Abstract:
Embodiments relate to a Floating Body Dynamic Random Access Memory (FBDRAM). The FBDRAM utilizes a purge line to reset a FBDRAM cell, prior to writing data to the FBDRAM cell.
Abstract:
Some embodiments provide a memory cell comprising a body region doped with charge carriers of a first type, a source region disposed in the body region and doped with charge carriers of a second type, and a drain region disposed in the body region and doped with charge carriers of the second type. According to some embodiments, the body region, the source region, and the drain region are oriented in a first direction, the body region and the source region form a first junction, and the body region and the drain region form a second junction. Moreover, a conductivity of the first junction from the body region to the source region in a case that the first junction is unbiased is substantially less than a conductivity of the second junction from the body region to the drain region in a case that the second junction is unbiased. Some embodiments further include a transistor oriented in a second direction, wherein the second direction is not parallel to the first direction.
Abstract:
A resonance suppression circuit is provided to suppress resonance on a power grid of a chip or die. The resonance suppression circuit may include a band-pass filter portion, a comparator portion, an amplification portion and a current dissipation portion. The band-pass filter portion may include an inverter coupled between two signal lines of the power grid. The comparator portion may sense voltage fluctuations at approximately the resonance frequency and trigger the current dissipation portion to turn ON and thereby change the frequency spectrum of the load current on the power grid to suppress the power grid resonance.
Abstract:
A method and apparatus for providing a weak inversion mode metal-oxide-semiconductor (MOS) decoupling capacitor is described. In one embodiment, an enhancement-mode p-channel MOS (PMOS) transistor is constructed with a gate material whose work function differs from that commonly used. In one exemplary embodiment, platinum silicate (PtSi) is used. In alternate embodiments, the threshold voltage of the PMOS transistor may be changed by modifying the dopant levels of the substrate. In either embodiment the flat band magnitude of the transistor is shifted by the change in materials used to construct the transistor. When such a transistor is connected with the gate lead connected to the positive supply voltage and the other leads connected to the negative (ground) supply voltage, an improved decoupling capacitor results.
Abstract:
An apparatus is described having a plurality of storage cells coupled between a first bit line and a second bit line. The apparatus also has a first transistor that pre-charges the first bit line and provides a first supply of current for one or more leakage currents drawn from the first bit line by any of the plurality of storage cells. The apparatus also has a second transistor that pre-charges the second bit line and provides a second supply of current for one or more leakage currents drawn from the second bit line by any of the plurality of storage cells.
Abstract:
A circuit is provided having a differential difference amplifier (DDA) having first and second inputs to receive a desired body bias signal, and a third input to receive a supply voltage, the DDA configured to generate an intermediate output signal, the intermediate output signal coupled to an output buffer generating an output signal having a desired gain, the DDA having a fourth input, to cause the output signal to reference to variations in the supply voltage.
Abstract:
A logic unit and method incorporating body biasing using scan chains, the logic unit comprising a functional unit block including a body and a scan chain, and a variable voltage source coupled to the scan chain to receive control signals from the scan chain and coupled to the body to provide a bias voltage to the body, and the method comprising identifying a preferred body bias voltage for a functional unit block having a body; and permanently programming a plurality of control signals coupled to a variable voltage source that provides the preferred body bias voltage to the body.
Abstract:
An eight-cell for static random access memory, the memory cell comprising cross-coupled inverters to store the information bit, two access nMOSFETs connected to local bit lines to access the stored information bit, and two nMOSFETs each having a gate connected to ground and coupled to the local bit lines and the cross-coupled inverters so that sub-threshold leakage currents to and from the local bit lines for a memory cell not being read are balanced.
Abstract:
A domino logic circuit is provided. The circuit includes an n-channel clock transistor coupled between a dynamic output node and a high voltage connection, the gate of the clock transistor further coupled to receive an inverse clock signal. A first inverter has an input connected to the dynamic output node. A second inverter with an input connected to the dynamic output node comprises a static CMOS circuit stage which serves as an output receiver circuit, the output of which is the output of the domino logic circuit. An n-channel level keeper transistor is connected between the dynamic output node and the high voltage connection, and the gate of the level keeper transistor is connected to the output of the first inverter. A pull-down circuit is connected between the dynamic output node and a low-voltage connection. An output predischarge transistor is connected between the output of the static CMOS circuit and the low voltage connection, and is coupled to and controlled by a clock signal at its gate.
Abstract:
An apparatus is described having a plurality of storage cells coupled between a first bit line and a second bit line. The apparatus also has a first transistor that pre-charges the first bit line and provides a first supply of current for one or more leakage currents drawn from the first bit line by any of the plurality of storage cells. The apparatus also has a second transistor that pre-charges the second bit line and provides a second supply of current for one or more leakage currents drawn from the second bit line by any of the plurality of storage cells.