公开(公告)号：US20240207011A1

公开(公告)日：2024-06-27

申请号：US18595996

申请日：2024-03-05

申请人： Inscopix, Inc.

发明人： Koen VISSCHER ,  Pei Sabrina XU ,  Shay NEUFELD

IPC分类号： A61B90/20 ,  A61B5/00 ,  A61B5/24 ,  G01N21/64 ,  G01Q10/00 ,  G02B3/14 ,  G02B21/00 ,  G02B21/02 ,  G02B21/06 ,  G02B21/16 ,  G02B21/24 ,  G02B21/32

CPC分类号： A61B90/20 ,  A61B5/0059 ,  A61B5/0071 ,  A61B5/4064 ,  G01N21/6458 ,  G02B21/0004 ,  G02B21/0096 ,  G02B21/025 ,  G02B21/06 ,  G02B21/16 ,  G02B21/32 ,  A61B5/0035 ,  A61B5/24 ,  G01N2021/6439 ,  G01N2021/6441 ,  G01Q10/00 ,  G02B3/14 ,  G02B21/242

摘要： An adapter configured to be optically coupled to a plurality of microscopes and having (i) a first microscope interface configured to optically couple a first microscope system to an optical element that is in optical communication with an optical probe to provide first imaging data of a sample, and (ii) a second microscope interface configured to optically couple a second microscope system to the optical element to provide second imaging data of the sample. An optical imaging apparatus and method utilizing such adapter.

公开(公告)号：US11690696B2

公开(公告)日：2023-07-04

申请号：US17484791

申请日：2021-09-24

申请人： INSCOPIX, INC.

发明人： Mark O. Trulson ,  Alice Stamatakis ,  Koen Visscher

IPC分类号： A61B90/20 ,  G01N21/64 ,  G02B21/16 ,  G02B21/06 ,  A61B5/00 ,  G02B21/02 ,  G02B21/00 ,  G02B21/32 ,  G02B3/14 ,  A61B5/24 ,  G01Q10/00 ,  G02B21/24

CPC分类号： A61B90/20 ,  A61B5/0059 ,  A61B5/0071 ,  A61B5/4064 ,  G01N21/6458 ,  G02B21/0004 ,  G02B21/0096 ,  G02B21/025 ,  G02B21/06 ,  G02B21/16 ,  G02B21/32 ,  A61B5/0035 ,  A61B5/24 ,  G01N2021/6439 ,  G01N2021/6441 ,  G01Q10/00 ,  G02B3/14 ,  G02B21/242

摘要： Provided herein are systems and methods for simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system. The microscope can comprise in part an imaging light source and a stimulation light source. Light from the imaging light source and the stimulation light source can be spectrally separated to reduce cross talk between the stimulation light and the imaging light.

公开(公告)号：US10197595B2

公开(公告)日：2019-02-05

申请号：US15077599

申请日：2016-03-22

申请人： Bruker Nano, Inc.

发明人： Chanmin Su

IPC分类号： G01Q10/00 ,  B82Y35/00 ,  G01Q10/06 ,  G01Q70/06 ,  G01Q60/32 ,  G01Q60/36

摘要： An apparatus and method of positioning a probe of an atomic force microscope (AFM) includes using a dual probe configuration in which two probes are fabricated with a single base, yet operate independently. Feedback control is based on interaction between the reference probe and surface, giving an indication of the location of the surface, with this control being modified based on the difference in tip heights of the two probes to allow the sensing probe to be positioned relative to the sample at a range less than 10 nm.

公开(公告)号：US10088450B2

公开(公告)日：2018-10-02

申请号：US15526231

申请日：2014-12-08

申请人： HITACHI, LTD.

发明人： Takeshi Nakayama ,  Masanari Koguchi

IPC分类号： G01N27/62 ,  G01N33/20 ,  G01N1/44 ,  G01Q10/00 ,  H01J37/285

摘要： Areas having different isotopic ratios are artificially introduced into a metal material before sintering, a heat treatment, or grain boundary diffusion, and atom probe analysis results before and after sintering, a heat treatment, or grain boundary diffusion are compared to evaluate a change in isotopic distribution over time.

公开(公告)号：US10041970B2

公开(公告)日：2018-08-07

申请号：US15326237

申请日：2015-07-14

申请人： Rutgers, The State University of New Jersey

发明人： Qingze Zou ,  Juan Ren ,  Jiangbo Liu

IPC分类号： G01Q10/00 ,  G01Q10/06 ,  G01Q60/34

摘要： A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.

公开(公告)号：US09995764B2

公开(公告)日：2018-06-12

申请号：US15455305

申请日：2017-03-10

申请人： Carl Zeiss SMT GmbH

发明人： Hans Hermann Pieper ,  Christof Baur ,  Rainer Fettig

IPC分类号： G01Q10/00 ,  G01Q10/06 ,  G01Q60/24

CPC分类号： G01Q10/065 ,  G01Q60/24 ,  G01Q60/30

摘要： The present application relates to a method for avoiding damage when analyzing a sample surface with a scanning probe microscope, the method comprising the step of: detecting an electrostatic interaction between a charging of the sample surface and a measuring tip of the scanning probe microscope in the course of the approach of the measuring tip to the sample surface already at a distance from the sample surface which is greater than the distance of the measuring tip when analyzing the sample surface.

公开(公告)号：US09977049B2

公开(公告)日：2018-05-22

申请号：US15092027

申请日：2016-04-06

申请人： OLYMPUS CORPORATION

发明人： Nobuaki Sakai

IPC分类号： G01Q10/00 ,  G01Q10/06 ,  G01Q60/32 ,  B82Y35/00

CPC分类号： G01Q10/00 ,  B82Y35/00 ,  G01Q10/065 ,  G01Q60/32

摘要： A scanning probe microscope includes a cantilever having a probe at a free end thereof; a scanner to three-dimensionally relatively move the probe and a sample; a vibrator to vibrate the cantilever based on a vibrating signal; a displacement detector to detect a displacement of the cantilever and to output a displacement signal indicating the displacement; and a phase difference information detecting section to generate a phase signal including information of a phase difference between the vibrating signal and the displacement signal. The phase difference information detecting section includes a phase regulating portion to provide, to the phase difference, a phase offset to cancel an initial phase difference present in a state in which the probe is not in contact with the sample.

公开(公告)号：US20170199220A1

公开(公告)日：2017-07-13

申请号：US15428552

申请日：2017-02-09

申请人： AIST-NT, Inc.

发明人： Sergey A. Saunin ,  Andrey V. Krayev ,  Vladimir V. Zhishimontov ,  Vasily V. Gavrilyuk ,  Leonid N. Grigorov ,  Alexey V. Belyaev ,  Dmitry A. Evplov

IPC分类号： G01Q30/02 ,  G01Q20/00 ,  G01Q10/00

CPC分类号： G01Q30/02 ,  G01Q10/00 ,  G01Q20/00 ,  G01Q30/025 ,  G01Q60/06

摘要： Aspects of the present invention include systems and devices useful for surface chemical analysis of solid samples by Tip Enhanced Raman Spectrometry (“TERS”), and particularly it relates to devices useful for chemical analysis of molecular compounds located either on or within thin surface layer of solid samples. Even more particularly, aspects of the present invention relate to systems, and devices for non-destructive analysis combining both high sensitivity and high spatial resolution of analysis of chemical compounds located or distributed on the surface of solid samples with obtaining important information regarding vibration spectra of atoms and molecular groups contained in a thin surface layer of solid samples. These objectives are realized by implementation of computer-assisted systems that use sensors to carefully regulate the motion of, and force applied to, probes of atomic force microscopes.

公开(公告)号：US09645182B2

公开(公告)日：2017-05-09

申请号：US14055195

申请日：2013-10-16

申请人： Whirlpool Corporation

发明人： Mark L. Herman ,  Garry L. Peterman ,  Daniel M. Putnam

IPC分类号： G01R31/00 ,  G01R29/12 ,  H05B6/62 ,  G01R1/00 ,  G05F1/00 ,  G01Q10/00

CPC分类号： G01R29/0857 ,  D06F58/02 ,  D06F58/266 ,  G01Q10/00 ,  G01R1/00 ,  G01R29/12 ,  G05F1/00 ,  G08B7/06 ,  G08B21/18 ,  H05B6/62

摘要： A method for detecting the presence of an energized e-field in a space, wherein the space includes at least one electrically conductive element disposed in the space and coupled with a controller, the method including receiving in the controller a signal from the at least one electrically conductive element, comparing the value to a threshold, and if the value exceeds the threshold, determining that an energized e-field occupies the space, and sending a signal from the controller indicative of the presence of the energized e-field in the space.

公开(公告)号：US09519005B2

公开(公告)日：2016-12-13

申请号：US14862538

申请日：2015-09-23

申请人： OLYMPUS CORPORATION

发明人： Nobuaki Sakai

IPC分类号： G01Q10/00 ,  G01Q20/02 ,  G01Q10/04 ,  G01Q30/02

CPC分类号： G01Q10/00 ,  G01Q10/04 ,  G01Q20/02 ,  G01Q30/025

摘要： A scanning mechanism includes a cantilever, an XY movable portion movable in X and Y directions parallel to an X-Y plane, an XY actuator to scan the XY movable portion in the X and Y directions, a Z actuator to scan the cantilever in a Z direction perpendicular to the X-Y plane, and a light condensing portion to cause light for detecting a displacement of the cantilever to enter the cantilever. The Z actuator and the light condensing portion are held by the XY movable portion and arranged side by side in projection to the X-Y plane.