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    COMPOUND MICROSCOPE DEVICE
    1.
    发明申请
    COMPOUND MICROSCOPE DEVICE 有权
    化合物显微镜装置

    公开(公告)号：US20130088775A1

    公开(公告)日：2013-04-11

    申请号：US13638981

    申请日：2011-04-06

    申请人： Kuniaki Nagayama ,  Yoshihiro Arai ,  Hirofumi Iijima ,  Susumu Terakawa

    发明人： Kuniaki Nagayama ,  Yoshihiro Arai ,  Hirofumi Iijima ,  Susumu Terakawa

    IPC分类号： G02B21/00

    CPC分类号： G02B21/0076 ,  G02B21/0032 ,  G02B21/365 ,  H01J37/228 ,  H01J37/26 ,  H01J37/28 ,  H01J2237/045 ,  H01J2237/2608

    摘要： A compound microscope device allowing simultaneous observation of one specimen by a transmission electron microscope and an optical microscope, is provided. A compound microscope device 1 of the present invention has a transmission electron microscope 2 and an optical microscope 4. A specimen 10 and a reflection mirror 41 are disposed on an electron optical axis C of an electron ray. The reflection mirror 41 is inclined from the electron optical axis C toward the optical object lens 43 and the specimen 10. Light from the specimen 10 (fluorescent light, reflection light, and the like) is reflected by the reflection mirror 41 and entered into the optical object lens 43. The electron ray from the electron microscope 2 passes through a mounting center hole 42 of the reflection mirror 41. This makes it possible to observe one specimen simultaneously by the electron microscope 2 and the optical microscope 4.

    摘要翻译： 提供通过透射电子显微镜和光学显微镜同时观察一个样品的复合显微镜装置。 本发明的复合显微镜装置1具有透射电子显微镜2和光学显微镜4.试样10和反射镜41配置在电子射线的电子光轴C上。 反射镜41从电子光轴C朝向光学物镜43和样本10倾斜。来自样本10的光（荧光，反射光等）被反射镜41反射并进入 光学物镜43.来自电子显微镜2的电子射线通过反射镜41的安装中心孔42.这样可以通过电子显微镜2和光学显微镜4同时观察一个样本。

    Compound microscope device
    2.
    发明授权
    Compound microscope device 有权
    复合显微镜装置

    公开(公告)号：US09310596B2

    公开(公告)日：2016-04-12

    申请号：US13638981

    申请日：2011-04-06

    申请人： Kuniaki Nagayama ,  Yoshihiro Arai ,  Hirofumi Iijima ,  Susumu Terakawa

    发明人： Kuniaki Nagayama ,  Yoshihiro Arai ,  Hirofumi Iijima ,  Susumu Terakawa

    IPC分类号： G02B21/00 ,  H01J37/28 ,  H01J37/22 ,  H01J37/26 ,  G02B21/36

    CPC分类号： G02B21/0076 ,  G02B21/0032 ,  G02B21/365 ,  H01J37/228 ,  H01J37/26 ,  H01J37/28 ,  H01J2237/045 ,  H01J2237/2608

    摘要： A compound microscope device allows simultaneous observation of one specimen by a transmission electron microscope and an optical microscope. The compound microscope device 1 of the present invention has a transmission electron microscope 2 and an optical microscope 4. A specimen 10 and a reflection mirror 41 are disposed on an electron optical axis C of an electron ray. The reflection mirror 41 is inclined from the electron optical axis C toward the optical object lens 43 and the specimen 10. Light from the specimen 10 (fluorescent light, reflection light, and the like) is reflected by the reflection mirror 41 and enters into the optical object lens 43. The electron ray from the electron microscope 2 passes through a mounting center hole 42 of the reflection mirror 41. This makes it possible to observe one specimen simultaneously by the electron microscope 2 and the optical microscope 4.

    摘要翻译： 复合显微镜装置允许通过透射电子显微镜和光学显微镜同时观察一个样品。 本发明的复合显微镜装置1具有透射电子显微镜2和光学显微镜4.试样10和反射镜41配置在电子射线的电子光轴C上。 反射镜41从电子光轴C朝向光学物镜43和样本10倾斜。来自样本10的光（荧光，反射光等）被反射镜41反射并进入 光学物镜43.来自电子显微镜2的电子射线通过反射镜41的安装中心孔42.这样可以通过电子显微镜2和光学显微镜4同时观察一个样本。

    Phase Plate For Phase-Contrast Electron Microscope, Method For Manufacturing the Same and Phase-Contrast Electron Microscope
    4.
    发明申请
    Phase Plate For Phase-Contrast Electron Microscope, Method For Manufacturing the Same and Phase-Contrast Electron Microscope 审中-公开
    相位对比电子显微镜相位板，制造相同对比电子显微镜的方法

    公开(公告)号：US20080202918A1

    公开(公告)日：2008-08-28

    申请号：US11791964

    申请日：2005-12-02

    申请人： Kuniaki Nagayama ,  Radostin Danev

    发明人： Kuniaki Nagayama ,  Radostin Danev

    IPC分类号： C23C16/06 ,  C23C16/26 ,  C23C14/14 ,  C23C14/06 ,  C23C14/32

    CPC分类号： H01J37/263 ,  H01J37/26 ,  H01J2237/2614

    摘要： A phase plate (10) for phase-contrast electron microscopes is characterized by comprising a conductive core phase plate (14) which has a phase plate body (11) and a phase plate support (12) supporting it and is arranged in the path of electrons having passed through the objective lens of an electron microscope and in which the phase plate body (11) is so supported on the phase plate support (12) having an opening (13) as to cover at least a part of the opening (13) and a conductive shield thin film (15) covering the periphery of the core phase plate (14) including the upper and lower sides thereof. Consequently, a phase plane for phase-contrast electron microscopes preventing the lens effect incident to charging completely and applicable to the field of material science, its manufacturing method and a phase-contrast electron microscope can be provided.

    摘要翻译： 用于相差电子显微镜的相位板（10）的特征在于包括具有相位板主体（11）的导电芯相位板（14）和支撑它的相位板支撑（12）并布置在 已经通过电子显微镜的物镜的电子，其中相板体11被支撑在具有开口13的相位板支撑件12上，以便覆盖开口13的至少一部分 ）和覆盖所述芯相板（14）的周边的导电屏蔽薄膜（15），所述导电屏蔽薄膜包括其上侧和下侧。 因此，可以提供防止透镜效应完全充电并适用于材料科学领域的相位对比电子显微镜的相平面，其制造方法和相位对比电子显微镜。

    Method of analyzing 3D NMR spectrum
    5.
    发明授权
    Method of analyzing 3D NMR spectrum 失效
    分析三维核磁共振谱的方法

    公开(公告)号：US5168225A

    公开(公告)日：1992-12-01

    申请号：US633937

    申请日：1990-12-26

    申请人： Toshio Yamazaki ,  Kuniaki Nagayama

    发明人： Toshio Yamazaki ,  Kuniaki Nagayama

    IPC分类号： G01R33/32 ,  G01N24/12 ,  G01R33/46

    CPC分类号： G01R33/4625 ,  G01R33/4633

    摘要： There is disclosed a method of symmetrizing a three-dimensional NMR spectrum which is obtained by applying a preparation pulse or pulse sequence, sampling the resulting free induction decay signals with a sequence having two evolution periods and a detection period to obtain data S (t.sub.1, t.sub.2, t.sub.3), and taking the Fourier transform of the data to create the three-dimensional NMR spectrum .alpha. (.omega..sub.1, .omega..sub.2, .omega..sub.3). The 3D NMR spectrum is sliced perpendicularly to the frequency axis .omega..sub.3. Data about the 3D NMR spectrum is arithmetically processed in such a way that peaks having no symmetrical partners at symmertical positions determined also taking account of the direction of the frequency axis .omega..sub.3 are found and erased to obtain a spectrum .alpha..sub.1 (.omega..sub.1, .omega..sub.2, .omega..sub.3). The data about this spectrum is arithmetically processed in such a way that peaks complementary to the peaks having no symmetrical partners in the sliced planes of the spectrum .alpha..sub.1 (.omega..sub.1, .omega..sub.2, .omega..sub.3 ) are added to obtain a symmetrized spectrum .alpha..sub.2 (.omega..sub.1, .omega..sub.2, .omega..sub.3).

    摘要翻译： 公开了通过应用准备脉冲或脉冲序列获得的三维NMR光谱对称化的方法，用具有两个演化周期和检测周期的序列对所得到的自由感应衰减信号进行采样，以获得数据S（t1， t2，t3），并且进行数据的傅立叶变换以产生三维NMR光谱α（ω1，ω2，ω3）。 三维核磁共振光谱垂直于频率轴ω3切片。关于三维核磁共振光谱的数据被算术处理，使得在考虑到频率轴ω3的方向确定的同一位置处没有对称的伴侣的峰是 发现和擦除以获得α1（ω1，ω2，ω3）的光谱。 关于该光谱的数据被算术处理，使得与光谱α1（ω1，ω2，ω3）的切片平面中没有对称配对物的峰互补的峰被加入以获得对称化光谱α2 （ω1，ω2，ω3）。

    Method of determining base sequence of DNA or RNA and DNA sequencer
    8.
    发明申请
    Method of determining base sequence of DNA or RNA and DNA sequencer 有权
    确定DNA或RNA和DNA测序仪碱基序列的方法

    公开(公告)号：US20050244875A1

    公开(公告)日：2005-11-03

    申请号：US11130801

    申请日：2005-05-16

    申请人： Kuniaki Nagayama

    发明人： Kuniaki Nagayama

    IPC分类号： G01N33/50 ,  C12M1/00 ,  C12M1/34 ,  C12N15/09 ,  C12Q1/68 ,  G01N33/58 ,  H01J37/22 ,  H01J37/26 ,  G06K9/00

    CPC分类号： C12Q1/6869 ,  C12Q2565/601 ,  C12Q2563/137

    摘要： Novel DNA sequence determination method and DNA sequencer system providing a sequencing speed 103 to 104 times faster than the current DNA sequencing speed (105 bases per day with a lane at maximum) of the existing DNA sequencer based on electrophoresis. The method includes the step of discriminating base-specific labels of heavy elements using a magnified image of elongated single-chain DNA or RNA produced by a transmission electron microscope (TEM). The DNA sequencer system uses this method. The invention provides a DNA sequencing speed that is higher than the existing speed by 3 or 4 orders of magnitude.

    摘要翻译： 新的DNA序列测定方法和DNA测序系统提供比目前的DNA测序速度快10倍至10倍的测序速度（10 / 基于每天基于电泳的现有DNA测序仪的最大泳道）。 该方法包括使用由透射电子显微镜（TEM）产生的细长单链DNA或RNA的放大图像区分重元素的碱基特异性标记的步骤。 DNA测序仪系统使用这种方法。 本发明提供了比现有速度高3或4个数量级的DNA测序速度。

    Method for modifying nucleic acid bases, and nucleic acid base-modified product
    9.
    发明授权
    Method for modifying nucleic acid bases, and nucleic acid base-modified product 有权
    核酸碱基修饰方法和核酸碱基修饰产物

    公开(公告)号：US08492536B2

    公开(公告)日：2013-07-23

    申请号：US12672649

    申请日：2008-08-08

    申请人： Masanori Kataoka ,  Kuniaki Nagayama

    发明人： Masanori Kataoka ,  Kuniaki Nagayama

    IPC分类号： C07H21/00

    CPC分类号： C07H21/00 ,  C12Q1/6806 ,  C12Q2565/519 ,  C12Q2563/149 ,  C12Q2525/113 ,  C12Q2525/117

    摘要： A method for modifying nucleic acid bases by a chemical means, which enables the discrimination of every base species in plural species of bases in a nucleic acid comprising plural nucleotide units, while retaining the base sequence information of the nucleic acid. A nucleic acid base-modified product provided by the method. The nucleic acid base-modified product is essentially a single strand. In accordance with the invention, a novel means for sequencing a nucleic acid by a microscopic means is provided.

    摘要翻译： 一种通过化学方法修饰核酸碱基的方法，其能够在保留核酸的碱基序列信息的同时，在包含多个核苷酸单元的核酸中区分多种碱基中的每种碱基种类。 通过该方法提供的核酸碱基改性产物。 核酸碱基改性产物基本上是单链。 根据本发明，提供了一种通过微观方法对核酸进行测序的新方法。

    Phase Plate for Electron Microscope and Method for Manufacturing Same
    10.
    发明申请
    Phase Plate for Electron Microscope and Method for Manufacturing Same 失效
    电子显微镜相板及其制造方法

    公开(公告)号：US20090168142A1

    公开(公告)日：2009-07-02

    申请号：US12084478

    申请日：2006-11-01

    申请人： Kuniaki Nagayama

    发明人： Kuniaki Nagayama

    IPC分类号： G02F1/01 ,  G01N23/00

    CPC分类号： H01J37/295 ,  H01J37/26 ,  H01J2237/1514 ,  H01J2237/2614

    摘要： A phase plate for an electron microscope in which a portion of a magnetic thin-wire ring or a magnetic thin-wire rod (15) spans an opening of a support member (14) having the opening, the magnetic thin-wire ring or magnetic thin-wire rod (15) generates a vector potential, and a phase difference is formed between electron beams that pass through left and right sides of a spanning portion of the magnetic thin-wire ring or the magnetic thin-wire rod (15). The phase plate prevents the electron beam loss more effectively, can be applied at an accelerating voltage within a wide rage from a low voltage to a high voltage, causes no difficulties in production, has good utility, and makes it possible to obtain a high-contrast image.

    摘要翻译： 一种用于电子显微镜的相位板，其中磁性细线环或磁性细线（15）的一部分跨越具有开口的支撑构件（14）的开口，磁性细线环或磁性 细线棒（15）产生矢量电位，并且在穿过磁性细线环或磁性细线材（15）的跨越部分的左侧和右侧的电子束之间形成相位差。 相位板可以更有效地防止电子束损失，可以在从低电压到高电压的广泛范围内的加速电压下施加，不会产生生产困难，具有很好的效用， 对比图像。