍摄的图像来调整所述DUT相对于所述插座的位置。

    Test apparatus with physical separation feature
    9.
    发明授权
    Test apparatus with physical separation feature 有权
    具有物理分离特性的测试设备

    公开(公告)号：US08878545B2

    公开(公告)日：2014-11-04

    申请号：US13504548

    申请日：2011-05-17

    申请人： Jie Zhang ,  Zhiyong Zhang ,  Shouyin Ye ,  Jianhua Qi

    发明人： Jie Zhang ,  Zhiyong Zhang ,  Shouyin Ye ,  Jianhua Qi

    IPC分类号： G01R13/34 ,  H01R3/00 ,  G01R31/28 ,  G01R1/02 ,  G01R1/18

    CPC分类号： G01R1/02 ,  G01R1/18 ,  G01R31/2879

    摘要： A test apparatus with physical separation feature is disclosed. The test apparatus includes probes (210), a peripheral circuit (220), a circuit of special function (230), wherein the peripheral circuit and the circuit of special function are separately arranged on different circuit boards (240, 250). The peripheral circuit and the circuit of special function are both electrically connected to the probes. In the test apparatus with physical separation feature, the peripheral circuit and the circuit of special function are separated in physical spaces, so that interference between the components is prevented and the testing cost is reduced.

    摘要翻译： 公开了具有物理分离特征的测试装置。 测试装置包括探针（210），外围电路（220），特殊功能电路（230），其中外围电路和特殊功能电路分别设置在不同的电路板（240,250）上。 外围电路和特殊功能电路均与探头电连接。 在具有物理分离特性的测试设备中，外围电路和特殊功能电路在物理空间中分离，从而防止组件之间的干扰，降低测试成本。