Abstract:
In a first aspect, a first substrate processing system is provided that includes (1) a chamber having a plurality of openings through which a substrate may be transported; (2) a substrate carrier opener coupled to a first one of the plurality of openings; (3) a thermal processing chamber coupled to a second one of the plurality of openings; and (4) a wafer handler contained within the chamber, having a substrate clamping blade and a blade adapted to transport high temperature substrates. Numerous other aspects are provided, as are methods and computer program products in accordance with these and other aspects.
Abstract:
The present disclosure is directed to a precursor delivery system is provided having a vaporizer and a reservoir. The reservoir includes an upstream end in fluid communication with the vaporizer. A reservoir valve is in fluid communication with a downstream end of the reservoir and a final valve is disposed downstream of the reservoir valve. A buffer zone is defined between the reservoir valve and the final valve. A first gas inlet is coupled to the buffer zone. The first gas inlet is coupled to a buffer valve.
Abstract:
Embodiments of the disclosure generally relate to a support cylinder used in a thermal process chamber. In one embodiment, the support cylinder comprises a ring body having an inner peripheral surface and an outer peripheral surface, wherein the ring body comprises an opaque quartz glass material and wherein the ring body is coated with an optical transparent layer. The optical transparent layer has a coefficient of thermal expansion that is substantially matched or similar to the opaque quartz glass material to reduce thermal expansion mismatch that may cause thermal stress under high thermal loads. In one example, the opaque quartz glass material is synthetic black quartz and the optical transparent layer comprises a clear fused quartz material.
Abstract:
A method and apparatus for oxidizing materials used in semiconductor integrated circuits, for example, for oxidizing silicon to form a dielectric gate. An ozonator (134) is capable of producing a stream of least 70% ozone. The ozone passes into an RTP chamber (10) through a water-cooled injector (140) projecting into the chamber. Other gases such as hydrogen to increase oxidation rate, diluent gas such as nitrogen or O 2 , enter the chamber through another inlet (122) . The chamber is maintained at a low pressure below 20 Torr and the substrate is advantageously maintained at a temperature less than 800°C. Alternatively, the oxidation may be performed in an LPCVD chamber (210) including a pedestal heater (230) and a showerhead gas injector (220) in opposition to the pedestal (216).
Abstract translation:一种用于氧化半导体集成电路中的材料的方法和装置,例如用于氧化硅以形成电介质栅极。 臭氧发生器(134)能够产生至少70%的臭氧流。 臭氧通过突出到室中的水冷喷射器(140)进入RTP室(10)。 诸如氢气以提高氧化速率的其它气体,诸如氮气或O 2 O 2的稀释气体通过另一个入口(122)进入腔室。 该室被保持在低于20托的低压,并且基板有利地保持在低于800℃的温度。 或者,氧化可以在包括基座加热器(230)和与基座(216)相对的喷头气体喷射器(220)的LPCVD腔室(210)中进行。
Abstract:
A support ring for semiconductor processing is provided. The support ring includes a ring shaped body defined by an inner edge and an outer edge. The inner edge and outer edge are concentric about a central axis. The ring shaped body further includes a first side, a second side, and a raised annular shoulder extending from the first side of the ring shaped body at the inner edge. The support ring also includes a coating on the first side. The coating has an inner region of reduced thickness region abutting the raised annular shoulder.
Abstract:
Embodiments disclosed herein relate to a large vacuum chamber body that has been welded together. The chamber body may have a high emissivity coating on at least one surface therein. Due to the large size of the chamber body, the chamber body may be formed by welding several pieces together rather than forging the body from a single piece of metal. The pieces may be welded together at a location spaced from the corner of the body, which may be under the greatest stress during evacuation, to ensure that the weld, which may be the weakest point in the body, does not fail. At least one surface of the chamber body may be coated with a high emissivity coating to aid in heat transfer from incoming, heated substrates. The high emissivity coating may increase substrate throughput by lowering the time that may be needed to reduce the substrate temperature.
Abstract:
A vacuum chuck and a process chamber equipped with the same are provided. The vacuum chuck assembly comprises a support body, a plurality of protrusions, a plurality of channels, at least one support member supporting the support body, at least one resilient member coupled with the support member, a hollow shaft supporting the support body, at least one electrical connector disposed through the hollow shaft, and an air-cooling apparatus. The support body has a support surface for holding a substrate (such as a wafer) thereon. The protrusions are formed on and project from the support surface for creating a gap between the substrate and the support surface. The channels are formed on the support surface for generating reduced pressure in the gap. The air-cooling apparatus is used for providing air cooling in the vicinity of the electrical connector.
Abstract:
An ampoule having a container, an inlet port, an outlet port, splashguard and a diffuser. The diffuser is disposed within a cavity of the container and comprises a feed tube and a nozzle. The feed tube is coupled to the inlet port and the nozzle is coupled to the feed tube. The nozzle has a closed ring shape and comprises a plurality of holes. A centerline of each of the plurality of holes is oriented at or below a horizontal line of the nozzle to direct fluid away from a lid of the container. The splashguard is coupled to an output port of the ampoule.
Abstract:
A semiconductor processing apparatus is described that has a body with a wall defining two processing chambers within the body; a passage through the wall forming a fluid coupling between the two processing chambers; a lid removably coupled to the body, the lid having a portal in fluid communication with the passage; a gas activator coupled to the lid outside the processing chambers, the gas activator having an outlet in fluid communication with the portal of the lid; a substrate support disposed in each processing chamber, each substrate support having at least two heating zones, each with an embedded heating element; a gas distributor coupled to the lid facing each substrate support; and a thermal control member coupled to the lid at an edge of each gas distributor.
Abstract:
The present invention generally relates to a laser processing systems for thermally processing substrates. The laser processing systems include a shield disposed between an energy source of the laser processing system and a substrate which is to be thermally processed. The shield includes an optically transparent window disposed adjacent to a cavity within the shield. The optically transparent window allows annealing energy to pass therethrough and to illuminate the substrate. The shield also includes one or more gas inlets and one or more gas outlets for introducing and removing a purge gas from the cavity within the shield. The purge gas is utilized to remove volatized or ablated components during thermal processing, and to provide a gas of predetermined composition, such as oxygen-free, to the thermally processed area.