Lamella creation method and device using fixed-angle beam and rotating sample stage
    8.
    发明申请
    Lamella creation method and device using fixed-angle beam and rotating sample stage 有权
    薄片创建方法和使用固定角度光束和旋转样品台的装置

    公开(公告)号:US20130328246A1

    公开(公告)日:2013-12-12

    申请号:US13493735

    申请日:2012-06-11

    IPC分类号: H01J37/26 H01J37/20

    摘要: A system for creating a substantially planar face in a substrate, the system including directing one or more beams at a first surface of a substrate to remove material from a first location, the beam being offset from a normal to the first surface by a curtaining angle; sweeping the one or more beams in a plane that is perpendicular to the first surface to mill one or more initial cuts, the initial cuts exposing a second surface that is substantially perpendicular to the first surface; rotating the substrate about an axis other than an axis normal to the first beam or parallel to the first beam; directing the first beam at the second surface to remove additional material from the substrate without changing the curtaining angle; and scanning the one or more beams in across the second surface to mill one or more finishing cuts.

    摘要翻译: 一种用于在基板中产生基本上平坦的面的系统,所述系统包括在基板的第一表面处引导一个或多个光束以从第一位置移除材料,所述光束从第一表面的法线偏移一个展示角 ; 在垂直于第一表面的平面中扫掠一个或多个光束以研磨一个或多个初始切割,初始切割暴露基本上垂直于第一表面的第二表面; 围绕除了垂直于第一光束的轴的轴线或平行于第一光束的轴线旋转基板; 在所述第二表面处引导所述第一光束以从所述衬底移除附加材料而不改变所述观察角度; 并且扫描穿过第二表面的一个或多个光束以研磨一个或多个精加工切割。

    Beam positioning for beam processing
    10.
    发明授权
    Beam positioning for beam processing 有权
    光束处理的光束定位

    公开(公告)号:US07880151B2

    公开(公告)日:2011-02-01

    申请号:US12039535

    申请日:2008-02-28

    申请人: Andrew B. Wells

    发明人: Andrew B. Wells

    IPC分类号: G01N23/00

    摘要: An improved method and apparatus of beam processing corrects for beam drift while a beam is processing a sample. The beam position is aligned using a fiducial that is sufficiently near the working area so that the fiducial can be imaged and the sample processed without a stage moving. During processing, the beam positioning is corrected for drift using a model that predicts the drift.

    摘要翻译: 一种改进的光束处理方法和装置在光束处理样品时校正光束漂移。 使用足够靠近工作区域的基准来对准光束位置,使得可以对基准进行成像,并且样品在没有阶段移动的情况下进行处理。 在处理期间,使用预测漂移的模型来校正波束定位以进行漂移。