摘要:
A first series of bits corresponds to compatibility information of firmware of a computer system. Each bit corresponds to an attribute of the firmware or the system, is equal to one when the attribute denotes a potential incompatibility factor as to the attribute, and is otherwise equal to zero. A second series of bits corresponds to a firmware image with which the firmware is to be upgraded. Each bit indicates whether the firmware image is compatible with the attribute of a corresponding first series bit, is equal to one where the firmware image is compatible with the attribute, and is otherwise equal to zero. A logical AND operation is performed on the first and the second series of bits. Where the result of the logical AND operation is equal to the first series of bits, the firmware is allowed to be upgraded with the image, and otherwise is disallowed.
摘要:
A pupil detection device and a pupil detection method, which are capable of stably detecting the pupil by actively using information of cornea-reflected image even when most of the pupil is hidden by the cornea-reflected image. In pupil detection device (100), peripheral state evaluating section (105) sets a plurality of line segments having a reference point of a cornea-reflected image as one end and having a predetermined length, and calculates a luminance evaluation value based on luminance of each pixel in each line segment and reference luminance. Pupil center straight line calculation section (106) specifies a pupil center straight line passing through a center of a pupil image from among a plurality of line segments based on a luminance evaluation value. Pupil search section (107) detects a pupil image based on a luminance state around the pupil center straight line.
摘要:
An electrostatic discharge (ESD) protector includes a first high heat-conductive substrate, a second high heat-conductive substrate, a varistor layer, and a plurality of via-hole electrodes. The first high heat-conductive substrate is provided with a plurality of first through-holes. The second high heat-conductive substrate is provided with a plurality of second through-holes. The varistor layer that is mainly composed of zinc oxide is disposed between the first high heat-conductive substrate and the second high heat-conductive substrate. The varistor layer includes internal electrodes. Each of via-hole electrodes penetrates the varistor layer and fills both one of the first through-holes and one of the second through-holes to couple both the ones to each other.
摘要:
A method and apparatus of inspecting a sample, in which the sample is inspected under a plurality of inspection conditions, and inspection data obtained by inspecting the sample under each of the plurality of inspection conditions and position information on the sample of the inspection date in correspondence with the respective inspection conditions, are stored. The inspection data for each of the plurality of inspection conditions is against each other by the use of the position information on the sample to determine a position to be inspected in detail, and an image of the sample at a position to be inspected in detail is obtained. The obtained image is classified, the inspection condition of the sample by the use of information of classification of the image is determined.
摘要:
Disclosed are an ambient light reflection determination apparatus and an ambient light reflection determination method enabling to determine reflection without using an edge and even in a case where luminance of a reflection generating part in eyeglasses is low. In a reflection determination apparatus (100), a luminance histogram calculation section (102) calculates a luminance histogram representing a luminance distribution of an eye area image, a difference calculation section (104) calculates a difference histogram by finding a difference between the two luminance histograms calculated from the two eye area images having different photographing timings, an evaluation value calculation section (105) calculates an evaluation value regarding reflection of ambient light based on the difference histogram and a weight in accordance with luminance, and a reflection determination section (107) determines the reflection of ambient light based on the calculated evaluation value.
摘要:
While an illumination optical system 2 is irradiating the surface of a contaminated standard wafer 110 with illumination light, this illumination light is scanned over the surface of the contaminated standard wafer 110, then detectors 31 to 34 of a detection optical system 3 each detect the light scattered from the surface of the contaminated standard wafer 110, next a predefined reference value in addition to detection results on the scattered light is used to calculate a compensation parameter “Comp” for detection sensitivity correction of photomultiplier tubes 331 to 334 of the detectors 31 to 34, and the compensation parameter “Comp” is separated into a time-varying deterioration parameter “P”, an optical characteristics parameter “Opt”, and a sensor characteristics parameter “Lr”, and correspondingly managed.This makes it easy to calibrate the detection sensitivity.
摘要:
A method and apparatus of inspecting a sample, in which the sample is inspected under a plurality of inspection conditions, and inspection data obtained by inspecting the sample under each of the plurality of inspection conditions and position information on the sample of the inspection date in correspondence with the respective inspection conditions, are stored. The inspection data for each of the plurality of inspection conditions is against each other by the use of the position information on the sample to determine a position to be inspected in detail, and an image of the sample at a position to be inspected in detail is obtained. The obtained image is classified, the inspection condition of the sample by the use of information of classification of the image is determined.
摘要:
A method and apparatus of inspecting a sample, in which the sample is inspected under a plurality of inspection conditions, and inspection data obtained by inspecting the sample under each of the plurality of inspection conditions and position information on the sample of the inspection date in correspondence with the respective inspection conditions, are stored. The inspection data for each of the plurality of inspection conditions is against each other by the use of the position information on the sample to determine a position to be inspected in detail, and an image of the sample at a position to be inspected in detail is obtained. The obtained image is classified, the inspection condition of the sample by the use of information of classification of the image is determined.
摘要:
A method and apparatus of inspecting a sample, in which the sample is inspected under a plurality of inspection conditions, and inspection data obtained by inspecting the sample under each of the plurality of inspection conditions and position information on the sample of the inspection date in correspondence with the respective inspection conditions, are stored. The inspection data for each of the plurality of inspection conditions is against each other by the use of the position information on the sample to determine a position to be inspected in detail, and an image of the sample at a position to be inspected in detail is obtained. The obtained image is classified, the inspection condition of the sample by the use of information of classification of the image is determined.
摘要:
An appearance inspection apparatus analyzes a difference in detection characteristics of detection signals obtained by detectors to flexibly meet various inspection purposes without changing a circuit or software. The apparatus includes a signal synthesizing section that synthesizes detection signals from the detectors in accordance with a set condition. An input operating section sets a synthesizing condition of the detection signal by the signal synthesizing section, and an information display section displays a synthesizing map structured based on a synthesized signal which is synthesized by the signal synthesizing section in accordance with a condition set by the input operating section.