Abstract:
A semiconductor integrated circuit includes: a semiconductor chip; a through-chip via passing through a conductive pattern disposed in the semiconductor chip and cutting the conductive pattern; and an insulation pattern disposed on an outer circumference surface of the through-chip via to insulate the conductive pattern from the through-chip via.
Abstract:
A semiconductor apparatus includes an individual chip designating code setting block configured to generate a plurality of individual chip designating codes which have different code values or at least two of which have the same code value, in response to a plurality of chip fuse signals; and an individual chip activation block configured to compare the plurality of individual chip designating codes with chip selection address in response to the plurality of chip fuse signals, and enable one of a plurality of individual chip activation signals based on a result of the comparison.
Abstract:
A semiconductor integrated circuit includes: a plurality of chips configured to receive an external voltage. Each one of the chips detects a signal delay characteristic of the one of the chips to generate an internal voltage having a level corresponding to the signal delay characteristic.
Abstract:
A core voltage discharger is capable of adjusting an amount of a current discharged according to temperature. The discharger for decreasing a level of a predetermined voltage receives temperature information from an on die thermal sensor and discharges a different amount of current in response to the temperature information.
Abstract:
A semiconductor memory device employs a clamp for preventing latch up. For the purpose, the semiconductor memory device includes a precharging/equalizing unit for precharging and equalizing a pair of bit lines, and a control signal generating unit for producing a control signal which controls enable and disable of the precharging/equalizing unit, wherein the control signal generating unit includes a clamping unit to clamp its source voltage to a voltage level lower than that of its bulk bias.
Abstract:
An inter voltage generation circuit includes a pumping voltage generator to generate a pumping voltage, a level comparator to compare the pumping voltage level with a peripheral voltage level and output an enable signal depending on the comparison result, and a peripheral voltage generator to output a pumping enable signal according to the enable signal and generate a peripheral voltage according to the enable signal.
Abstract:
An internal voltage generating apparatus adaptive to a temperature change includes a reference voltage circuit including a complementary to absolute temperature (CTAT) type transistor and a proportional to absolute temperature (PTAT) type transistor for generating a first to a third initial reference voltage signals. A buffer circuit for buffering a first, a second and a third initial reference voltage signal is included to generate a first, a second, and a third reference voltage signal in response to enable signals. An internal voltage generating circuit is included to generate an internal voltage signal based on the first, the second and the third reference voltage signal by using an inputted power voltage.
Abstract:
An internal voltage generator of a semiconductor integrated circuit includes a first driver that outputs an internal voltage by using an internal reference voltage during an active operation in accordance with a detection signal generated by using an external voltage and an active enable signal activated during an activation mode, and a second driver that outputs an internal voltage by using the internal reference voltage during the active operation in accordance with the active enable signal.
Abstract:
A power-up signal generator of a semiconductor device includes a voltage dividing block, a level detection block, and an output block. The voltage dividing block outputs a divided voltage corresponding to a voltage level of an external power supply voltage. The level detection block is controlled according to the divided voltage, and comprises a pull-up unit and a pull-down unit. The output block outputs a power-up signal having a logic level corresponding to a voltage level of an output node of the level detection block. The pull-up unit and the pull-down unit have different threshold voltage levels with respect to a temperature change.
Abstract:
An internal voltage generation circuit of a semiconductor device includes: a comparator for comparing a reference voltage level with a detection voltage level to provide a comparison signal; an internal voltage output device for raising a voltage of an internal voltage output terminal to a predetermined level in response to the comparison signal; and an internal voltage output controller for controlling the internal voltage output terminal to be raised to a selected level. A voltage applied to the internal voltage output terminal is outputted as an internal voltage.