Optical combiner system and method

    公开(公告)号:US06567580B2

    公开(公告)日:2003-05-20

    申请号:US09774799

    申请日:2001-02-01

    IPC分类号: G02B628

    摘要: A broadband partial reflector is located downstream from an optical combiner device. The partial reflector reflects a portion of the combined light back through the combiner device and back into the respective optical pump sources. There are no fiber gratings or other filters between the sources and the combiner device. Consequently, the sources are locked and/or stabilized according to the acceptance bandpass characteristics of the input ports of the combiner device. Since no gratings or other filters need to be located between the sources and the combiner device, the problem of insertion power loss due to spectral mismatch at the input ports can be avoided. In other words, self-aligned wavelength feedback stabilization is accomplished by reflecting a portion of the combined light signal back through the input ports of the combiner device.

    High power single mode laser and method of fabrication
    3.
    发明授权
    High power single mode laser and method of fabrication 有权
    大功率单模激光器及其制造方法

    公开(公告)号:US06432735B1

    公开(公告)日:2002-08-13

    申请号:US09602931

    申请日:2000-06-23

    IPC分类号: H01L2906

    摘要: A semiconductor laser having a single transverse mode operation. Optical power higher than that generated by conventional pump lasers is achieved by widening the gain medium without inducing the second transverse mode. This is accomplished by providing a small refractive index difference between active and blocking regions of the laser. The refractive index difference between the laser active region material and the laser blocking region material at the fundamental frequency is less than about 0.029.

    摘要翻译: 具有单横模操作的半导体激光器。 通过在不引起第二横向模式的情况下加宽增益介质来实现比常规泵浦激光器产生的光功率更高的光功率。 这通过在激光器的有源和阻挡区域之间提供小的折射率差来实现。 激光有源区材料与激光阻挡区域材料之间的基频处的折射率差小于约0.029。

    Method of making a semiconductor device
    10.
    发明授权
    Method of making a semiconductor device 失效
    制造半导体器件的方法

    公开(公告)号:US5100836A

    公开(公告)日:1992-03-31

    申请号:US675304

    申请日:1991-03-26

    摘要: Disclosed is a method of making a semiconductor device that exemplarily comprises depositing a Ti/Pt layer onto a AuBe intermediate layer on a p-doped region of a semiconductor body. It also comprises depositing a Ti/Pt layer onto a n-doped region of the semiconductor body, or onto a AuGe intermediate layer on the n-doped region, followed by rapid thermal processing. Exemplarily, the device is a semiconductor laser, the n-doped region is InP, the p-doped region is InGaAs or InGaAsP, and RTP involves heating in the range 425.degree.-500.degree. C. for 10-100 seconds. The method comprises fewer processing steps than typical prior art methods, reduces the danger of fabrication error and of wafer breakage and, significantly, results in contacts that can be relatively thermally stable and can have very low specific contact resistance (exemplarily as low as 10.sup.-7 .OMEGA..multidot.cm.sup.2).

    摘要翻译: 公开了制造半导体器件的方法,其示例性地包括在半导体主体的p掺杂区域上的AuBe中间层上沉积Ti / Pt层。 它还包括将Ti / Pt层沉积到半导体主体的n掺杂区域上,或者在n掺杂区域上的AuGe中间层上沉积,然后进行快速热处理。 示例性地,器件是半导体激光器,n掺杂区域是InP,p掺杂区域是InGaAs或InGaAsP,并且RTP涉及在425℃-500℃范围内加热10-100秒。 该方法包括比典型的现有技术方法更少的处理步骤,降低了制造误差和晶片断裂的危险,并且显着地导致可以相对热稳定并且可以具有非常低的比接触电阻的接触(示例性地低至10- 7 OMEGA xcm2)。