PROBE FOR AN OPTICAL NEAR FIELD MICROSCOPE WITH IMPROVED SCATTERED LIGHT SUPPRESSION AND METHOD FOR PRODUCING THE SAME
    21.
    发明申请
    PROBE FOR AN OPTICAL NEAR FIELD MICROSCOPE WITH IMPROVED SCATTERED LIGHT SUPPRESSION AND METHOD FOR PRODUCING THE SAME 审中-公开
    具有改进的交叉引用的光学针显微镜探针及其制造方法

    公开(公告)号:WO2004068502A3

    公开(公告)日:2004-11-04

    申请号:PCT/EP0314557

    申请日:2003-12-18

    CPC classification number: G01Q60/22

    Abstract: The invention relates to a probe for an optical near field microscope, said probe comprising a planar carrier carrying a probe tip at least partially consisting of a transparent material. The invention also relates to a method for producing one such probe. The aim of the invention is to provide a probe for an optical near field microscope and a method for the production thereof, whereby the probe can be produced with high reproducibility according to a simple technology and can have a simple but efficient light supply. To this end, the carrier of one such probe comprises an optical waveguide, and the inventive method comprises the following steps: a coating comprising an optical waveguide is applied to a substrate in a first step; a transparent layer is applied in a second step, such that the optical waveguide is arranged between the substrate and the transparent layer; the transparent layer is masked in at least one region above the probe tip in a third step; and the transparent layer is etched, forming the probe tip, in a fourth step.

    Abstract translation: 本发明涉及用于近场光学显微镜的探针,其具有带探针尖端的平面载体,其中探针尖端至少部分由透明材料构成。 本发明还涉及制造这种探针的方法。 本发明的目的,一种用于光学近场显微镜和方法的探针,以提供它们的制备,所述探针可以在一个简单的技术高的再现性和具有简单但有效的光递送探头来制造。 该目的是在本发明提到的类型的探测器中实现的,其中载体具有光波导。 关于探针的制造方法,根据本发明通过包括以下步骤的方法实现上述目的:在第一步骤中将涂层涂覆到基底上,所述涂层具有光波导; 在第二步中施加透明层,使得光波导布置在基板和透明层之间; 在第三步骤中至少在探针尖端上方的区域中遮蔽透明层; 以及在第四步骤中蚀刻透明层以形成探针尖端。

    PROBE FOR AN OPTICAL NEAR FIELD MICROSCOPE AND METHOD FOR PRODUCING THE SAME
    22.
    发明申请
    PROBE FOR AN OPTICAL NEAR FIELD MICROSCOPE AND METHOD FOR PRODUCING THE SAME 审中-公开
    探头的光学近场显微镜和方法及其

    公开(公告)号:WO2004068501A3

    公开(公告)日:2004-11-04

    申请号:PCT/EP0314555

    申请日:2003-12-18

    CPC classification number: G01Q60/22

    Abstract: The invention relates to a probe for an optical near field microscope, said probe comprising a tip which is formed on a self-contained carrier, and to a method for producing the same. The aim of the invention is to provide a probe for an optical near field microscope and a method for the production thereof, whereby the probe has a tip with a very small aperture diameter and can thus be produced in a reproducible manner, according to a simple, advantageously controllable method. To this end, the inventive probe is characterised in that the probe tip is embodied as a complete structure which is applied to a planar surface of the carrier, and the inventive method comprises the following steps: a transparent layer is applied to a substrate, the thickness of the transparent layer corresponding to at least the height of the probe tip; the transparent layer is masked in at least one region of the probe tip; and the transparent layer is etched, forming the probe tip.

    Abstract translation: 本发明涉及一种探针用于光学近场显微镜,其包括被一个悬臂梁构成的探针尖端,以及它们的制备的方法。 本发明的目的,一种用于光学近场显微镜和方法的探针,以提供它们的,具有非常小的孔直径的探针尖端的探针,并且可以因此可重复地在一个简单的,有利的控制的工艺制造的制剂。 该目的是通过一个通用的探针,其特征在于,探针尖端形成为一个完整的结构,其被施加到载体的平坦表面关于探针实现。 该目的是利用方面取得一种用于根据本发明通过包括以下步骤的方法制造探针的光学近场显微镜:在衬底上沉积透明层,其中厚度至少为所述探针针尖的高度对应的所述透明层的; 在探针尖端的区域中的至少所述透明层的掩蔽; 和下方形成探头尖端蚀刻透明层。

    SURFACE-PLASMON-GENERATED LIGHT SOURCE AND ITS USE
    23.
    发明申请
    SURFACE-PLASMON-GENERATED LIGHT SOURCE AND ITS USE 审中-公开
    表面等离子体光源及其使用

    公开(公告)号:WO2004025350A1

    公开(公告)日:2004-03-25

    申请号:PCT/IB2003/003939

    申请日:2003-09-04

    Abstract: An apparatus, a method and their use for producing localized, small light sources utilizing surface plasmon are disclosed. An illuminating light (15) is directed at an interface of a surface-plasmon-supporting layer (11) in a stratified structure. This illuminating light excites a surface plasmon (16), which can be interpreted as electron density fluctuations, at one surface of the plasmon-supporting layer. The orientation of the electromagnetic field associated with this surface plasmon is such that depolarization fields are created at specific material interfaces in the system, thereby producing localized light sources (18). The lateral extension of these light sources is determined by the geometry of the interfaces producing them. Thus, light sources with a spatial extension not limited by the Rayleigh criterion can be created. These light sources can have an arbitrary shape and are decoupled from the background associated with the illuminating light. Applications of such localized light sources include, among others, optical lithography, optical data storage, biochips and optical microscopy.

    Abstract translation: 公开了一种利用表面等离子体激光器制造局部化的小光源的装置,方法及其应用。 照明光(15)以分层结构指向表面等离子体支撑层(11)的界面。 这种照射光在等离子体支持层的一个表面处激发可以解释为电子密度波动的表面等离子体(16)。 与该表面等离子体激元相关联的电磁场的取向使得在系统中的特定材料界面处产生去极化场,从而产生局部光源(18)。 这些光源的横向延伸由产生它们的界面的几何形状决定。 因此,可以创建不受瑞利标准限制的空间延伸的光源。 这些光源可以具有任意形状并且与与照明光相关联的背景解耦。 这种局部光源的应用包括光学光刻,光学数据存储,生物芯片和光学显微镜。

    光ファイバープローブの製造方法と微細材料加工方法
    24.
    发明申请
    光ファイバープローブの製造方法と微細材料加工方法 审中-公开
    制造光纤探针的方法和微细材料的制作方法

    公开(公告)号:WO2004003931A1

    公开(公告)日:2004-01-08

    申请号:PCT/JP2003/007412

    申请日:2003-06-11

    Abstract: 光ファイバーの先端部をエッチングすることでコア部を先鋭化して光ファイバープローブとして形成する光ファイバープローブの製造方法において、光ファイバーがコア部(1)と応力付与部(2)とクラッド部(3)とからなる偏波保持光ファイバーであって、光ファイバーの端部を機械研磨することでコア部(1)が最先鋭部にくるように光ファイバーの端部を先鋭形状に形成し、形成された光ファイバーの端部をエッチング液に浸漬することでコア部(1)を更に先鋭化して光ファイバープローブで、高い透過効率および偏光度を併せ持つ新しい光ファイバープローブとする。

    Abstract translation: 一种制造光纤探针的方法,该光纤探针通过蚀刻光纤的前端部分而形成为光纤探针,以锐化芯部,包括以下步骤:通过机械抛光端部将光纤的端部形成为尖锐的形状 使得芯部(1)被带到最尖锐的部分并将所形成的光纤的端部浸入蚀刻剂中以进一步锐化芯部(1),由此光纤探头具有高的 可以提供透射系数和高度的极化。 光纤是具有芯部(1),应力提供部(2)和包层部(3)的极化保持型。

    SURFACE PLASMON LENS FOR HEAT ASSISTED MAGNETIC RECORDING
    25.
    发明申请
    SURFACE PLASMON LENS FOR HEAT ASSISTED MAGNETIC RECORDING 审中-公开
    用于热辅助磁记录的表面等离子体镜头

    公开(公告)号:WO2003058641A2

    公开(公告)日:2003-07-17

    申请号:PCT/US2003/000410

    申请日:2003-01-07

    Abstract: An apparatus for focusing plasmon waves to a spot. The plasmon waves are there converted to light. In one application, the light is used for heat induced magnetic recording. In another application, the light is used as a part of near field scanning microscope. The plasmon waves may be induced on a converging rectangular cone (120) having an aperture (92). The plasmon waves may also be focused on a flat surface (23) by a curved dielectric lens (16). In the heat induced magnetic recording embodiment, a magnetic pole (50, 130) structure is integrated into the focusing apparatus, either as one surface of the rectangular cone, or as a layer (52, 54) upon which the curved dielectric lens is formed.

    Abstract translation: 一种用于将等离子体波聚焦到一个点的装置。 等离子体波在那里被转换为光。 在一个应用中,光用于热诱导磁记录。 在另一个应用中,光被用作近场扫描显微镜的一部分。 可以在具有孔径(92)的会聚矩形锥体(120)上感应等离子体波。 等离子体波也可以通过弯曲的电介质透镜(16)聚焦在平坦表面(23)上。 在热感应磁记录实施例中,将磁极(50,130)结构集成到聚焦装置中,或者作为矩形锥体的一个表面,或作为形成弯曲介电透镜的层(52,54) 。

    VERFAHREN ZUR HERSTELLUNG EINER SONDENSPITZE, INSBESONDERE FÜR DIE OPTISCHE NAHFELD-MIKROSKOPIE, MIT EINER GEWÜNSCHTEN APERTUR
    26.
    发明申请
    VERFAHREN ZUR HERSTELLUNG EINER SONDENSPITZE, INSBESONDERE FÜR DIE OPTISCHE NAHFELD-MIKROSKOPIE, MIT EINER GEWÜNSCHTEN APERTUR 审中-公开
    制造方法探头尖端,特别是用于光学近场显微镜,与期望的通光孔径

    公开(公告)号:WO2003056567A2

    公开(公告)日:2003-07-10

    申请号:PCT/EP2002/014747

    申请日:2002-12-23

    CPC classification number: G01Q60/22

    Abstract: Bei einem Verfahren zur Herstellung einer Sondenspitze (10) für optische Untersuchungen, insbesondere für die optische Nahfeld-Mikroskopie, mit einer gewünschten Apertur wird an einer Licht leitenden Faser (12) mit einer sich zu ihrem freien Ende hin verjüngenden Umfangsfläche (12c) zwischen dieser Umfangsfläche (12c) und einer auf diese Umfangsfläche (12c) aufgebrachten optisch nicht transparenten Schicht (18/20) wenigstens eine optisch transparente Zwischenschicht (14) vorgesehen, deren Schichtdicke in Abhängigkeit der gewünschten Apertur gewählt ist. Hierdurch können die Sondenspitzen (10) in einem eingachen und skalierbaren Verfahren hergestellt werden.

    Abstract translation: 在用于在导光纤维12的制造探针尖端10,用于光学调查,特别是用于近场光学显微镜,具有所需孔径的方法具有以它们的自由端逐渐变细的外周面12c之间,并在该外周面12c 周面12c不施加光学透明层18/20提供的至少一个光学透明的中间层14,该层厚度被选择在所希望的孔径的依赖性。 通过这种方式,将探针可在eingachen和可扩展的方法,10日准备

    MULTIPLE-SOURCE ARRAYS WITH OPTICAL TRANSMISSION ENHANCED BY RESONANT CAVITIES
    27.
    发明申请
    MULTIPLE-SOURCE ARRAYS WITH OPTICAL TRANSMISSION ENHANCED BY RESONANT CAVITIES 审中-公开
    通过共振腔增强光传输的多源阵列

    公开(公告)号:WO0210829A8

    公开(公告)日:2003-07-10

    申请号:PCT/US0123660

    申请日:2001-07-27

    Inventor: HILL HENRY ALLEN

    CPC classification number: G01Q70/06 G01Q10/06 G01Q60/22

    Abstract: A multiple source array for illuminating an object including: a reflective mask having an array of spatially separated apertures; at least one optic positioned relative to the mask to form an optical cavity with the mask; and a source providing electromagnetic radiation to the optical cavity to resonantly excite a mode supported by the optical cavity, wherein during operation a portion of the electromagnetic radiation built-up in the cavity leaks through the mask apertures towards the object.

    Abstract translation: 一种用于照射物体的多源阵列,包括:具有空间上分开的孔阵列的反射掩模; 至少一个相对于所述掩模定位的光学器件,以与所述掩模形成光学腔; 以及向所述光学腔提供电磁辐射以共振地激发由所述光学腔支撑的模式的源,其中在操作期间,在所述腔中构建的电磁辐射的一部分通过所述掩模孔向所述物体泄漏。

    SURFACE PLASMON ENHANCED ILLUMINATION SYSTEM
    28.
    发明申请
    SURFACE PLASMON ENHANCED ILLUMINATION SYSTEM 审中-公开
    表面等离子体增强照明系统

    公开(公告)号:WO2003016781A2

    公开(公告)日:2003-02-27

    申请号:PCT/US2002/026072

    申请日:2002-08-14

    IPC: F21S

    Abstract: Methods and apparatus for producing small, bright nanometric light sources from apertures that are smaller than the wavelength of the emitted light. Light is directed at a surface layer of metal onto a light barrier structure that includes one or more apertures each of which directs a small spot of light onto a target. The incident light excites surface plasmons (electron density fluctuations) in the top metal surface layer and this energy couples through the apertures to the opposing surface where it is emitted as light from the apertures of from the rims of the apertures. Means are employed to prevent or severely limit the extent to which surface plasmons are induced on the surface at the aperture exit, thereby constraining the resulting emissions to small target areas. The resulting small spot illunination may be used to increase the resolution of microscopes and photolithographic processes, increase the storage capacity and performance of optical data storage systems, and analyze the properties of small objects such as protein and nucleic acid molecules and single cells.

    Abstract translation: 用于从小于发射光的波长的孔产生小的,明亮的纳米光源的方法和装置。 光被引导到金属的表面层到包括一个或多个孔的光阻挡结构上,每个孔将小的光点引导到目标上。 入射光激发顶部金属表面层中的表面等离子体激元(电子密度波动),并且该能量通过孔耦合到相对表面,其中作为光从孔的边缘的光发射。 采用手段来防止或严重限制在孔口处的表面上诱导表面等离子体激元的程度,从而将所得到的排放物约束到小目标区域。 所产生的小点染色可用于增加显微镜和光刻工艺的分辨率,增加光学数据存储系统的存储容量和性能,并分析小物体如蛋白质和核酸分子和单细胞的性质。

    APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY
    29.
    发明申请
    APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY 审中-公开
    使用反射散射几何的无损扫描扫描拉曼显微镜

    公开(公告)号:WO2002068919A1

    公开(公告)日:2002-09-06

    申请号:PCT/SG2002/000026

    申请日:2002-02-22

    CPC classification number: G01N21/65 G01N21/658 G01N2021/656 G01Q60/22

    Abstract: A laser beam (24) is focused to a small spot size onto a sample (14). A silver coated metal probe (16) has its tip positioned within the beam, close to or contacting the sample (14). A reflected Raman signal (28) is detected. The metal probe (16) enhances the Raman signal, and provides high resolution. It may be cantilevered, and scanned across the surface of the sample (14), with its position monitored via optical means (20, 22).

    Abstract translation: 将激光束(24)聚焦到样品(14)上的小斑点尺寸。 金属探针或金属涂覆的探针(16)的尖端位于梁内,靠近或接触样品(14)。 检测到反射的拉曼信号(28)。 探头(16)增强拉曼信号,并提供高分辨率。 探针可以是银涂层的; 其尖端和样品之间的距离可以通过悬臂或音叉的原理来控制; 并且其可以扫描穿过样品(14)的表面,其位置通过光学装置(20,22)监测。

    CONTROL OF POSITION AND ORIENTATION OF SUB-WAVELENGTH APERTURE ARRAY IN NEAR-FIELD MICROSCOPY
    30.
    发明申请
    CONTROL OF POSITION AND ORIENTATION OF SUB-WAVELENGTH APERTURE ARRAY IN NEAR-FIELD MICROSCOPY 审中-公开
    近场微波阵列中亚波长光栅阵列的位置和方位控制

    公开(公告)号:WO0210828A2

    公开(公告)日:2002-02-07

    申请号:PCT/US0123656

    申请日:2001-07-27

    Inventor: HILL HENRY ALLEN

    CPC classification number: G01Q60/22 G01Q10/06 G01Q70/06

    Abstract: Systems and methods for near-field, interferometric microscopy are disclosed in which a mask having an array of sub-wavelength apertures is used to couple near-field probe beams to a sample. The periphery of the mask further includes one or more larger apertures to couple light to the sample that forms the basis of an interferometric signal indicative of the relative distance between the mask and the sample. The interferometric signal can be the basis of a control signal in a servo system that dynamically positions the mask relative to the sample.

    Abstract translation: 公开了用于近场干涉显微镜的系统和方法,其中具有亚波长孔径阵列的掩模用于将近场探测光束耦合到样品。 掩模的周边还包括一个或多个较大的孔,以将光耦合到样品,其形成指示掩模和样品之间的相对距离的干涉信号的基础。 干涉信号可以是伺服系统中的控制信号的基础,该控制信号相对于样品动态地定位掩模。

Patent Agency Ranking