Abstract:
A method of processing material of device elements by laser interaction is disclosed. According to one aspect, the method includes generating a pulsed laser processing output along a laser beam axis, the output including a plurality of laser pulses triggered sequentially at times determined by a pulse repetition rate. A trajectory relative to locations of device elements to be processed is generated. A position of one or more designated device elements relative to an intercept point position on the trajectory at one or more laser pulse times is determined, and a laser beam is deflected based on the predicted position within a predetermined deflection range. According to some aspects, the predetermined deflection range may correspond to a compass rose or cruciform field shape. As a result, a deflection accuracy for laser processing may be improved.
Abstract:
Electrophotographic print system, comprising a photosensitive medium, and a laser array being provided with a plurality of laser diodes arranged to emit light onto the photosensitive medium for varying an electrical potential on a surface of the photosensitive medium, and a plurality of heat dissipation diodes, each heat dissipation diode being arranged in proximity to a corresponding laser diode, wherein each laser diode and the corresponding heat dissipation diode are coupled to a common drive circuit and are arranged in opposite current flow directions with respect to each other, so that in use the current flows either through the laser diode or through the heat dissipation diode depending on the current flow direction in the drive circuit.
Abstract:
A method of, and apparatus for, reducing the visibility of banding artifacts on a printed medium comprising producing synthetic artifacts on the printed medium, overlapping scan lines at swath boundaries and controlling exposure along a scan line to reduce the visibility of the banding artifacts.
Abstract:
An imager comprising a photosensitive surface; a light source which produces at least one scanning light beam; a deflector, arranged to deflect the at least one scanning light beam onto the photosensitive surface; and a sensor which measures the orientation of the deflector. The imager also comprises a controller operative to determine a placement error of said at least one scanning beam on the photosensitive surface, responsive to the orientation measurement by the sensor: and an actuator, responsive to the displacement error, and arranged to change the direction of deflection of the at least one light beam by the deflector. The sensor is configured to measure the orientation of the deflector substantially at a null in a vibrational mode of the deflector.
Abstract:
An imager comprising a photosensitive surface; a light source which produces at least one scaning light beam; a deflector, arranged to deflect the at least one scanning light beam onto the photosensitive surface; and a sensor which measures the orientation of the deflector. The imager also comprises a controller operative to determine a placement error of said at least one scanning beam on the photosensitive surface, responsive to the orientation measurement by the sensor; and an actuator, responsive to the displacement error, and arranged to change the direction of deflection of the at least one light beam by the deflector. The sensor is configured to measure the orientation of the deflector substantially at a null in a vibrational mode of the deflector.
Abstract:
A high-speed method and system for precisely positioning a waist of a material-processing laser beam to dynamically compensate for local variations in height of microstructures located on a plurality of objects spaced apart within a laser-processing site are provided. In the preferred embodiment, the microstructures are a plurality of conductive lines formed on a plurality of memory dice of a semiconductor wafer. The system includes a focusing lens subsystem for focusing a laser beam along an optical axis substantially orthogonal to a plane, an x-y stage for moving the wafer in the plane, and a first air bearing sled for moving the focusing lens subsystem along the optical axis.
Abstract:
Apparatus comprising a two-dimensional array of light sources (40) and a scanning device (26) arranged to scan light (14) emitted from the light sources (40) onto a medium (10) to generate a plurality of scan lines (52) on the medium (10), the light sources (24 and scanning device (26) being arranged such that a plurality of light sources (24) can be used to generate each scan line (52) of the plurality of scan lines (52).
Abstract:
A method and apparatus are provided for evaluating the severity in a printed image of a repeating band print artifact. After electronically capturing the printed image, each of a plurality of patches taken from captured image is analysed to produce an artifact severity measure for the patch; an overall artifact severity value is then determined for the printed image from the patch severity measures. The analysis of each patch involves producing a spatial intensity profile across the patch substantially at right angles to an expected direction of extent of any repeating band print artifact present; a Fourier-related transform is then applied to the spatial intensity profile and the patch artifact severity measure generated by summing the resultant spatial frequency coefficients in a limited range about a frequency of interest.
Abstract:
The present invention relates to the field of laser processing methods and systems, and specifically, to laser processing methods and systems for laser processing multi-material devices. Systems and methods may utilize high speed deflectors to improve processing energy window and/or improve processing speed. In some embodiments, a deflector is used for non-orthogonal scanning of beam spots. In some embodiment, a deflector is used to implement non-synchronous processing of target structures.
Abstract:
Apparatus comprising a two-dimensional array of light sources (40) and a scanning device (26) arranged to scan light (14) emitted from the light sources (40) onto a medium (10) to generate a plurality of scan lines (52) on the medium (10), the light sources (24 and scanning device (26) being arranged such that a plurality of light sources (24) can be used to generate each scan line (52) of the plurality of scan lines (52).