公开(公告)号：US20210035643A1

公开(公告)日：2021-02-04

申请号：US17075691

申请日：2020-10-20

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Anh Ly ,  Thuan Vu ,  Kha Nguyen ,  Hien Pham ,  Stanley Hong ,  Stephen T. Trinh

IPC: G11C16/14 ,  H02M3/07 ,  G11C16/30

Abstract: Numerous embodiments of an improved charge pump design are disclosed for generating the high voltages necessary to perform erase and program operations in non-volatile flash memory devices. In these embodiments, each boost stage in the charge pump is modified to overcome a deficiency in prior art charge pumps whereby voltage actually would decrease in the final boost stage. These modifications include the addition of one or more of a clock doubling circuit, a local self-precharge circuit, a feed-forward precharge circuit, a feed-backward precharge circuit, and a hybrid circuit comprising NMOS and PMOS transistors and diodes.

公开(公告)号：US10910061B2

公开(公告)日：2021-02-02

申请号：US15990395

申请日：2018-05-25

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Vipin Tiwari ,  Nhan Do ,  Mark Reiten

IPC: G11C16/04 ,  G11C16/10 ,  G11C16/16 ,  G06N3/063

Abstract: Numerous embodiments of programming systems and methods for use with a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. Selected cells thereby can be programmed with extreme precision to hold one of N different values.

公开(公告)号：US20210020255A1

公开(公告)日：2021-01-21

申请号：US16569611

申请日：2019-09-12

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Anh Ly ,  Steven Lemke ,  Nha Nguyen ,  Vipin Tiwari ,  Nhan Do

IPC: G11C16/34 ,  G11C16/10 ,  G06N3/08 ,  G06F3/06 ,  G06N3/063

Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. The analog neural memory comprises one or more arrays of non-volatile memory cells. The testing circuitry and methods can be utilized during sort tests, qualification tests, and other tests to verify programming operations of one or more cells.

公开(公告)号：US20210019608A1

公开(公告)日：2021-01-21

申请号：US16569647

申请日：2019-09-12

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Anh Ly ,  Steven Lemke ,  Nha Nguyen ,  Vipin Tiwari ,  Nhan Do

IPC: G06N3/063 ,  G06N3/04 ,  G11C16/04 ,  G11C16/10 ,  G11C16/34

Abstract: Testing circuitry and methods are disclosed for use with analog neural memory in deep learning artificial neural networks. The analog neural memory comprises one or more arrays of non-volatile memory cells. The testing circuitry and methods can be utilized during sort tests, qualification tests, and other tests to verify programming operations of one or more cells.

公开(公告)号：US10896368B2

公开(公告)日：2021-01-19

申请号：US16746837

申请日：2020-01-18

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stanley Hong ,  Anh Ly

IPC: G06F17/16 ,  G06N3/04 ,  G06N3/063 ,  G11C16/04 ,  G11C16/10 ,  G11C16/34 ,  G11C16/14 ,  G11C16/30 ,  G11C16/08 ,  G06N3/08

Abstract: Numerous embodiments are disclosed for an analog neuromorphic memory system for use in a deep learning neural network. In one embodiment, the analog neuromorphic memory system comprises a plurality of vector-by-matrix multiplication systems, each vector-by-matrix multiplication system comprising an array of memory cells, a low voltage row decoder, a high voltage row decoder, and a low voltage column decoder; a plurality of output blocks, each output block providing an output in response to at least one of the plurality of vector-by-matrix multiplication systems; and a shared verify block configured to concurrently perform a verify operation after a program operation on two or more of the plurality of vector-by-matrix systems.

公开(公告)号：US20210005725A1

公开(公告)日：2021-01-07

申请号：US16868143

申请日：2020-05-06

Applicant: Silicon Storage Technology, Inc.

Inventor： Leo XING ,  Chunming WANG ,  Guo Yong LIU ,  Melvin DIAO ,  Xian LIU ,  Nhan DO

IPC: H01L21/28 ,  H01L27/11521 ,  H01L27/11531 ,  H01L29/423 ,  H01L29/788 ,  H01L29/66 ,  H01L21/02 ,  H01L21/3213 ,  H01L21/265

Abstract: A method of forming a memory device includes forming a second insulation layer on a first conductive layer formed on a first insulation layer formed on semiconductor substrate. A trench is formed into the second insulation layer extending down and exposing a portion of the first conductive layer, which is etched or oxidized to have a concave upper surface. Two insulation spacers are formed along sidewalls of the trench, having inner surfaces facing each other and outer surfaces facing away from each other. A source region is formed in the substrate between the insulation spacers. The second insulation layer and portions of the first conductive layer are removed to form floating gates under the insulation spacers. A third insulation layer is formed on side surfaces of the floating gates. Two conductive spacers are formed along the outer surfaces. Drain regions are formed in the substrate adjacent the conductive spacers.

公开(公告)号：US20200349421A1

公开(公告)日：2020-11-05

申请号：US16449201

申请日：2019-06-21

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  STEPHEN TRINH ,  THUAN VU ,  STANLEY HONG ,  VIPIN TIWARI ,  MARK REITEN ,  NHAN DO

IPC: G06N3/063 ,  G11C16/04 ,  G11C11/54 ,  G06F17/16

Abstract: Configurable input blocks and output blocks and physical layouts are disclosed for analog neural memory systems that utilize non-volatile memory cells. An input block can be configured to support different numbers of arrays arranged in a horizontal direction, and an output block can be configured to support different numbers of arrays arranged in a vertical direction. Adjustable components are disclosed for use in the configurable input blocks and output blocks.

公开(公告)号：US20200286569A1

公开(公告)日：2020-09-10

申请号：US16879663

申请日：2020-05-20

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Anh Ly ,  Thuan Vu

IPC: G11C16/34 ,  G11C16/04 ,  G11C16/10 ,  G11C16/08 ,  G11C16/16 ,  G11C16/28

Abstract: The present invention relates to a flash memory cell with only four terminals and a high voltage row decoder for operating an array of such flash memory cells. The invention allows for fewer terminals for each flash memory cell compared to the prior art, which results in a simplification of the decoder circuitry and overall die space required per flash memory cells. The invention also provides for the use of high voltages on one or more of the four terminals to allow for read, erase, and programming operations despite the lower number of terminals compared to prior art flash memory cells.

公开(公告)号：US10755779B2

公开(公告)日：2020-08-25

申请号：US15701071

申请日：2017-09-11

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Anh Ly ,  Thuan Vu ,  Stanley Hong ,  Feng Zhou ,  Xian Liu ,  Nhan Do

IPC: G11C13/00 ,  H01L45/00 ,  H01L27/24 ,  G11C7/06

Abstract: Various architectures and layouts for an array of resistive random access memory (RRAM) cells are disclosed. The RRAM cells are organized into rows and columns, with each cell comprising a top electrode, a bottom electrode, and a switching layer. Circuitry is included for improving the reading and writing of the array, including the addition of a plurality of columns of dummy RRAM cells in the array used as a ground source, connecting source lines to multiple pairs of rows of RRAM cells, and the addition of rows of isolation transistors.

公开(公告)号：US10741265B2

公开(公告)日：2020-08-11

申请号：US15924100

申请日：2018-03-16

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Anh Ly ,  Thuan Vu

IPC: G11C16/34 ,  G11C16/04 ,  G11C16/10 ,  G11C16/08 ,  G11C16/16 ,  G11C16/28

Abstract: The present invention relates to a flash memory cell with only four terminals and decoder circuitry for operating an array of such flash memory cells. The invention allows for fewer terminals for each flash memory cell compared to the prior art, which results in a simplification of the decoder circuitry and overall die space required per flash memory cells. The invention also provides for the use of high voltages on one or more of the four terminals to allow for read, erase, and programming operations despite the lower number of terminals compared to prior art flash memory cells.