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公开(公告)号：US09658287B2
公开(公告)日：2017-05-23
申请号：US14472388
申请日：2014-08-29
CPC分类号： G01R31/2891 , G01C11/00 , G01R1/0441 , G01R31/2893
摘要： A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.
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公开(公告)号：US11573267B1
公开(公告)日：2023-02-07
申请号：US17454669
申请日：2021-11-12
发明人： Masataka Onozawa , Yuki Koba
IPC分类号： G01R31/28
摘要： An electronic component handling apparatus handles a DUT and includes: an acquiring device that acquires current three-dimensional shape data of a DUT container having a plurality of accommodating portions each capable of accommodating the DUT; and a computer device that: calculates a first correction amount from the current three-dimensional shape data and corrects the current three-dimensional shape data based on the first correction amount; extracts, from the corrected three-dimensional shape data, at least one of a height and a slope of each of predetermined regions of the DUT container; and determines an accommodation state of the DUT based on an extraction result. The first correction amount represents at least one of a movement amount and a rotation amount in a planar direction of the current three-dimensional shape data with respect to an initial state of the DUT container set in advance.
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公开(公告)号：US09784789B2
公开(公告)日：2017-10-10
申请号：US14472392
申请日：2014-08-29
发明人： Aritomo Kikuchi , Tsuyoshi Yamashita , Mitsunori Aizawa , Hiromitsu Horino , Yuya Yamada , Masataka Onozawa
CPC分类号： G01R31/2891 , G01C11/00 , G01R1/0441 , G01R31/2893
摘要： Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.
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公开(公告)号：US20210285999A1
公开(公告)日：2021-09-16
申请号：US17186846
申请日：2021-02-26
IPC分类号： G01R31/28
摘要： An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: a set plate that holds a DUT container including a plurality of pockets each of which accommodates the DUT; a sensor that acquires three-dimensional shape data of the DUT container; and a processor that corrects the shape data based on an inclination of the set plate, extracts a height and an inclination of a predetermined region corresponding to the DUT in a first pocket among the pockets, from the shape data corrected by the processor, and determines an accommodation state of the DUT in the first pocket based on an extraction result obtained by the processor.
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公开(公告)号：US10324127B2
公开(公告)日：2019-06-18
申请号：US15617266
申请日：2017-06-08
发明人： Yasuyuki Kato , Masataka Onozawa , Keisuke Nitta
摘要： An electronic component handling apparatus (10) is provided which can improve the operation rate. The electronic component handling apparatus (10) includes: a contact arm (300) having a holding part (380) configured to hold a DUT (10A), the contact arm (300) being configured to press the DUT (10A) against a socket (410); an alignment device (200) including a camera (221) and a operation unit (230), the camera (221) being configured to image the DUT (10A) to acquire image information, the operation unit (230) being configured to adjust a position of the holding part (380) within a range of a maximum alignment amount (ALmax); and a control device (105) configured to control the contact arm (300) and the alignment device (200). When a predetermined condition is not satisfied, the control device (105) controls the contact arm (300) and the alignment device (200) so as to perform preliminary alignment work at least once. When the predetermined condition is satisfied, the control device (105) controls the contact arm (300) and the alignment device (200) so as to perform main alignment work.
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公开(公告)号：US10297043B2
公开(公告)日：2019-05-21
申请号：US15481703
申请日：2017-04-07
发明人： Masataka Onozawa , Aritomo Kikuchi
摘要： An apparatus for detecting an attitude of electronic components. The electronic components include an electronic component having a plurality of terminals. The apparatus includes a storage and an image processor. The image processor is configured to: extract a binarized image from an image acquired by an imaging device; perform image matching between a terminal in the binarized image and a terminal in a model image to extract attitude candidates of image matching; obtain coordinates of a corner part of the plurality of terminals from the binarized image of the electronic component; select an attitude candidate from among the attitude candidates of image matching; and output the attitude candidate as a detected attitude of the electronic component.
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公开(公告)号：US09606170B2
公开(公告)日：2017-03-28
申请号：US14472394
申请日：2014-08-29
CPC分类号： G01R31/2891 , G01C11/00 , G01R1/0441 , G01R31/2893
摘要： Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket.
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公开(公告)号：US11353502B2
公开(公告)日：2022-06-07
申请号：US17186846
申请日：2021-02-26
摘要： An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: a set plate that holds a DUT container including a plurality of pockets each of which accommodates the DUT; a sensor that acquires three-dimensional shape data of the DUT container; and a processor that corrects the shape data based on an inclination of the set plate, extracts a height and an inclination of a predetermined region corresponding to the DUT in a first pocket among the pockets, from the shape data corrected by the processor, and determines an accommodation state of the DUT in the first pocket based on an extraction result obtained by the processor.
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公开(公告)号：US09453874B2
公开(公告)日：2016-09-27
申请号：US14472397
申请日：2014-08-29
发明人： Aritomo Kikuchi , Yuya Yamada , Masataka Onozawa
CPC分类号： G01R31/28 , G01R1/04 , G01R1/0433 , G01R31/2887 , G01R31/2891 , G01R31/2893
摘要： Provided is an actuator including: first to third rotation axes provided at a fixed section and having axes in a same direction, first to third rotation sections provided at positions offset from centers of the corresponding rotation axes, and rotating in response to the corresponding rotation axes; a movable section including first and third side walls facing the first and the third rotation sections in a first direction on a movable plane, and a second side wall facing the second rotation section in a second direction, the movable section moving on a predetermined movable plane in response to rotation of the first to third rotation sections; and a biasing section biasing the movable section with respect to the fixed section in at least one of the first direction and the second direction, and making at least one of the first to third rotation sections abut against the corresponding side wall.
摘要翻译： 提供一种致动器，包括：设置在固定部分并具有相同方向的轴的第一至第三旋转轴线，设置在从相应旋转轴线的中心偏移的位置处的第一至第三旋转部分，并响应于相应的旋转轴线 ; 可移动部分，包括在可移动平面上面向第一和第三旋转部分的第一和第三侧壁以及在第二方向上面向第二旋转部分的第二侧壁，可动部分在预定的可移动平面上移动 响应于第一至第三旋转部分的旋转; 以及偏压部，其在所述第一方向和所述第二方向中的至少一个方向上相对于所述固定部偏压所述可动部，并且使所述第一至第三旋转部中的至少一个抵靠所述对应的侧壁。
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公开(公告)号：US09316686B2
公开(公告)日：2016-04-19
申请号：US13671568
申请日：2012-11-08
发明人： Hiromitsu Horino , Masataka Onozawa
CPC分类号： G01R31/2891 , G01R31/2867 , G01R31/2874 , G01R31/2893
摘要： A handler for conveying a plurality of devices under test to a socket for a test that can reduce a test time includes: a test section provided with the socket; a heat applying section into which a tray having a plurality of devices under test placed on its surface is conveyed and that controls the temperature of the devices under test to a predetermined test temperature and conveys the tray into the test section; a device image capturing section that in the heat applying section, captures images of the respective devices under test by moving with respect to the surface of the tray in two non-parallel directions of a first direction and a second direction; and a position adjusting section that adjusts the positions of the devices under test with respect to the socket based on the images of the devices under test captured by the device image capturing section.
摘要翻译： 用于将多个待测设备传送到插座以用于可以减少测试时间的测试的处理器包括：设置有插座的测试部分; 输送具有被测试的多个被测设备的托盘在其表面上的热施加部分，并将被测设备的温度控制在预定的测试温度并将托盘传送到测试部分中; 一种装置图像拍摄部，其在所述加热部中，通过相对于所述托盘的表面在第一方向和第二方向的两个非平行方向上移动来捕获被测试的各个装置的图像; 以及位置调整部，其基于由所述装置图像拍摄部拍摄的被测设备的图像，调整被测设备相对于所述插座的位置。
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