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    Magnetic field observation device and magnetic field observation method
    1.
    发明授权
    Magnetic field observation device and magnetic field observation method 有权
    磁场观测装置及磁场观测方法

    公开(公告)号：US08621658B2

    公开(公告)日：2013-12-31

    申请号：US13819486

    申请日：2011-09-05

    申请人： Hitoshi Saito ,  Satoru Yoshimura

    发明人： Hitoshi Saito ,  Satoru Yoshimura

    IPC分类号： G01Q60/54 ,  G01Q60/38 ,  G01Q60/50

    CPC分类号： G01Q60/38 ,  G01Q60/50 ,  G01Q60/54 ,  G01R33/022 ,  G01R33/0385

    摘要： A magnetic-field-observation device and method for measuring magnetic force near a magnetic material specimen's surface with high resolution and detecting the polarity of the magnetic pole of specimen's surface. The device including: a probe; excitation mechanism that excites it; scanning mechanism that relatively moves the probe and specimen; alternating magnetic field generation mechanism to make the probe periodically undergo magnetization reversal and apply thereto an alternating magnetic field having magnitude not making the specimen undergo magnetization reversal; and modulation measurement mechanism for measuring degree of periodical frequency modulation of the probe's oscillation caused by its apparent spring constant periodically changed by force of periodically changed intensity and applied to the probe by alternating force through magnetic interaction between magnetizations of the probe and specimen, by frequency demodulation or by measuring intensity of one sideband wave spectrum among spectrums generated by the frequency modulation. The method performed using the device.

    摘要翻译： 一种用于以高分辨率测量磁性材料试样表面附近的磁力并检测试样表面磁极极性的磁场观测装置和方法。 该装置包括：探头; 激发机制; 相对移动探头和试样的扫描机构; 交变磁场产生机构使探针周期性地进行磁化反转，并向其施加具有不使样本经历磁化反转的量值的交变磁场; 以及用于测量由其由周期性变化的强度周期性地改变的表观弹簧常数引起的探头振荡周期性频率调制程度的调制测量机构，并且通过以探针和样品的磁化之间的磁相互作用的交替力通过频率施加到探针 通过频率调制产生的频谱中的一个边带波谱的强度进行解调或测量。 使用该设备执行的方法。

    High resolution scanning magnetic microscope operable at high temperature
    2.
    发明授权
    High resolution scanning magnetic microscope operable at high temperature 失效
    高分辨率扫描磁显微镜在高温下可操作

    公开(公告)号：US06930479B2

    公开(公告)日：2005-08-16

    申请号：US10493841

    申请日：2003-03-07

    申请人： Gang Xiao ,  Benaiah D. Schrag

    发明人： Gang Xiao ,  Benaiah D. Schrag

    IPC分类号： G01R33/09 ,  G01N27/72 ,  G01N27/82 ,  G01Q30/04 ,  G01Q60/50 ,  G01Q60/54 ,  G01R33/038 ,  H01L21/66 ,  H01L43/02 ,  H01L43/04 ,  H01L43/06 ,  H01L43/08 ,  G01N27/00

    CPC分类号： G01Q60/50 ,  G01N27/82 ,  G01Q30/04 ,  G01Q60/54 ,  G01R33/0385

    摘要： A scanning magnetic microscope (SMM) (20) includes a current source (27) for imposing an excitation current to a conductor-under-test (CUT) (70) and, if applicable, a reference current to a proximally located reference conductor (72). During accelerated testing, the SMM (20) corrects thermal drift of the CUT (70) via the reference conductor (72). A sensor (21) may be cooled by a heat sink (31) such as a pump (33) directing an airstream or a coldfinger (80). The sensor may switch from a contact to a non-contact mode of scanning the CUT (70). The SMM (20) and methods are useful for measuring electromigration in a CUT (70) as it occurs, for assembling the images into time lapsed representations such as a shape of the CUT (70), for measuring electromigration as a function of a cross sectional area of a wire under a dielectric material (DM) (78), for determining electrical parameters of the CUT (70), and for optimizing a thickness of a DM (78) over a CUT (70). The SMM (20) and methods are further useful for measuring morphological changes in a CUT (70) due to other stressing conditions, such as temperature, excitation current, physical stress(es), hostile environment, aging, semiconductor “burn-in”, or irradiation.

    摘要翻译： 扫描磁显微镜（SMM）（20）包括用于向被测导体（CUT）（70）施加激励电流的电流源（27），以及如果适用的话，向近端定位的参考导体（ 72）。 在加速测试期间，SMM（20）通过参考导体（72）校正CUT（70）的热漂移。 传感器（21）可以由引导空气流或冷指针（80）的诸如泵（33）的散热器（31）来冷却。 传感器可以从接触切换到扫描CUT（70）的非接触模式。 SMM（20）和方法对于测量CUT（70）中的电迁移是有用的，用于将图像组装成诸如CUT（70）的形状的时间过长的表示，用于测量作为交叉的函数的电迁移 在电介质材料（DM）（78）下的导线的横截面面积，用于确定CUT（70）的电参数，以及优化CUT（70）上的DM（78）的厚度。 SMM（20）和方法进一步用于测量CUT（70）中由于其他应力条件（如温度，激发电流，物理应力，敌对环境，老化，半导体“老化”）的形态变化。 ，或照射。

    Methods and compositions for detecting nucleic acids using scanning probe microscopy and nanocodes
    3.
    发明申请
    Methods and compositions for detecting nucleic acids using scanning probe microscopy and nanocodes 有权
    使用扫描探针显微镜和纳代码检测核酸的方法和组合物

    公开(公告)号：US20050147981A1

    公开(公告)日：2005-07-07

    申请号：US10750515

    申请日：2003-12-31

    申请人： Mineo Yamakawa ,  Andrew Berlin

    发明人： Mineo Yamakawa ,  Andrew Berlin

    IPC分类号： C12Q1/68 ,  G01Q60/10 ,  G01Q60/50 ,  C12M1/34

    CPC分类号： C12Q1/6874 ,  B82Y5/00 ,  B82Y10/00 ,  C12Q2565/601 ,  C12Q2563/155 ,  C12Q2525/179

    摘要： A method for determining a nucleotide sequence of a nucleic acid is provided that includes contacting the nucleic acid with a series of labeled oligonucleotides for binding to the nucleic acid, wherein each labeled oligonucleotide includes a known nucleotide sequence and a molecular nanocode. The nanocode of an isolated labeled oligonucleotides that binds to the nucleic acid is then detected using SPM. Nanocodes of the present invention in certain aspects include detectable features beyond the arrangement of tags that encode information about the barcoded object, which assist in detecting the tags that encode information about the barcoded object. The detectable features include structures of a nanocode or associated with a nanocode, referred to herein as detectable feature tags, for error checking/error-correction, encryption, and data reduction/compression.

    摘要翻译： 提供了用于确定核酸的核苷酸序列的方法，其包括使核酸与一系列用于结合核酸的标记的寡核苷酸接触，其中每个标记的寡核苷酸包括已知的核苷酸序列和分子纳代码。 然后使用SPM检测与核酸结合的分离的标记寡核苷酸的纳代码。 在某些方面，本发明的纳代码包括超过编码关于条形码对象的信息的标签布置的可检测特征，其有助于检测编码关于条形码对象的信息的标签。 可检测特征包括用于错误校验/纠错，加密和数据缩减/压缩的纳代码或与纳代码相关联的结构，这里称为可检测特征标签。

    SUPER RESOLUTION FOR MAGNETO-OPTICAL MICROSCOPY
    7.
    发明申请
    SUPER RESOLUTION FOR MAGNETO-OPTICAL MICROSCOPY 有权

    公开(公告)号：US20210405086A1

    公开(公告)日：2021-12-30

    申请号：US16916895

    申请日：2020-06-30

    申请人： UCHICAGO ARGONNE, LLC

    发明人： Suzanne Gabriëlle Everdine te Velthuis ,  Michael Claus Siegfried Vogel ,  Axel Friedrich Hoffmann

    IPC分类号： G01Q60/50 ,  G01R33/032 ,  G02B21/00

    摘要： Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.

    SPM Imaging Apparatus, Probe and Method
    9.
    发明申请
    SPM Imaging Apparatus, Probe and Method 有权
    SPM成像仪器，探头和方法

    公开(公告)号：US20110035849A1

    公开(公告)日：2011-02-10

    申请号：US12921832

    申请日：2009-03-12

    申请人： Martin F. Finlan ,  Shelley J. Wilkins

    发明人： Martin F. Finlan ,  Shelley J. Wilkins

    IPC分类号： G01Q20/02 ,  G01Q70/00 ,  G01Q60/18 ,  G01Q60/50 ,  G01Q60/44

    CPC分类号： G01Q60/38 ,  G01Q60/34 ,  G01Q70/10 ,  G01Q70/14

    摘要： An elongate probe (50) for use in probe microscopy comprises a module (51) provided between a probe tip (53) and a driver (52). In use the driver (52) applies oscillations to the module (51) which are transmitted by the module to the tip (53). With the probe tip (53) positioned close to the surface of a sample, any phase variance in the oscillation of the tip with respect to the driving oscillation is representative of an interaction between the tip and the sample surface. The elongate arrangement of the probe (50) is particularly beneficial when used to probe samples which require a liquid environment.

    摘要翻译： 用于探针显微镜的细长探针（50）包括设置在探针末端（53）和驱动器（52）之间的模块（51）。 在使用中，驱动器（52）向模块（51）施加振荡，模块（51）由模块传送到尖端（53）。 当探针尖端（53）位于样品表面附近时，尖端相对于驱动振荡的振荡的任何相位变化代表尖端和样品表面之间的相互作用。 当用于探测需要液体环境的样品时，探针（50）的细长布置是特别有利的。