Abstract:
A themosettable material having excellent processability, and which cures to form a thermoset composition having a low coefficient of thermal expansion and a high glass transition temperature includes functionalized nanoscopic silica particles dispersed in a curable resin comprising a polyepoxide having at least three epoxide groups per molecule. The composition is useful as an underfill for flip-chip circuit assemblies.
Abstract:
An electronic module (100) includes a substrate (108), at least one surface mounted integrated circuit (IC) component (110) and an underfill material (122). The substrate (108) includes a plurality of electrically conductive traces (118A,118B), formed on at least one surface of the substrate (108), and the component (110) is electrically coupled to at least one of the conductive traces (118A,118B). The underfill material (122) is positioned between the component (110) and the substrate (108) and provides at least one pedestal that supports the component (110) during encapsulation. The underfill material (122), when cured, maintains the integrity of the electrical connections between the component (110) and the conductive traces (118A,118B).
Abstract:
A process for selectively depositing a filled underfill material (14) onto a die surface without covering solder bumps (12) present on the die (10). The process entails microjetting a polymer matrix material, a filler material, and optionally a fluxing material (22) onto the die surface. Together, the polymer matrix and filler materials define the filled underfill material (14) in which the filler material is dispersed to reduce the coefficient of thermal expansion of the underfill material (14). The resulting underfill material (14) surrounds but does not cover the solder bumps (12). The die (10) is then placed on a substrate (16) on which a second underfill material (26) is present, forming a composite underfill layer (24) that completely fills the space between the die (10) and substrate (16) and forms a fillet (28) on a peripheral wall (30) of the die (10).
Abstract:
Disclosed is a method for making a low CTE curable composition. In one embodiment, the method comprises mixing together (i) from 0.1 to 60.0 % by weight of a nanoparticle composition and (ii) from 20.0 to 90.0 % by weight of a curable binder to provide a premixture, based on the total weight of the premixture, and subjecting the premixture to high shear forces until the nanoparticle composition (i) is sufficiently dispersed in the curable binder (ii) to provide a curable composition. It has been found that the nanoparticle composition (i) must be at least one of (a) a strongly functionalized nanoparticle composition (i) having no more than 25 mole % functionalization, (b) a weakly functionalized nanoparticle composition having from 1 to 100 mole % functionalization, (c) a nonfunctionalized nanoparticle composition, or (d) mixtures thereof.
Abstract:
An electronic assembly (100) includes a first substrate (102) and a second substrate (122). The first substrate (102) includes a first surface having a first plurality of conductive traces (106) formed on an electrically non-conductive layer (104). The second substrate (122) includes a first surface having a second plurality of conductive traces (126) formed thereon and a second surface having a third plurality of conductive traces (124) formed thereon. A first electronic component (132) is electrically coupled to one or more of the plurality of conductive traces (126) on the first surface of the second substrate (122). At least one of a plurality of conductive interconnects (108) is incorporated within each solder joint that electrically couples one or more of the conductive traces (124) formed on the second surface of the second substrate (122) to one or more of the conductive traces (106) formed on the first substrate (102).
Abstract:
An electronic module (100) includes a substrate (108), at least one surface mounted integrated circuit (IC) component (110) and an underfill material (122). The substrate (108) includes a plurality of electrically conductive traces (118A,118B), formed on at least one surface of the substrate (108), and the component (110) is electrically coupled to at least one of the conductive traces (118A,118B). The underfill material (122) is positioned between the component (110) and the substrate (108) and provides at least one pedestal that supports the component (110) during encapsulation. The underfill material (122), when cured, maintains the integrity of the electrical connections between the component (110) and the conductive traces (118A,118B).
Abstract:
An electronic assembly (100) includes a first substrate (102) and a second substrate (122). The first substrate (102) includes a first surface having a first plurality of conductive traces (106) formed on an electrically non-conductive layer (104). The second substrate (122) includes a first surface having a second plurality of conductive traces (126) formed thereon and a second surface having a third plurality of conductive traces (124) formed thereon. A first electronic component (132) is electrically coupled to one or more of the plurality of conductive traces (126) on the first surface of the second substrate (122). At least one of a plurality of conductive interconnects (108) is incorporated within each solder joint that electrically couples one or more of the conductive traces (124) formed on the second surface of the second substrate (122) to one or more of the conductive traces (106) formed on the first substrate (102).