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公开(公告)号:US20250015614A1
公开(公告)日:2025-01-09
申请号:US18894219
申请日:2024-09-24
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Kei TAKAHASHI , Yuki OKAMOTO , Minato ITO , Takahiko ISHIZU , Hiroki INOUE , Shunpei YAMAZAKI
IPC: H02J7/00 , H01M10/42 , H01M10/44 , H03K3/0231 , H03K17/082
Abstract: A semiconductor device with reduced power consumption is provided. The semiconductor device includes a node ND1, a node ND2, a resistor, a capacitor, and a comparison circuit. The resistor is electrically connected in series between one of a positive electrode and a negative electrode of a secondary battery and a first terminal. The resistor has a function of converting current flowing between the one of the positive electrode and the negative electrode of the secondary battery and the first terminal into a first voltage. The first voltage is added to a voltage of the node ND2 through the capacitor. The comparison circuit has a function of comparing a voltage of the node ND1 and the voltage of the node ND2. The comparison circuit outputs a signal that notifies detection of overcurrent when the voltage of the node ND2 is higher than the voltage of the node ND1.
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公开(公告)号:US20250014534A1
公开(公告)日:2025-01-09
申请号:US18885890
申请日:2024-09-16
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Atsushi UMEZAKI , Hajime KIMURA
IPC: G09G3/36 , G02F1/133 , G02F1/1362 , G11C19/28 , H01L27/088 , H01L27/12 , H01L29/423 , H01L29/786
Abstract: A transistor whose channel region includes an oxide semiconductor is used as a pull down transistor. The band gap of the oxide semiconductor is 2.0 eV or more, preferably 2.5 eV or more, more preferably 3.0 eV or more. Thus, hot carrier degradation in the transistor can be suppressed. Accordingly, the circuit size of the semiconductor device including the pull down transistor can be made small. Further, a gate of a pull up transistor is made to be in a floating state by switching of on/off of the transistor whose channel region includes an oxide semiconductor. Note that when the oxide semiconductor is highly purified, the off-state current of the transistor can be 1 aA/μm (1×10−18 A/μm) or less. Therefore, the drive capability of the semiconductor device can be improved.
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公开(公告)号:US20250014531A1
公开(公告)日:2025-01-09
申请号:US18892704
申请日:2024-09-23
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Hajime KIMURA , Atsushi UMEZAKI
Abstract: A semiconductor device where delay or distortion of a signal output to a gate signal line in a selection period is reduced is provided. The semiconductor device includes a gate signal line, a first and second gate driver circuits which output a selection signal and a non-selection signal to the gate signal line, and pixels electrically connected to the gate signal line and supplied with the two signals. In a period during which the gate signal line is selected, both the first and second gate driver circuits output the selection signal to the gate signal line. In a period during which the gate signal line is not selected, one of the first and second gate driver circuits outputs the non-selection signal to the gate signal line, and the other gate driver circuit outputs neither the selection signal nor the non-selection signal to the gate signal line.
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公开(公告)号:US20250014530A1
公开(公告)日:2025-01-09
申请号:US18888227
申请日:2024-09-18
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Hajime KIMURA
IPC: G09G3/36 , G02F1/1335 , G02F1/1362 , G02F1/1368 , H01L21/02 , H01L21/027 , H01L21/465 , H01L21/4763 , H01L21/67 , H01L27/12 , H01L29/24 , H01L29/66 , H01L29/786
Abstract: A display device that is suitable for increasing in size is achieved. Three or more source lines are provided for each pixel column. Video signals having the same polarity are input to adjacent source lines during one frame period. Dot inversion driving is used to reduce a flicker, crosstalk, or the like.
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公开(公告)号:US20250010809A1
公开(公告)日:2025-01-09
申请号:US18894169
申请日:2024-09-24
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei YAMAZAKI , Takayuki IKEDA , Yoshiyuki KUROKAWA
IPC: B60R21/0134 , B60R21/00 , B60R21/01 , B60R21/013 , G06V20/56
Abstract: An occupant protection device which can protect an occupant without delay is provided. An image taken by an imaging device is analyzed to judge whether there is an object approaching the subject car. In the case where a collision between the object and the subject car is judged to be inevitable, an airbag device is activated before the collision, whereby the occupant can be protected without delay. By using selenium for a light-receiving element of the imaging device, an accurate image can be obtained even under low illuminance. Imaging in a global shutter system leads to an accurate image with little distortion. This enables more accurate image analysis.
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公开(公告)号:US12193244B2
公开(公告)日:2025-01-07
申请号:US17891248
申请日:2022-08-19
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Yutaka Shionoiri , Hiroyuki Miyake , Kiyoshi Kato
Abstract: It is an object to provide a memory device whose power consumption can be suppressed and a semiconductor device including the memory device. As a switching element for holding electric charge accumulated in a transistor which functions as a memory element, a transistor including an oxide semiconductor film as an active layer is provided for each memory cell in the memory device. The transistor which is used as a memory element has a first gate electrode, a second gate electrode, a semiconductor film located between the first gate electrode and the second gate electrode, a first insulating film located between the first gate electrode and the semiconductor film, a second insulating film located between the second gate electrode and the semiconductor film, and a source electrode and a drain electrode in contact with the semiconductor film.
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公开(公告)号:US12193236B2
公开(公告)日:2025-01-07
申请号:US17772280
申请日:2020-11-13
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hitoshi Kunitake , Satoru Ohshita , Kazuki Tsuda , Tatsuya Onuki
Abstract: A memory device with a small number of wirings using a NAND flash memory having a three-dimensional structure with a large number of stacked memory cell layers is provided. A decoder is formed using an OS transistor. An OS transistor can be formed by a method such as a thin film method, whereby the decoder can be provided to be stacked above the NAND flash memory having a three-dimensional structure. This can reduce the number of wirings provided substantially perpendicular to the memory cell layers.
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公开(公告)号:US20250008832A1
公开(公告)日:2025-01-02
申请号:US18704411
申请日:2022-10-17
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hayato YAMAWAKI , Sachiko KAWAKAMI , Naoaki HASHIMOTO , Eriko AOYAMA , Yasuhiro NIIKURA
Abstract: A method for removing oxygen from an oxygen adduct of anthracene, which is generated by irradiation with ultraviolet rays, is provided. Alternatively a method for manufacturing an electronic device or a display device with favorable reliability is provided. A method for manufacturing an electronic device, including a step of irradiating a layer including an organic compound including an anthracene structure with ultraviolet rays at an energy density higher than or equal to 1 mJ/cm2 and lower than or equal to 1000 mJ/cm2 in an atmosphere where oxygen exists and a step of performing heating at a temperature higher than or equal to 80° C. in an atmosphere with an oxygen concentration lower than or equal to 300 ppm is provided.
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公开(公告)号:US20250008818A1
公开(公告)日:2025-01-02
申请号:US18711284
申请日:2022-11-21
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Yukinori SHIMA , Kenichi OKAZAKI , Masataka NAKADA , Yasutaka NAKAZAWA , Naoto GOTO , Saki EGUCHI , Sachiko KATANIWA
Abstract: A display apparatus with extremely high resolution is provided. A display apparatus with high display quality is provided. The display apparatus includes a first light-emitting element and a second light-emitting element over a first insulating layer, a second insulating layer, and a third insulating layer. The first light-emitting element includes a first pixel electrode and a first organic layer. The second light-emitting element includes a second pixel electrode and a second organic layer. The first insulating layer includes a groove-like region provided along a side of the first pixel electrode in a plan view. The groove-like region includes a first region overlapping with the first pixel electrode and a second region overlapping with the second pixel electrode. The first region and the second region each have a width greater than or equal to 20 nm and less than or equal to 500 nm. The second insulating layer includes a region in contact with a top surface of the first organic layer, a region in contact with a side surface of the first organic layer, and a region located below the first pixel electrode. The third insulating layer includes a region in contact with a top surface of the second organic layer, a region in contact with a side surface of the second organic layer, and a region located below the second pixel electrode.
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公开(公告)号:US20250008721A1
公开(公告)日:2025-01-02
申请号:US18706096
申请日:2022-10-21
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Shunpei YAMAZAKI , Hitoshi KUNITAKE , Rihito WADA , Kiyoshi KATO , Tatsuya ONUKI
IPC: H10B12/00
Abstract: A small semiconductor device is provided. The semiconductor device includes a first layer and a second layer over the first layer. The first layer includes a p-channel first transistor containing silicon in a channel formation region. The second layer includes an n-channel second transistor containing a metal oxide in a channel formation region. The first transistor and the second transistor form a CMOS circuit. A channel length of the first transistor is longer than a channel length of the second transistor.
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