-
公开(公告)号:US20170330851A1
公开(公告)日:2017-11-16
申请号:US15666340
申请日:2017-08-01
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Li-Chuan Tsai , Chih-Cheng Lee
IPC: H01L23/00 , H01L21/48 , H01L25/10 , H01L23/498
CPC classification number: H01L24/11 , H01L21/4853 , H01L23/49811 , H01L23/49833 , H01L23/5389 , H01L24/13 , H01L24/16 , H01L25/105 , H01L2224/11464 , H01L2224/13026 , H01L2224/13082 , H01L2224/16227 , H01L2225/1023 , H01L2225/1041 , H01L2225/1058 , H01L2924/00014 , H01L2924/15311 , H01L2924/1533 , H01L2924/181 , H01L2924/00012 , H01L2224/13099
Abstract: The present disclosure relates to a package substrate. The package substrate includes a patterned conductive layer and conductive pillars. Each of the conductive pillars includes a first portion and a second portion, where the first portion contacts the patterned conductive layer at one end of the first portion, and the second portion is adjacent to another end of the first portion. A thickness of the first portion is greater than a thickness of the second portion. Side surfaces of the first portion are substantially coplanar to side surfaces of the second portion.
-
公开(公告)号:US09659853B2
公开(公告)日:2017-05-23
申请号:US14696355
申请日:2015-04-24
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: You-Lung Yen , Chih-Cheng Lee , Yuan-Chang Su
IPC: H01L23/48 , H01L23/498 , H01L23/31 , H01L21/48 , H01L21/683 , H01L23/544
CPC classification number: H01L23/49838 , H01L21/4857 , H01L21/486 , H01L21/6835 , H01L23/3121 , H01L23/3128 , H01L23/49822 , H01L23/49827 , H01L23/49833 , H01L23/5385 , H01L23/544 , H01L23/562 , H01L2221/68345 , H01L2223/54426 , H01L2223/54486 , H01L2224/73204
Abstract: An interposer substrate includes a first circuit pattern embedded at a first surface of a dielectric layer and a second circuit pattern embedded at a second surface of the dielectric layer; a middle patterned conductive layer in the dielectric layer between the first circuit pattern and the second circuit pattern; first conductive vias, where each first conductive via includes a first end adjacent to the first circuit pattern and a second end adjacent to the middle patterned conductive layer, wherein a width of the first end is greater than a width of the second end; second conductive vias, where each second conductive via including a third end adjacent to the second circuit pattern and a fourth end adjacent to the middle patterned conductive layer, wherein a width of the third end is greater than a width of the fourth end.
-
13.
公开(公告)号:US20160379950A1
公开(公告)日:2016-12-29
申请号:US14750880
申请日:2015-06-25
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Li-Chuan Tsai , Chih-Cheng Lee
IPC: H01L23/00
CPC classification number: H01L24/11 , H01L21/4853 , H01L23/49811 , H01L23/49833 , H01L23/5389 , H01L24/13 , H01L24/16 , H01L25/105 , H01L2224/11464 , H01L2224/13026 , H01L2224/13082 , H01L2224/16227 , H01L2225/1023 , H01L2225/1041 , H01L2225/1058 , H01L2924/00014 , H01L2924/15311 , H01L2924/1533 , H01L2924/181 , H01L2924/00012 , H01L2224/13099
Abstract: The present disclosure relates to a package substrate. The package substrate includes a patterned conductive layer and conductive pillars. Each of the conductive pillars includes a first portion and a second portion, where the first portion contacts the patterned conductive layer at one end of the first portion, and the second portion is adjacent to another end of the first portion. A thickness of the first portion is greater than a thickness of the second portion. Side surfaces of the first portion are substantially coplanar to side surfaces of the second portion.
Abstract translation: 本公开涉及封装基板。 封装衬底包括图案化导电层和导电柱。 每个导电柱包括第一部分和第二部分,其中第一部分在第一部分的一端处接触图案化的导电层,并且第二部分与第一部分的另一端相邻。 第一部分的厚度大于第二部分的厚度。 第一部分的侧表面基本上与第二部分的侧表面共面。
-
14.
公开(公告)号:US11824031B2
公开(公告)日:2023-11-21
申请号:US16898064
申请日:2020-06-10
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Chih-Cheng Lee , Jiming Li
CPC classification number: H01L24/20 , H01L23/3171 , H01L23/481 , H01L2924/15153
Abstract: A semiconductor package structure and a method for manufacturing the same are provided. The semiconductor package structure includes a substrate, a chip and a dielectric structure. The substrate includes a first portion and a second portion surrounding the first portion. The second portion defines a cavity over the first portion. The chip includes a terminal on an upper surface of the chip. The dielectric structure fills the cavity and laterally encroaches over the upper surface of the chip. The dielectric structure is free from overlapping with the terminal of the chip.
-
公开(公告)号:US11335650B2
公开(公告)日:2022-05-17
申请号:US16899515
申请日:2020-06-11
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Wu Chou Hsu , Chih-Cheng Lee , Min-Yao Chen , Hsing Kuo Tien
Abstract: The present disclosure provides a package substrate and method of manufacturing the same. The package substrate includes a substrate, an electronic component and a conductive trace. The electronic component is disposed in the substrate. The electronic component includes a conductive wire comprising an alignment mark section and a connection section, and a magnetic layer partially covering the conductive wire. The magnetic layer includes an alignment window disposed in an upper surface of the magnetic layer and exposing a first upper surface of the alignment mark section, and a recess disposed in the upper surface of the magnetic layer and exposing a second upper surface of the connection section. The conductive trace is in the recess and electrically connected to the second upper surface of the connection section of the conductive wire.
-
公开(公告)号:US20210391291A1
公开(公告)日:2021-12-16
申请号:US16898064
申请日:2020-06-10
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Chih-Cheng Lee , Jiming Li
Abstract: A semiconductor package structure and a method for manufacturing the same are provided. The semiconductor package structure includes a substrate, a chip and a dielectric structure. The substrate includes a first portion and a second portion surrounding the first portion. The second portion defines a cavity over the first portion. The chip includes a terminal on an upper surface of the chip. The dielectric structure fills the cavity and laterally encroaches over the upper surface of the chip. The dielectric structure is free from overlapping with the terminal of the chip.
-
公开(公告)号:US11101186B2
公开(公告)日:2021-08-24
申请号:US16297451
申请日:2019-03-08
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Cheng-Lin Ho , Chih-Cheng Lee
Abstract: A substrate structure includes a wiring structure and a supporter. The wiring structure includes a first dielectric structure, a first circuit layer, a second dielectric structure and a second circuit layer. The first circuit layer is disposed on the first dielectric structure. The second dielectric structure covers the first dielectric structure and the first circuit layer. A pad portion of the first circuit layer is exposed from the first dielectric structure, and the second circuit layer protrudes from the second dielectric structure. The supporter is disposed adjacent to the first dielectric structure of the wiring structure, and defines at least one through hole corresponding to the exposed pad portion of the first circuit layer.
-
公开(公告)号:US11088061B2
公开(公告)日:2021-08-10
申请号:US16814729
申请日:2020-03-10
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Cheng-Lin Ho , Chih-Cheng Lee
IPC: H01L23/498 , H01L23/31 , H01L21/48
Abstract: A substrate includes a first dielectric layer having a first surface and a second dielectric layer having a first surface disposed adjacent to the first surface of the first dielectric layer. The substrate further includes a first conductive via disposed in the first dielectric layer and having a first end adjacent to the first surface of the first dielectric layer and a second end opposite the first end. The substrate further includes a second conductive via disposed in the second dielectric layer and having a first end adjacent to the first surface of the second dielectric layer. A width of the first end of the first conductive via is smaller than a width of the second end of the first conductive via, and a width of the first end of the second conductive via is smaller than the width of the first end of the first conductive via.
-
公开(公告)号:US11004779B2
公开(公告)日:2021-05-11
申请号:US15893180
申请日:2018-02-09
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Po-Shu Peng , Cheng-Lin Ho , Chih-Cheng Lee
IPC: H01L23/498 , H01L21/48 , H01L23/00
Abstract: A substrate includes a first dielectric layer having a first surface and a second surface opposite to the first surface, a first patterned conductive layer adjacent to the first surface of the first dielectric layer and comprising an interconnection structure, and an interconnection element. The interconnection element extends from the first surface of the first dielectric layer to the second surface of the first dielectric layer and is surrounded by the interconnection structure.
-
公开(公告)号:US10886208B2
公开(公告)日:2021-01-05
申请号:US16264602
申请日:2019-01-31
Applicant: Advanced Semiconductor Engineering, Inc.
Inventor: Cheng-Lin Ho , Chih-Cheng Lee , Chun Chen Chen , Chen Yuang Chen
Abstract: A semiconductor device package includes a carrier, an electronic component, a connection element and an encapsulant. The electronic component is disposed on a surface of the carrier. The connection element is disposed on the surface and adjacent to an edge of the carrier. The encapsulant is disposed on the surface of the carrier. A portion of the connection element is exposed from an upper surface and an edge of the encapsulant.
-
-
-
-
-
-
-
-
-