公开(公告)号：US20180221866A1

公开(公告)日：2018-08-09

申请号：US15613504

申请日：2017-06-05

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hong-Geun KIM ,  Seung Hyun KIM ,  Sung Ha PARK ,  Ji Young PARK ,  Kyung-Mi SONG ,  Dae Sun LEE ,  Jong Gun LEE ,  Jong Yup CHOI ,  Yu Kyung TAK

IPC: B01L3/00 ,  G01N33/49

Abstract: A fluid analysis cartridge with improved test reliability and an associated fluid analysis cartridge assembly are disclosed herein. A fluid analysis cartridge assembly includes a sample collecting member having a sample collecting chamber and a fluid analysis cartridge configured to be connected to the sample collecting member. The fluid analysis cartridge includes a sample receiving chamber configured to receive a sample collected by the sample collecting member and at least one hole arranged on one side of the sample receiving chamber and opened by connection of the sample collecting member to the fluid analysis cartridge to the at least one hole. The sample receiving chamber stores a buffer solution to be mixed with the sample.

公开(公告)号：US20190195842A1

公开(公告)日：2019-06-27

申请号：US16050799

申请日：2018-07-31

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seung Hyun KIM ,  Kyu Youn HWANG

IPC: G01N30/74 ,  G01N30/86 ,  G06F3/0481

CPC classification number: G01N30/74 ,  B01L3/502715 ,  B01L2200/143 ,  B01L2300/0816 ,  B01L2400/0406 ,  G01N21/8483 ,  G01N30/8651 ,  G01N30/8693 ,  G01N33/54386 ,  G01N33/557 ,  G06F3/0481

Abstract: A testing apparatus and control method thereof are provided. The testing apparatus includes a detector configured to measure optical characteristic values on a control line and a test line formed on a reactor; and a controller configured to obtain an optical characteristic value measured, by the detector, on the control line, determine a reaction time corresponding to the optical characteristic value measured on the control line based on predetermined reaction time information, and determine a measurement time at which the detector is to measure another optical characteristic value on the test line based on the reaction time that is determined

公开(公告)号：US20140175474A1

公开(公告)日：2014-06-26

申请号：US13967733

申请日：2013-08-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang Heon HAN ,  Jong Pa HONG ,  Seung Hyun KIM ,  Yun Hee SHIN ,  Jeong Wook LEE

IPC: H01L33/00

CPC classification number: H01L33/007 ,  H01L33/20 ,  H01L2933/0091

Abstract: A method of manufacturing a semiconductor light emitting device, includes: forming a plurality of concave portions on a substrate; injecting silica particles into the plurality of concave portions; and forming a semiconductor layer on the substrate, the semiconductor layer including voids formed in portions of the semiconductor layer, the portions being located above the plurality of concave portions.

Abstract translation: 一种半导体发光器件的制造方法，包括：在基板上形成多个凹部; 将二氧化硅颗粒注入到所述多个凹部中; 以及在所述基板上形成半导体层，所述半导体层包括在所述半导体层的部分中形成的空隙，所述半导体层位于所述多个凹部的上方。

公开(公告)号：US20190204314A1

公开(公告)日：2019-07-04

申请号：US16057206

申请日：2018-08-07

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seung Hyun KIM ,  Kyu Youn HWANG

IPC: G01N33/543

CPC classification number: G01N33/54386

Abstract: A sample analysis cartridge and a sample analysis apparatus having the sample analysis cartridge are provided. The sample analysis cartridge includes a housing having a sample injecting hole and a strip coupled with the housing such that a sample that is passed through the sample injecting hole is directed into the strip, and the strip is configured to detect a target material from the sample through an antigen-antibody reaction. The strip includes a membrane including a test line and a transparent cover disposed outside the membrane.

公开(公告)号：US20230031793A1

公开(公告)日：2023-02-02

申请号：US17724340

申请日：2022-04-19

Applicant: Samsung Electronics Co., Ltd.

Inventor： Seung Hyun KIM ,  Joo Hyun JEON ,  Jae Seong PARK ,  Sung Jin KIM ,  Sung Duk HONG

IPC: G06F30/23

Abstract: A simulation system is provided. The simulation system comprises a processor, and a storage to store a simulation program that, when executed by the processor, causes the processor to, use a finite difference method (FDM) to calculate heat energy data generated by light energy provided to a simulation domain, receive the calculated heat energy data and use a finite-element method (FEM) to calculate temperature change data of the simulation domain over time and calculate phase change data of the simulation domain over time, and calculate a silicon loss of the simulation domain using the calculated temperature change data and the calculated phase change.

公开(公告)号：US20170077346A1

公开(公告)日：2017-03-16

申请号：US15341259

申请日：2016-11-02

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang Heon HAN ,  Dong Yul LEE ,  Seung Hyun KIM ,  Jang Mi KIM ,  Suk Ho YOON ,  Sang Jun LEE

IPC: H01L33/00 ,  H01L33/14 ,  H01L33/06

CPC classification number: H01L33/0075 ,  H01L33/0025 ,  H01L33/007 ,  H01L33/06 ,  H01L33/145 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48237 ,  H01L2224/48247 ,  H01L2224/48257 ,  H01L2224/49107 ,  H01L2924/181 ,  H01L2924/00014 ,  H01L2924/00012

Abstract: A method of fabricating a semiconductor light emitting device includes forming a first conductivity type semiconductor layer, forming an active layer by alternately forming a plurality of quantum well layers and a plurality of quantum barrier layers on the first conductivity type semiconductor layer, and forming a second conductivity type semiconductor layer on the active layer. The plurality of quantum barrier layers include at least one first quantum barrier layer adjacent to the first conductivity type semiconductor layer and at least one second quantum barrier layer adjacent to the second conductivity type semiconductor layer. The forming of the active layer includes allowing the at least one first quantum barrier layer to be grown at a first temperature and allowing the at least one second quantum barrier layer to be grown at a second temperature lower than the first temperature.

Abstract translation: 一种制造半导体发光器件的方法包括：形成第一导电型半导体层，通过在第一导电型半导体层上交替地形成多个量子阱层和多个量子势垒层来形成有源层，并形成第二导电型半导体层 导电型半导体层。 多个量子势垒层包括与第一导电类型半导体层相邻的至少一个第一量子势垒层和与第二导电类型半导体层相邻的至少一个第二量子势垒层。 活性层的形成包括允许至少一个第一量子势垒层在第一温度下生长并允许至少一个第二量子势垒层在低于第一温度的第二温度下生长。

公开(公告)号：US20150238955A1

公开(公告)日：2015-08-27

申请号：US14632327

申请日：2015-02-26

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jong Gun LEE ,  Seung Hyun KIM ,  Seung Hoon KIM ,  Jung Ki MIN ,  Yang-Ui LEE ,  Jae Sang NOH

IPC: B01L3/00 ,  G01N35/10

CPC classification number: B01L3/502715 ,  B01L3/50273 ,  B01L3/502738 ,  B01L2300/021 ,  B01L2300/069 ,  B01L2300/0806 ,  B01L2400/0409 ,  B01L2400/0677 ,  B01L2400/0688 ,  G01N21/07

Abstract: Disclosed herein is a microfluidic device, which includes a platform, at least one chamber provided in the platform to accommodate a sample, and at least one channel configured to couple the chambers to each other. The at least one chamber includes a detection chamber configured to detect the sample, and the microfluidic device further includes a light blocking portion configured to prevent external light from entering the detection chamber so as to prevent occurrence of errors in detection of the sample in the detection chamber. The microfluidic device can be useful for preventing the occurrence of detection errors which might otherwise be caused by interference of external light. The microfluidic device may also be useful for reducing an inspection time and for miniaturizing microfluidic devices. Further, the microfluidic device may be useful for preventing contaminants from entering the detection chamber.

Abstract translation: 本文公开了一种微流体装置，其包括平台，设置在平台中以容纳样品的至少一个腔室和被配置为将腔室彼此耦合的至少一个通道。 所述至少一个室包括被配置为检测样品的检测室，并且所述微流体装置还包括遮光部，所述遮光部被配置为防止外部光进入所述检测室，以防止在所述检测中检测到所述样品的错误 房间。 微流体装置可以用于防止可能由外部光的干扰引起的检测错误的发生。 微流体装置还可用于减少检查时间并使微流体装置微型化。 此外，微流体装置可用于防止污染物进入检测室。