Abstract:
An on-chip sensor measures dynamic power supply noise, such as voltage droop, on a semiconductor chip. In-situ logic is employed, which is sensitive to noise present on the power supply of functional logic of the chip. Exemplary functional logic includes a microprocessor, adder, and/or other functional logic of the chip. The in-situ logic performs some operation, and the amount of time required for performing that operation (i.e., the operational delay) is sensitive to noise present on the power supply. Thus, by evaluating the operational delay of the in-situ logic, the amount of noise present on the power supply can be measured.
Abstract:
An apparatus including a conductive stack structure includes an Mx layer interconnect on an Mx layer and extending in a first direction on a first track, an My layer interconnect on an My layer in which the My layer is a lower layer than the Mx layer, a first via stack coupled between the Mx layer interconnect and the My layer interconnect, a second via stack coupled between the Mx layer interconnect and the My layer interconnect, a second Mx layer interconnect extending in the first direction on a track immediately adjacent to the first track, and a third Mx layer interconnect extending in the first direction on a track immediately adjacent to the first track. The Mx layer interconnect is between the second Mx layer interconnect and the third Mx layer interconnect. The second Mx layer interconnect and the third Mx layer interconnect are uncoupled to each other.
Abstract:
A package substrate is provided that includes a substrate and a capacitor. The substrate comprises a cavity penetrating a core layer and metal layers of the substrate. The capacitor comprises electrode pads and is disposed in the cavity. One of the metal layers of the substrate includes a discontinuous metal plane, and the electrode pads directly contact the discontinuous metal plane.
Abstract:
Systems and methods for sensing voltage on a chip are described herein. In one embodiment, a voltage sensor comprises a voltage-controlled oscillator coupled to a voltage being sensed, and a plurality of transition detectors, wherein each of the transition detectors is coupled to a different location on the oscillator, and wherein each of the transition detectors is configured to count a number of transitions at the respective location over a time period. The voltage sensor also comprises an adder configured to add the numbers of transitions from the transition detectors to generate an output value that is approximately proportional to the voltage.
Abstract:
An apparatus including a conductive stack structure includes an Mx layer interconnect on an Mx layer and extending in a first direction on a first track, an My layer interconnect on an My layer in which the My layer is a lower layer than the Mx layer, a first via stack coupled between the Mx layer interconnect and the My layer interconnect, a second via stack coupled between the Mx layer interconnect and the My layer interconnect, a second Mx layer interconnect extending in the first direction on a track immediately adjacent to the first track, and a third Mx layer interconnect extending in the first direction on a track immediately adjacent to the first track. The Mx layer interconnect is between the second Mx layer interconnect and the third Mx layer interconnect. The second Mx layer interconnect and the third Mx layer interconnect are uncoupled to each other.
Abstract:
Systems and methods for sensing voltage on a chip are described herein. In one embodiment, a voltage sensor comprises a voltage-controlled oscillator coupled to a voltage being sensed, and a plurality of transition detectors, wherein each of the transition detectors is coupled to a different location on the oscillator, and wherein each of the transition detectors is configured to count a number of transitions at the respective location over a time period. The voltage sensor also comprises an adder configured to add the numbers of transitions from the transition detectors to generate an output value that is approximately proportional to the voltage.
Abstract:
A stacked integrated circuit includes a first tier IC and a second tier IC. Active faces of the first tier IC and the second tier IC face each other. An interconnect structure, such as microbumps, couples the first tier IC to the second tier IC. An active portion of a voltage regulator is integrated in the first semiconductor IC and coupled to passive components (for example a capacitor or an inductor) embedded in a packaging substrate on which the stacked IC is mounted. The passive components may be multiple through vias in the packaging substrate providing inductance to the active portion of the voltage regulator. The inductance provided to the active portion of the voltage regulator is increased by coupling the through via in the packaging substrate to through vias in a printed circuit board that the packaging substrate is mounted on.
Abstract:
Managing power rails, including: a plurality of power rails, each power rail coupled to at least one power supply and configured to support a plurality of similarly-configured loads; and a power rail controller configured to merge and split the plurality of power rails based on total power consumption of the plurality of similarly-configured loads. The power rail management also determines the optimal power rail mode (merge/split) based on current load of each rail and adjusts the dynamic clock and voltage scaling policy, workload allocation on each core, and performance limit/throttling management according to the power rail mode.
Abstract:
A package substrate is provided that includes a substrate and a capacitor. The substrate comprises a cavity penetrating a core layer and metal layers of the substrate. The capacitor comprises electrode pads and is disposed in the cavity. One of the metal layers of the substrate includes a discontinuous metal plane, and the electrode pads directly contact the discontinuous metal plane.
Abstract:
Managing power rails, including: a plurality of power rails, each power rail coupled to at least one power supply and configured to support a plurality of similarly-configured loads; and a power rail controller configured to merge and split the plurality of power rails based on total power consumption of the plurality of similarly-configured loads. The power rail management also determines the optimal power rail mode (merge/split) based on current load of each rail and adjusts the dynamic clock and voltage scaling policy, workload allocation on each core, and performance limit/throttling management according to the power rail mode.