公开(公告)号：US20240353353A1

公开(公告)日：2024-10-24

申请号：US18682988

申请日：2022-08-17

申请人： Karim S. KARIM ,  Abdollah PIL-ALI

发明人： Karim S. KARIM ,  Abdollah PIL-ALI

IPC分类号： G01N23/041 ,  G03F7/00 ,  G03F7/20 ,  G03F9/00 ,  G21K1/06

CPC分类号： G01N23/041 ,  G03F7/0035 ,  G03F7/2022 ,  G03F9/7003 ,  G21K1/062

摘要： The disclosure is directed at a multi-layer, high-aspect ratio X-ray grating apparatus and method of fabrication. In one embodiment, the disclosure may include a self-alignment methodology, or process, combined with a multiple layer structure fabrication. The grating may include a substrate with a seed layer on top. The grating further includes at least one patterned non-X-ray absorbing layer and at least one X-ray absorbing layer atop the seed layer.

公开(公告)号：US11980494B2

公开(公告)日：2024-05-14

申请号：US17431559

申请日：2020-02-10

申请人： KONINKLIJKE PHILIPS N.V.

发明人： Andriy Yaroshenko ,  Thomas Koehler ,  Hanns-Ingo Maack

IPC分类号： A61B6/00 ,  A61B6/42 ,  G01N23/041

CPC分类号： A61B6/542 ,  A61B6/4291 ,  A61B6/484 ,  A61B6/545 ,  G01N23/041 ,  G21K2207/005

摘要： The invention relates to a control module for controlling an x-ray system (140) during the acquisition of step images for phase imaging. The control module comprises a step image quantity providing unit (111) for providing a step image quantity, a detector dose providing unit (112) for providing a target detector dose, an applied detector dose determination unit (113) for determining an applied detector dose absorbed by a part of the detector (144) during the acquisition of a step image, and a step image acquisition control unit (114) for controlling the x-ray imaging system (140) during the acquisition of each step image based on the applied detector dose, the target detector dose and the step image quantity. The control module allows to control the x-ray imaging system such that the target detector dose is not exceeded while at the same time ensuring a sufficient quality of the step images.

公开(公告)号：US11872071B2

公开(公告)日：2024-01-16

申请号：US17283446

申请日：2019-10-07

申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES ,  CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE ,  INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE LYON

发明人： Odran Pivot ,  Joachim Tabary ,  Clarisse Fournier ,  Jean Michel Letang ,  Simon Rit

IPC分类号： A61B6/00 ,  G01N23/041 ,  G01N23/10 ,  G01N23/18 ,  G01N23/20066 ,  G01N23/201 ,  G01T1/16 ,  G01T1/36 ,  G01N23/20091 ,  G01T1/29 ,  A61B6/06 ,  G01N23/04 ,  G01N23/046

CPC分类号： A61B6/5282 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/4208 ,  A61B6/482 ,  A61B6/483 ,  A61B6/5258 ,  A61B6/585 ,  G01N23/04 ,  G01N23/046 ,  G01N23/201 ,  G01N23/20066 ,  G01N23/20091 ,  G01T1/295 ,  G01T1/2914 ,  G01T1/36 ,  G01N2223/401

摘要： The invention concerns a method for processing energy spectra of radiation transmitted by an object irradiated by an ionising radiation source, in particular X-ray radiation, for medical imaging or non-destructive testing applications. The method uses a detector comprising a plurality of pixels, each pixel being capable of acquiring a spectrum of the radiation transmitted by the object. The method makes it possible, based on a plurality of detected spectra, to estimate a spectrum, referred to as the scattering spectrum, representative of radiation scattered by the object. The estimation involves taking into account a spatial model of the scattering spectrum. Each acquired spectrum is corrected taking into account the estimated scattering spectrum. The invention makes it possible to reduce the influence of the scattering, by the object, of the spectrum emitted by the source.

公开(公告)号：US11835474B2

公开(公告)日：2023-12-05

申请号：US17783183

申请日：2020-12-29

申请人： XENOCS SAS

发明人： Karsten Joensen ,  Peter Hoghoj ,  Ronan Mahe

IPC分类号： G01N23/201 ,  G01N23/041 ,  G01N23/207

CPC分类号： G01N23/041 ,  G01N23/201 ,  G01N23/207 ,  G01N2223/054 ,  G21K2201/067

摘要： An X-ray scattering apparatus having a sample holder for aligning and/or orienting a sample to be analyzed by X-ray scattering, a first X-ray beam delivery system having a first X-ray source, and a first monochromator being arranged upstream of the sample holder for generating and directing a first X-ray beam along a beam path in a propagation direction towards the sample holder is disclosed. A distal X-ray detector arranged downstream of the sample holder and being movable, in particular in a motorized way, along the propagation direction as to detect the first X-ray beam and X-rays scattered at different scattering angles from the sample as the first X-ray beam delivery system is configured to focus the first X-ray beam onto a focal spot on or near the distal X-ray detector when placed at its largest distance from the sample holder is also disclosed.

公开(公告)号：US11652243B2

公开(公告)日：2023-05-16

申请号：US16643298

申请日：2018-09-10

申请人： Konica Minolta, Inc.

发明人： Masahiro Imada ,  Takuji Hatano ,  Koujirou Sekine ,  Masaaki Tsuchida ,  Tsukasa Yagi

IPC分类号： H01M10/42 ,  G01N23/041 ,  G01N3/40 ,  G01N25/72 ,  G01N27/83 ,  H01M10/0525

CPC分类号： H01M10/4285 ,  G01N3/40 ,  G01N23/041 ,  G01N25/72 ,  G01N27/83 ,  H01M10/0525

摘要： A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.

公开(公告)号：US11415529B2

公开(公告)日：2022-08-16

申请号：US16834694

申请日：2020-03-30

申请人： Shimadzu Corporation

发明人： Takahiro Doki ,  Kenji Kimura ,  Taro Shirai ,  Satoshi Sano ,  Akira Horiba ,  Naoki Morimoto

IPC分类号： G01N23/041 ,  G06T5/00

摘要： The X-ray phase imaging apparatus includes an imaging system, a position switching mechanism for switching between a retracted position and an imaging position, a control unit for controlling switching between the retracted position and the imaging position, and an image processing unit for generating an X-ray phase contrast image based on the first image and the second image. The control unit is configured to control sequentially imaging at the retracted position and imaging at the imaging position.

公开(公告)号：US11382574B2

公开(公告)日：2022-07-12

申请号：US16761543

申请日：2018-11-06

申请人： RENSSELAER POLYTECHNIC INSTITUTE

发明人： Ge Wang ,  Wenxiang Cong ,  Qingsong Yang ,  Guang Li

IPC分类号： A61B6/03 ,  A61B6/00 ,  G01N23/041

摘要： A stationary in-vivo grating-enabled micro-CT (computed tomography) architecture (SIGMA) system includes CT scanner control circuitry and a number of imaging chains. Each imaging chain includes an x-ray source array, a phase grating, an analyzer grating and a detector array. Each imaging chain is stationary and each x-ray source array includes a plurality of x-ray source elements. Each imaging chain has a centerline, the centerlines of the number of imaging chains intersect at a center point and a first angle between the centerlines of a first adjacent pair of imaging chains equals a second angle between the centerlines of a second adjacent pair of imaging chains. A plurality of selected x-ray source elements of a first x-ray source array is configured to emit a plurality of x-ray beams in a multiplexing fashion.

公开(公告)号：US11311260B2

公开(公告)日：2022-04-26

申请号：US16834883

申请日：2020-03-30

申请人： Shimadzu Corporation

发明人： Satoshi Sano ,  Koichi Tanabe ,  Yukihisa Wada ,  Satoshi Tokuda ,  Akira Horiba ,  Naoki Morimoto

IPC分类号： A61B6/00 ,  G01N23/041 ,  A61B6/04 ,  G21K1/06

摘要： In this X-ray phase imaging apparatus, at least one of a plurality of gratings is composed of a plurality of grating portions arranged along a third direction perpendicular to a first direction along which a subject or an imaging system is moved by a moving mechanism and a second direction along which an X-ray source, a detection unit, and a plurality of grating portions are arranged. The plurality of grating portions are arranged such that adjacent grating portions overlap each other when viewed in the first direction.

公开(公告)号：US11231378B2

公开(公告)日：2022-01-25

申请号：US16650220

申请日：2018-09-21

申请人： KONINKLIJKE PHILIPS N.V.

发明人： Andriy Yaroshenko ,  Thomas Koehler ,  Peter Benjamin Theodor Nöel ,  Fabio De Marco ,  Lukas Benedict Gromann ,  Konstantin Willer

IPC分类号： G01N23/041 ,  A61B6/00

摘要： The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector (26) is arranged opposite an X-ray source (12) across an examination region (30) with a grating arrangement (18) arranged between the X-ray source (12) and the X-ray detector (26). During an imaging operation without an object in the examination region (30) the grating arrangement (18) is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector (26) whilst the X-ray detector (26) remains stationary relative to the examination region (30) such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (26). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device (10′″) with less scanning motions.

公开(公告)号：US11057536B2

公开(公告)日：2021-07-06

申请号：US16793858

申请日：2020-02-18

申请人： Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.

发明人： Tobias Schoen ,  Wolfgang Holub ,  Daniel Stromer ,  Andreas Maier ,  Gisela Anton ,  Michel Thilo ,  Martin Vossiek ,  Jan Schuer

IPC分类号： H04N1/203 ,  G01N21/3586 ,  G01N23/083 ,  G01N23/041 ,  G01N23/046 ,  G01T1/17

摘要： The invention refers to a system for analyzing a document. Each of two measurement arrangements includes two components being a radiation source and a radiation detector, respectively. The two measurement arrangements provide measurement data and differ from each other with regard to a measurement principle, a kind of radiation source, a kind of radiation detector, a kind of relative movement between the document and a component, a kind of relative arrangement of the two components to each other, a kind of emitted radiation, a kind of received radiation or a kind of processing information about radiation emitted by the respective radiation source and/or about radiation received by the respective radiation detector. An evaluator provides data based on the measurement data. The invention also refers to a corresponding method.