Abstract:
An embodiment circuit includes a first reference source configured to provide a first reference signal to an analog-to-digital convertor (ADC). The circuit also includes a filter coupled to an output of the first reference source and configured to filter the first reference signal to produce a filtered first reference signal. The circuit further includes a second reference source coupled to an output of the filter. The second reference source is configured to provide a second reference signal to the ADC, and the second reference signal is generated based on the filtered first reference signal.
Abstract:
An embodiment circuit includes a first reference source configured to provide a first reference signal to an analog-to-digital convertor (ADC). The circuit also includes a filter coupled to an output of the first reference source and configured to filter the first reference signal to produce a filtered first reference signal. The circuit further includes a second reference source coupled to an output of the filter. The second reference source is configured to provide a second reference signal to the ADC, and the second reference signal is generated based on the filtered first reference signal.
Abstract:
An embodiment circuit includes a first reference source configured to provide a first reference signal to an analog-to-digital convertor (ADC). The circuit also includes a filter coupled to an output of the first reference source and configured to filter the first reference signal to produce a filtered first reference signal. The circuit further includes a second reference source coupled to an output of the filter. The second reference source is configured to provide a second reference signal to the ADC, and the second reference signal is generated based on the filtered first reference signal.
Abstract:
A built-in self-test (BIST) circuit is provided for testing an analog-to-digital converter (ADC). A multi-order sigma-delta (ΣΔ) modulator has an input that receives an input signal, a first output generating analog test signal derived from the input signal and applied to an input of the ADC and a second output generating a binary data stream. A digital recombination and filtering circuit has a first input that receives the binary data stream and a second input that receives a digital test signal output from the ADC in response to the analog test signal. The digital recombination and filtering circuit combines and filters the binary data stream and digital test signal to generate a digital result signal including a signal component derived from an error introduced by operation of the ADC. A correlation circuit is used to isolate that error signal component.
Abstract:
An asynchronous SAR ADC converts an analog signal into a series of digital pulses in an efficient, low power manner. In synchronous SAR ADC circuits, a separate and cumbersome clock signal is used to trigger the internal circuitry of the SAR ADC. Instead of triggering the components of the SAR DAC synchronously with a clock signal, the asynchronous solution uses its own internal signals to trigger its components in an asynchronous cyclic manner. Further, in order to increase efficiency and guard against circuit failures due to difficulties arising from transient signals, the asynchronous SAR ADC may also include a delay circuit for introducing a variable delay to the SAR ADC cycle.
Abstract:
An embodiment ADC device includes a plurality of comparator elements, each comparator element of the plurality of comparator elements having a first input connected to an input port, each comparator element of the plurality of comparator elements having a second input port connected to a reference signal port. The ADC device further has a switch matrix having routing circuitry connected to an output of each comparator of the plurality of comparators, and a plurality of latches, with each latch of the plurality of latches having an input connected to the routing circuitry. The routing circuitry is configured to connect the output of each comparator of the plurality of comparators to an input of each latch of the plurality of latches according to one or more signals received at one or more control ports.
Abstract:
An amplifier has a first pull-up path coupled between a voltage supply node and an output node, and a pull-down path coupled between the output node and a ground supply node. A second pull-up path is coupled between the voltage supply node and the output node. The second pull-up path is actuated by a feedback signal and biased by a biasing signal. An inverter circuit is operable to invert the signal at the amplifier output node to generate the feedback signal. A biasing circuit is configured to generate the biasing signal. The biasing circuit is configured to control a relative strength of the pull-down path to the second pull-up path, wherein the pull-down path is stronger than the second pull-up path in a manner that is consistently present over all PVT corners.
Abstract:
An embodiment circuit includes a first reference source configured to provide a first reference signal to an analog-to-digital convertor (ADC). The circuit also includes a filter coupled to an output of the first reference source and configured to filter the first reference signal to produce a filtered first reference signal. The circuit further includes a second reference source coupled to an output of the filter. The second reference source is configured to provide a second reference signal to the ADC, and the second reference signal is generated based on the filtered first reference signal.
Abstract:
An embodiment circuit includes a first reference source configured to provide a first reference signal to an analog-to-digital convertor (ADC). The circuit also includes a filter coupled to an output of the first reference source and configured to filter the first reference signal to produce a filtered first reference signal. The circuit further includes a second reference source coupled to an output of the filter. The second reference source is configured to provide a second reference signal to the ADC, and the second reference signal is generated based on the filtered first reference signal.
Abstract:
A bandgap voltage generator includes a plurality of calibration transistors. A test circuit measures the bandgap reference voltage generated by the bandgap voltage generator and enables a subset of the calibration transistors to correct to the bandgap reference voltage.