摘要:
An array substrate, and a display panel and a test method therefor are provided. The array substrate includes a plurality of display signal lines disposed in a display area, and a plurality of first pads and a plurality of second pads disposed in a peripheral area around the display area and electrically connected to the respective plurality of display signal lines. A first test area and a second test area are disposed in a first direction on two sides of a primary area respectively. The first pad includes a first primary part and the second pad includes a second primary part. The first primary parts and the second primary parts are disposed in the primary area and are disposed alternately in a second direction.
摘要:
A measurement instrument for measuring electrical characteristics of a device under test (DUT) includes a synchronization signal generator, a coarse phase detection counter and a fine phase detection counter. The synchronization signal generator is connectable with a receiver via a fiber optic cable and a duplexer configured to transmit a synchronization signal from the measurement instrument to the receiver and retransmit the received synchronization signal from the receiver to the measurement instrument. The coarse phase detection counter and the fine phase detection counter are configured to determine one or both of a distance from the receiver to the measurement instrument and a phase shift in the synchronization signal between the receiver and the measurement instrument.
摘要:
According to one aspect, embodiments of the invention provide an overstress indicator circuit comprising a sense circuit configured to monitor a parameter of a device and generate a sense signal corresponding to the parameter, a detection circuit coupled to the sense circuit and configured to receive the sense signal from the sense circuit and generate a detection signal at a first level in response to a determination that the sense signal is indicative of an overstress condition in the device, an interface circuit, and a memory circuit coupled to the detection circuit and the interface circuit and configured to store an overstress condition indication for access via the interface circuit in response to receiving the detection signal at the first level.
摘要:
According to one aspect, embodiments of the invention provide an overstress indicator circuit comprising a sense circuit configured to monitor a parameter of a device and generate a sense signal corresponding to the parameter, a detection circuit coupled to the sense circuit and configured to receive the sense signal from the sense circuit and generate a detection signal at a first level in response to a determination that the sense signal is indicative of an overstress condition in the device, an interface circuit, and a memory circuit coupled to the detection circuit and the interface circuit and configured to store an overstress condition indication for access via the interface circuit in response to receiving the detection signal at the first level.
摘要:
An electronic control circuit for an electronically commutated motor (ECM) is disclosed. A plurality of power transistors controls the ECM, and a reference transistor is formed together with the power transistors on a common support. A control unit is configured to, in a test mode: apply a test current to the reference transistor and one of the power transistors respectively; measure a saturation voltage of the reference transistor and one of the power transistors; evaluate a saturation voltage difference between the measured saturation voltages of the reference transistor and the respective power transistor; evaluate a rate of change of saturation voltage differences between a first iteration of the test mode and a second iteration of the test mode; and determine an expected remaining service life of the power transistors based on the temperature of the support during the test mode and the rate of change of the saturation voltage differences.
摘要:
A method and apparatus for detecting the wiring configuration of an electric power system based upon a particular voltage ratio that is determined for the electric power system. Also a method and apparatus for diagnosing voltage swap conditions in an electric power system. Finally, a method and apparatus for identifying virtual meters in an electric power system.
摘要:
An implantable medical device including at least one electrode line having an electrode pole, an electrode feed line, a counter electrode to the at least one electrode line, and an insulation sleeve. The insulation sleeve surrounds the electrode feed line and provides insulation between the electrode feed line and an electrolyte formed by bodily fluid. The electrode feed line and the electrode pole(s) include different materials, wherein the materials are different based on electrochemical series. The implantable medical device includes an insulation test unit having a DC voltage detector arranged between the electrode pole and the counter electrode, in order to detect an electrochemical voltage produced in the event of an insulation fault of the insulation sleeve due to defective contact between the electrolyte and the electrode feed line.
摘要:
A wiring fault detector adapted specifically to address the requirement for arc fault protection specified in National Electrical Code (2011) article 690.11 comprises running at least one additional wire in parallel with the power conductors to be protected, thereby allowing evaluation at the location of a fault detector of an electrical parameter indicative of conductor integrity along its whole length.In one implementation, the additional conductor allows the voltage drop across the power conductor to be measured and verified to be small and/or noise-free. In another implementation, the additional conductor is a redundant power conductor connected in parallel with the main power conductor, allowing verification that the current flow in both the main and the additional power conductors is partitioned in an expected ratio indicative of wiring integrity.
摘要:
A power conversion unit performs an AC mode or DC mode conversion operation in which AC or DC power is converted to power driving a motor in order to supply a load. In response to the output of a sequence test signal instructing execution of a sequence test, a power source output switching switch shuts off the supply of a power from a power source to the power conversion unit. When the sequence test signal has been output and the supply of power to the power conversion unit has been shut off by means of the power source output switching switch, a control unit controls the AC mode or DC mode in order to cause the power conversion unit to execute a conversion operation corresponding to the power supplied to the power conversion unit in accordance with the switching history of sequence test signal output and non-output.
摘要:
De-embedding apparatus and methods of de-embedding are disclosed. A de-embedding apparatus includes a test structure including a device-under-test (DUT) embedded in the test structure, and a plurality of dummy test structures including an open dummy structure, a distributed open dummy structure, and a short dummy structure. The distributed open dummy structure may include a first signal transmission line coupled to a left signal test pad and a second signal transmission line coupled to a right signal test pad, the first and second signal transmission lines having a smaller total length than a total length of signal transmission lines of the open dummy structure, and intrinsic transmission characteristics of the DUT can be derived from transmission parameters of the dummy test structures and the test structure