Abstract:
A memory system includes a master device, such as a graphics controller or processor, and an integrated circuit memory device operable in a dual column addressing mode. The integrated circuit memory device includes an interface and column decoder to access a row of storage cells or a page in a memory bank. During a first mode of operation, a first row of storage cells in a first memory bank is accessible in response to a first column address. During a second mode of operation, a first plurality of storage cells in the first row of storage cells is accessible in response to a second column address during a column cycle time interval. A second plurality of storage cells in the first row of storage cells is accessible in response to a third column address during the column cycle time interval. During a third mode of operation, a first plurality of storage cells in a first row of storage cells in a first memory bank is accessible in response to a first column address. A second plurality of storage cells in a second row of storage cells in a second bank is accessible in response to a second column address. A third plurality of storage cells in the first row of storage cells is accessible in response to a third column address and a fourth plurality of storage cells in the second row of storage cells is accessible in response to a fourth column address. The first and second column addresses are in a first request packet and the third and fourth column addresses are in a second request packet provided by the master device.
Abstract:
Methods for increasing defect tolerance and fault tolerance in systems containing interconnected components, in which a signal level is classified as belonging to one of a plurality of different, distinguishable classes based on one or more thresholds separating the signal-level classes, and defect-and-fault tolerant systems embodying the methods. An electronic-device embodiment including an array of nanowire crossbars, the nanoscale memory elements within the nanowire crossbars addressed through conventional microelectronic address lines, and a method embodiment for providing fault-tolerant interconnection interfaces with electrically distinguishable signal levels are described. In the described embodiment, in order to interconnect microelectronic address lines with the nanowire crossbars within the electronic memory, an address encoding technique is employed to generate a number of redundant, parity-check address lines to supplement a minimally required set of address signal lines needed to access the nanoscale memory elements.
Abstract:
A method for controlling electric conduction on nanoscale wires is disclosed.The nanoscale wires are provided with controllable regions axially and/or radially distributed. Controlling those regions by means of microscale wires or additional nanoscale wires allows or prevents electric conduction on the controlled nanoscale wires. The controllable regions are of two different types.For example, a first type of controllable region can exhibit a different dopingfrom a second type of controllable region. The method allows one or more of a set of nanoscale wires, packed at sublithographic pitch, to be independentlyselected.
Abstract:
In a memory array consisting of memory cells using a variable resistance storage element and a selection transistor, when current flows in the selection transistor in all the memory cells on the selection word line, non-selection data line should not be driven. For this, a source line parallel to the data line is provided, a pre-charge circuit is provided for driving the both equipotentially, and a circuit for selectively driving the source line is arranged. With this configuration, it is possible to create a current path and generate a read-out signal only in cells selected by the row and column. Thus, it is possible to realize a non-volatile memory such as a phase-change memory having a high integrity, a low noise, and low power consumption as compared to the conventional one.
Abstract:
An improved memory device employs a DRAM array for data storage. In the device, a special row address decoder (74, 76) simultaneously asserts a corresponding unique pair of the wordlines (62, 64) in response to each received valid row address, so that a single valid row address simultaneously accesses two rows of memory cells in the array. The device differentially writes and reads each bit of data across a pair of memory cells; each one of the pair of memory cells being within a different respective row of the array, and the two different rows together corresponding to one of the unique pairs of wordlines asserted by the row address decoder responsive to a valid row address. This arrangement obviates the need for high voltage boosting circuits and thereby reduces power consumption.
Abstract:
The present invention discloses a memory wordline decoder that includes plurality of pre-decoded address lines that are electrically connected with a global x-decoder. A sub x-decoder is electrically connected with the global x-decoder for receiving electrical control signals from the global x-decoder. A memory sector is electrically connected with the sub x-decoder. The global x-decoder selectively controls the sub x-decoder to select a plurality of wordlines in the memory sector. A vertical x-decoder is electrically connected with the global x-decoder and the sub x-decoder. The vertical x-decoder is used to select a predetermined wordline by the global x-decoder during operation.
Abstract:
A decode circuit for selecting one of a plurality of output lines in dependence on the status of a plurality of input lines, the circuit comprising: a first decode arrangement comprising: a first decode node; first precharging circuitry for charging the first decode node to a charging potential; first discharging circuitry comprising a plurality of switching means each operable in dependence on the status of a respective one of the input lines to couple the first decode node to a discharging potential; and first selection circuitry coupled to a respective one of the output lines and operable in response to a first enable signal to select that output line if the first decode node has not discharged; and a second decode arrangement comprising: a second decode node; second precharging circuitry for charging the second decode node to a charging potential; second discharging circuitry comprising a plurality of switching means each operable in dependence on the status of a respective one of the input lines to couple the second decode node to a discharging potential; and second selection circuitry coupled to a respective one of the output lines and operable in response to a second enable signal to select that output line if the second discharge node has not discharged; wherein the first enable signal is derived from the potential of the second decode node.
Abstract:
A digital memory structure manages a subset N of a universe U = {0...M-1} of elements e, where the universe U is represented by a complete binary tree of height m+1 with elements e of the universe U at its leaves. The digital memory structure has an array of overlapped registers reg[i], preferably where 0 )+ 2 ). Any internal node of the binary tree is stored as tagged, if the right and/or the left subtree thereof contain(s) at least one element of subset N. The digital memory structure also has an array of pointers internal[1], preferably where 1
Abstract:
Architectures and circuits are described for various implementations of a memory-centric computing system for DSP and other compute-intensive applications. A shared, reconfigurable memory system is accessible to both a host processor or controller and to one or more execution units such as a DSP execution unit. By swapping memory space between the processor and the execution unit so as to support continuous execution and I/O, improved performance is achieved while cost is reduced. The shared memory system includes multiple reconfigurable memory segments to allow allocation of various amounts of memory to respective execution units or I/O or DMA channels as needed to optimize performance. A "virtual two-port" solution is also described for using single-port memory in the shared configuration with multiple address sources.
Abstract:
A flash memory address decoder with a novel latch structure includes an address terminal to receive an address signal, a procedure terminal to receive a procedure signal, a power terminal to receive a power signal and a flash transistor array having a plurality of wordlines, sourcelines and bitlines. A sourceline decoder is coupled to the address terminal and the power terminals and configured to decode a portion of the address and provide an operational voltage on at least one of the sourcelines. A wordline decoder is coupled to the address terminal and the power terminal and includes a plurality of latches coupled to the wordlines. The wordline decoder is configured to decode a portion of the address and to latch selected wordlines to simultaneously provide a plurality of operational voltages on different ones of the wordlines. A bitline decoder is coupled to the address terminal and configured to decode a portion of the address and to select a plurality of the bitlines as selected bitlines. A sense amplifier is coupled to the bitline decoder and configured to sense current on the selected bitlines and to generate a data word corresponding to the current. A memory controller is coupled to the procedure terminal, the power terminal, the sourceline decoder, the wordline decoder, the bitline decoder and the sense amplifier, and is configured to control the sourceline decoder, the wordline decoder, the bitline decoder and the sense amplifier to perform a procedure responsive to the procedure signal.