Abstract:
The invention relates to a probe for an optical near field microscope, said probe comprising a planar carrier carrying a probe tip at least partially consisting of a transparent material. The invention also relates to a method for producing one such probe. The aim of the invention is to provide a probe for an optical near field microscope and a method for the production thereof, whereby the probe can be produced with high reproducibility according to a simple technology and can have a simple but efficient light supply. To this end, the carrier of one such probe comprises an optical waveguide, and the inventive method comprises the following steps: a coating comprising an optical waveguide is applied to a substrate in a first step; a transparent layer is applied in a second step, such that the optical waveguide is arranged between the substrate and the transparent layer; the transparent layer is masked in at least one region above the probe tip in a third step; and the transparent layer is etched, forming the probe tip, in a fourth step.
Abstract:
The invention relates to a probe for an optical near field microscope, said probe comprising a tip which is formed on a self-contained carrier, and to a method for producing the same. The aim of the invention is to provide a probe for an optical near field microscope and a method for the production thereof, whereby the probe has a tip with a very small aperture diameter and can thus be produced in a reproducible manner, according to a simple, advantageously controllable method. To this end, the inventive probe is characterised in that the probe tip is embodied as a complete structure which is applied to a planar surface of the carrier, and the inventive method comprises the following steps: a transparent layer is applied to a substrate, the thickness of the transparent layer corresponding to at least the height of the probe tip; the transparent layer is masked in at least one region of the probe tip; and the transparent layer is etched, forming the probe tip.
Abstract:
An apparatus, a method and their use for producing localized, small light sources utilizing surface plasmon are disclosed. An illuminating light (15) is directed at an interface of a surface-plasmon-supporting layer (11) in a stratified structure. This illuminating light excites a surface plasmon (16), which can be interpreted as electron density fluctuations, at one surface of the plasmon-supporting layer. The orientation of the electromagnetic field associated with this surface plasmon is such that depolarization fields are created at specific material interfaces in the system, thereby producing localized light sources (18). The lateral extension of these light sources is determined by the geometry of the interfaces producing them. Thus, light sources with a spatial extension not limited by the Rayleigh criterion can be created. These light sources can have an arbitrary shape and are decoupled from the background associated with the illuminating light. Applications of such localized light sources include, among others, optical lithography, optical data storage, biochips and optical microscopy.
Abstract:
An apparatus for focusing plasmon waves to a spot. The plasmon waves are there converted to light. In one application, the light is used for heat induced magnetic recording. In another application, the light is used as a part of near field scanning microscope. The plasmon waves may be induced on a converging rectangular cone (120) having an aperture (92). The plasmon waves may also be focused on a flat surface (23) by a curved dielectric lens (16). In the heat induced magnetic recording embodiment, a magnetic pole (50, 130) structure is integrated into the focusing apparatus, either as one surface of the rectangular cone, or as a layer (52, 54) upon which the curved dielectric lens is formed.
Abstract:
Bei einem Verfahren zur Herstellung einer Sondenspitze (10) für optische Untersuchungen, insbesondere für die optische Nahfeld-Mikroskopie, mit einer gewünschten Apertur wird an einer Licht leitenden Faser (12) mit einer sich zu ihrem freien Ende hin verjüngenden Umfangsfläche (12c) zwischen dieser Umfangsfläche (12c) und einer auf diese Umfangsfläche (12c) aufgebrachten optisch nicht transparenten Schicht (18/20) wenigstens eine optisch transparente Zwischenschicht (14) vorgesehen, deren Schichtdicke in Abhängigkeit der gewünschten Apertur gewählt ist. Hierdurch können die Sondenspitzen (10) in einem eingachen und skalierbaren Verfahren hergestellt werden.
Abstract:
A multiple source array for illuminating an object including: a reflective mask having an array of spatially separated apertures; at least one optic positioned relative to the mask to form an optical cavity with the mask; and a source providing electromagnetic radiation to the optical cavity to resonantly excite a mode supported by the optical cavity, wherein during operation a portion of the electromagnetic radiation built-up in the cavity leaks through the mask apertures towards the object.
Abstract:
Methods and apparatus for producing small, bright nanometric light sources from apertures that are smaller than the wavelength of the emitted light. Light is directed at a surface layer of metal onto a light barrier structure that includes one or more apertures each of which directs a small spot of light onto a target. The incident light excites surface plasmons (electron density fluctuations) in the top metal surface layer and this energy couples through the apertures to the opposing surface where it is emitted as light from the apertures of from the rims of the apertures. Means are employed to prevent or severely limit the extent to which surface plasmons are induced on the surface at the aperture exit, thereby constraining the resulting emissions to small target areas. The resulting small spot illunination may be used to increase the resolution of microscopes and photolithographic processes, increase the storage capacity and performance of optical data storage systems, and analyze the properties of small objects such as protein and nucleic acid molecules and single cells.
Abstract:
A laser beam (24) is focused to a small spot size onto a sample (14). A silver coated metal probe (16) has its tip positioned within the beam, close to or contacting the sample (14). A reflected Raman signal (28) is detected. The metal probe (16) enhances the Raman signal, and provides high resolution. It may be cantilevered, and scanned across the surface of the sample (14), with its position monitored via optical means (20, 22).
Abstract:
Systems and methods for near-field, interferometric microscopy are disclosed in which a mask having an array of sub-wavelength apertures is used to couple near-field probe beams to a sample. The periphery of the mask further includes one or more larger apertures to couple light to the sample that forms the basis of an interferometric signal indicative of the relative distance between the mask and the sample. The interferometric signal can be the basis of a control signal in a servo system that dynamically positions the mask relative to the sample.