公开(公告)号：US20130281647A1

公开(公告)日：2013-10-24

申请号：US13454216

申请日：2012-04-24

Applicant: Chang-Lun Lee ,  Chih-Sheng Cheng ,  Shu-Fen Chen ,  Tsung-Shan Ho

Inventor： Chang-Lun Lee ,  Chih-Sheng Cheng ,  Shu-Fen Chen ,  Tsung-Shan Ho

IPC: C08F230/08 ,  B82Y40/00 ,  B82Y30/00

CPC classification number: C08L67/06 ,  B82Y30/00

Abstract: A method is used to make a nanometer enhanced thermo-durable thermosetting polyester material. The method includes the steps of providing prepolymeric viscous liquid and curing the prepolymeric viscous liquid. The prepolymeric viscous liquid includes: a polyester prepolymer that includes an unsaturated vinyl group of low molecular weight, a functional polyester oligomer that includes an unsaturated vinyl group, a polyester prepolymer that includes an unsaturated vinyl group associated with layered silicates, and a polymerizable monomer that includes a vinyl group. To cure the prepolymeric viscous liquid, a catalyst and an accelerator are used. Thus, there is provided a highly cross-linked three-dimensional thermosetting polyester/layered silicate nanometer material.

Abstract translation: 使用一种制备纳米增强耐热热固性聚酯材料的方法。 该方法包括提供预聚物粘稠液体并固化预聚物粘稠液体的步骤。 预聚性粘稠液体包括：包含低分子量的不饱和乙烯基的聚酯预聚物，包含不饱和乙烯基的官能聚酯低聚物，包含与层状硅酸盐相关的不饱和乙烯基的聚酯预聚物和可聚合单体， 包括乙烯基。 为了固化预聚物粘稠液体，使用催化剂和促进剂。 因此，提供了高度交联的三维热固性聚酯/层状硅酸盐纳米材料。

公开(公告)号：US20130191047A1

公开(公告)日：2013-07-25

申请号：US13354547

申请日：2012-01-20

Applicant: Fen CHEN ,  Roger A. DUFRESNE ,  Timothy D. SULLIVAN ,  Yanfeng WANG

Inventor： Fen CHEN ,  Roger A. DUFRESNE ,  Timothy D. SULLIVAN ,  Yanfeng WANG

IPC: G01R31/26 ,  G06F19/00

CPC classification number: H01L22/34 ,  H01L22/12 ,  H01L2924/00 ,  H01L2924/0002

Abstract: An on-chip poly-to-contact process monitoring and reliability evaluation system and method of use are provided. A method includes determining a breakdown electrical field of each of one or more shallow trench isolation (STI) measurement structures corresponding to respective one or more original semiconductor structures. The method further includes determining a breakdown voltage of each of one or more substrate measurement structures corresponding to the respective one or more original semiconductor structures. The method further includes determining a space between a gate and a contact of each of the one or more original semiconductor structures based on the determined breakdown electrical field and the determined breakdown voltage.

Abstract translation: 提供片上多点接触式过程监测和可靠性评估系统及其使用方法。 一种方法包括确定与相应的一个或多个原始半导体结构相对应的一个或多个浅沟槽隔离（STI）测量结构中的每一个的击穿电场。 该方法还包括确定与相应的一个或多个原始半导体结构相对应的一个或多个衬底测量结构中的每一个的击穿电压。 该方法还包括基于所确定的击穿电场和所确定的击穿电压来确定一个或多个原始半导体结构中的每一个的栅极和触点之间的空间。

公开(公告)号：US08458797B1

公开(公告)日：2013-06-04

申请号：US10811501

申请日：2004-03-25

Applicant: Kai Yu ,  Chih-Ming Chen ,  Yi-Fen Chen

Inventor： Kai Yu ,  Chih-Ming Chen ,  Yi-Fen Chen

IPC: G06F11/00 ,  G06F12/14 ,  G06F12/16 ,  G08B23/00

CPC classification number: G06F21/566

Abstract: In one embodiment, an antivirus mechanism (e.g., antivirus program) in a computer initiates shielding procedures in response to a triggering event indicative of a presence of a virus in the computer, the virus being of a type not recognized by the antivirus program. The shielding procedures advantageously protect important components of the computer while the antivirus program does not have the requisite antidote to directly deal with the virus.

Abstract translation: 在一个实施例中，计算机中的防病毒机制（例如，防病毒程序）响应于指示计算机中存在病毒的触发事件来启动屏蔽过程，该病毒是防病毒程序未识别的类型。 屏蔽程序有利地保护计算机的重要组件，而防病毒程序没有必要的解决方案来直接处理病毒。

公开(公告)号：US20130038334A1

公开(公告)日：2013-02-14

申请号：US13207485

申请日：2011-08-11

Applicant: David G. Brochu, JR. ,  Fen Chen ,  Roger A. Dufresne ,  Travis S. Merrill ,  Michael A. Shinosky

Inventor： David G. Brochu, JR. ,  Fen Chen ,  Roger A. Dufresne ,  Travis S. Merrill ,  Michael A. Shinosky

IPC: G01R31/02

CPC classification number: G01R31/2858

Abstract: Test structures for simultaneously testing for electromigration or stress migration fails and time dependent dielectric breakdown fails in integrated circuits, test circuits using four test structures arranged as a bridge balance circuit and methods of testing using the test circuits. The electromigration or stress migration portions of the test structures include via chains of wire segments connected in series by electrically conductive vias, the wire segments formed in at least two adjacent wiring levels of an integrated circuit. The time dependent dielectric breakdown portions of the test structures include digitized wire structures in one of the at least two adjacent wiring levels adjacent to a less than whole portion of the wire segments in the same wiring level as the digitized wire structures.

Abstract translation: 用于同时测试电迁移或应力迁移的测试结构在集成电路中的时间依赖介质击穿失效，使用布置为桥接平衡电路的四个测试结构的测试电路和使用测试电路的测试方法。 测试结构的电迁移或应力迁移部分包括通过导电通孔串联连接的导线段的通孔链，形成在集成电路的至少两个相邻布线层中的线段。 测试结构的时间依赖介质击穿部分包括在与数字化的线结构相同的布线级别中与所述线段的少于整个部分相邻的所述至少两个相邻布线层之一中的数字化线结构。

公开(公告)号：US08359651B1

公开(公告)日：2013-01-22

申请号：US12121014

申请日：2008-05-15

Applicant: Handong Wu ,  Alendry Ivan Macalintal ,  Andrew Kyle Purtell ,  Andrew Lee ,  Chenghuai Lu ,  Feike Hayo Hacquebord ,  Yi-Fen Chen ,  Raimund Alexander Genes

Inventor： Handong Wu ,  Alendry Ivan Macalintal ,  Andrew Kyle Purtell ,  Andrew Lee ,  Chenghuai Lu ,  Feike Hayo Hacquebord ,  Yi-Fen Chen ,  Raimund Alexander Genes

IPC: G06F11/00 ,  G06F12/14

CPC classification number: G06F17/30867 ,  G06F21/56 ,  G06F2221/2119 ,  H04L63/145

Abstract: A web threat protection system may receive candidate uniform resource locators (URLs) from several URL sources. The candidate URLs may be received in a submission database. At least a portion of the candidate URLs is selected for further investigation by sending crawlers to retrieve objects from the selected URLs. The retrieved objects may be analyzed to determine whether they are malicious or good (i.e., not malicious). The result of the analysis may be used to build a security states database that includes security information of the selected URLs. Good URLs may be included in a safe URL sphere, which may be used to navigate to good websites on the Internet.

Abstract translation: 网络威胁防护系统可以从多个URL源接收候选统一资源定位符（URL）。 可以在提交数据库中接收候选URL。 通过发送抓取工具从所选URL中检索对象，选择至少一部分候选URL进行进一步调查。 可以分析检索到的对象以确定它们是恶意的还是好的（即，不是恶意的）。 分析结果可用于构建包含所选URL的安全信息的安全状态数据库。 良好的网址可能会包含在安全的网域中，可用于浏览互联网上的好网站。

公开(公告)号：US20120287707A1

公开(公告)日：2012-11-15

申请号：US13558541

申请日：2012-07-26

Applicant: Fen Chen ,  Richard Steven Kontra ,  Tom C. Lee ,  Theodore M. Levin ,  Christopher David Muzzy ,  Timothy Dooling Sullivan

Inventor： Fen Chen ,  Richard Steven Kontra ,  Tom C. Lee ,  Theodore M. Levin ,  Christopher David Muzzy ,  Timothy Dooling Sullivan

IPC: G11C11/00 ,  H01L45/00

CPC classification number: G11C13/0009 ,  G11C13/0004 ,  G11C13/004 ,  G11C13/04 ,  G11C13/047 ,  G11C2013/0054 ,  H01L45/1213 ,  H01L45/145

Abstract: A structure. The structure includes a substrate, a resistive/reflective region on the substrate, and a light source/light detecting and/or a sens-amp circuit configured to ascertain a reflectance and/or resistance change in the resistive/reflective region. The resistive/reflective region includes a material having a characteristic of the material's reflectance and/or resistance being changed due to a phase change in the material. The resistive/reflective region is configured to respond, to an electric current through the resistive/reflective region and/or a laser beam projected on the resistive/reflective region, by the phase change in the material which causes a reflectance and/resistance change in the resistive/reflective region from a first reflectance and/or resistance value to a second reflectance and/or resistance value different from the first reflectance and/or resistance value.

Abstract translation: 一个结构。 该结构包括衬底，衬底上的电阻/反射区域以及被配置为确定电阻/反射区域中的反射率和/或电阻变化的光源/光检测和/或感测放大器电路。 电阻/反射区域包括具有材料的反射率和/或电阻的特性的材料由于材料的相变而改变。 电阻/反射区域被配置为通过材料的相变来响应通过电阻/反射区域的电流和/或投射在电阻/反射区域上的激光束，这导致反射和/ 电阻/反射区域从第一反射率和/或电阻值到不同于第一反射率和/或电阻值的第二反射率和/或电阻值。

公开(公告)号：US20120261724A1

公开(公告)日：2012-10-18

申请号：US13529557

申请日：2012-06-21

Applicant: Fen Chen ,  Douglas D. Coolbaugh ,  Baozhen Li

Inventor： Fen Chen ,  Douglas D. Coolbaugh ,  Baozhen Li

IPC: H01L23/52 ,  H01L21/326

CPC classification number: H01L27/101 ,  H01L23/5252 ,  H01L23/5256 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A programmable passive device comprising a first node and a second node. A plurality of passive device elements electrically coupled to the first node. A plurality of switches are electrically coupled to at least the second node and selectively coupled to a number of the plurality of passive device elements to provide the programmable passive device with a pre-determined value.

Abstract translation: 一种包括第一节点和第二节点的可编程无源设备。 电耦合到第一节点的多个无源器件元件。 多个开关电耦合到至少第二节点并且选择性地耦合到多个无源器件元件，以向可编程无源器件提供预定值。

公开(公告)号：US08237463B1

公开(公告)日：2012-08-07

申请号：US13034758

申请日：2011-02-25

Applicant: Fen Chen ,  Kai D. Feng ,  Zhong-Xiang He

Inventor： Fen Chen ,  Kai D. Feng ,  Zhong-Xiang He

IPC: H03K19/003

CPC classification number: H03K19/00307

Abstract: Managing reliability of a circuit that includes a plurality of duplicate components, with less than all of the components being active at any time during circuit operation, where reliability is managed by operating, by the circuit, with a first set of components that includes a predefined number of components; selecting, without altering circuit performance and in accordance with a circuit reliability protocol, a second set of components with which to operate, including activating an inactive component and deactivating an active component of the first set of components; and operating, by the circuit, with the second set of components.

Abstract translation: 管理包括多个重复部件的电路的可靠性，其中小于所有组件在电路操作期间的任何时间处于活动状态，其中可靠性由电路通过第一组组件来管理，该组件包括预定义的 组件数量; 根据电路可靠性协议选择不改变电路性能的第二组组件，包括激活非活动组件和去激活第一组组件的活动组件; 并通过电路与第二组元件一起操作。

公开(公告)号：US20120134608A1

公开(公告)日：2012-05-31

申请号：US13360810

申请日：2012-01-30

Applicant: MING-CHE HSU ,  Lih-Fen CHEN

Inventor： MING-CHE HSU ,  Lih-Fen CHEN

IPC: F16C29/06

CPC classification number: F16C29/06 ,  F16C33/3825 ,  F16C33/3831 ,  F16C33/4611 ,  F16C33/506 ,  F16C2220/04

Abstract: A rolling element retainer chain provides a row of rolling elements smooth running in a recirculation passage and keeps a predetermined spacing distance between two adjacent rolling elements and the rolling elements be separated without contact to each other; the rolling element retainer chain comprises at least one thin flexible metal strip having a row of longitudinal arranged holes; a row of cross arranged latten between holes are formed thereof; and a number of spacers, incorporated on the cross arranged latten; the strength of the flexible metal strip is much higher than that of the resin materials conventionally used and can endure higher tension without broken, and thus a longer operating duration can therefore be achieved; both ends on the flexible metal strip can be overlapped wholly fixed without interference because of thinner thickness thereof, and a close loop rolling element retainer chain is formed thereof.

Abstract translation: 滚动元件保持链提供一排在循环通道中平滑运行的滚动元件，并且在两个相邻的滚动元件之间保持预定的间隔距离，并且滚动元件被分离而彼此不接触; 滚动元件保持链包括至少一个具有一排纵向排列孔的薄柔性金属条; 形成一排排列在孔之间的交叉排列的拉杆; 和多个间隔物，并列在十字架上布置的拉杆; 柔性金属带的强度比常规使用的树脂材料的强度高得多，并且可以承受更高的张力而不破裂，因此可以实现更长的操作持续时间; 柔性金属带上的两端可以由于厚度较薄而完全固定而没有干涉，并且形成闭环滚动体保持链。

公开(公告)号：US08013748B2

公开(公告)日：2011-09-06

申请号：US12327218

申请日：2008-12-03

Applicant: Chi-Fen Chen ,  Jen Jui Cheng

Inventor： Chi-Fen Chen ,  Jen Jui Cheng

IPC: G08B17/00 ,  G06F19/00 ,  G01N21/00

CPC classification number: H01L21/67248

Abstract: A method for monitoring the temperature and slope of a wafer is presented, and the steps of the method comprises: (a) providing a cooling machine, a monitoring system, a sensing module, and a wafer; (b) cooling the wafer by the cooling machine; (c) sensing all regions of the wafer by the sensing module, and detecting the temperature and slope of the wafer relative to the cooling machine; (d) if the wafer's temperature is higher than a set temperature, the monitoring system outputs a first alarm signal, if the wafer's slope is greater than a set slope, the monitoring system outputs a second alarm signal.

Abstract translation: 提出了一种用于监测晶片的温度和斜率的方法，该方法的步骤包括：（a）提供冷却机，监测系统，感测模块和晶片; （b）通过冷却机冷却晶片; （c）通过感测模块感测晶片的所有区域，以及检测晶片相对于冷却机的温度和斜率; （d）如果晶片的温度高于设定温度，则监视系统输出第一报警信号，如果晶片的斜率大于设定的斜率，则监视系统输出第二报警信号。