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22 条记录 (耗时 0.031 秒)

    X-ray image observing device
    11.
    发明授权
    X-ray image observing device 失效
    X射线图像观察装置

    公开(公告)号：US4912737A

    公开(公告)日：1990-03-27

    申请号：US263254

    申请日：1988-10-27

    申请人： Shinji Ohsuka ,  Masaru Sugiyama ,  Tsuyoshi Hayakawa ,  Katsuyuki Kinoshita ,  Akira Ohba

    发明人： Shinji Ohsuka ,  Masaru Sugiyama ,  Tsuyoshi Hayakawa ,  Katsuyuki Kinoshita ,  Akira Ohba

    IPC分类号： G21K7/00

    CPC分类号： G21K7/00

    摘要： The X-ray image microscope according to this invention comprises an X-ray absorption imaging unit having a glazing incidence mirror, and an electron imaging unit having an electron lens connected to the X-ray absorption imaging unit. A thin support film is provided on the boundary between the X-ray absorption imaging unit and the electron imaging unit. On the support film is formed a photocathode screen which emits photoelectrons in response to an incident X-ray. The X-ray absorption image of an X-ray which has penetrated a specimen, e.g. a living cell, is magnified by the X-ray imaging unit, and the electron image corresponding to the X-ray image is magnified by an electron lens. The magnified electron image is converted into a light image by a phosphor screen, and the light image is caught by a TV camera. In this way biological materials can be observed, magnified in their living states.

    Test instrument
    13.
    发明授权
    Test instrument 失效
    测试仪器

    公开(公告)号：US5397537A

    公开(公告)日：1995-03-14

    申请号：US162976

    申请日：1993-12-08

    申请人： Zensho Kanda ,  Katsuhiko Miyaguchi ,  Masufumi Koike ,  Tsuyoshi Hayakawa ,  Naoki Morikawa

    发明人： Zensho Kanda ,  Katsuhiko Miyaguchi ,  Masufumi Koike ,  Tsuyoshi Hayakawa ,  Naoki Morikawa

    IPC分类号： G01N33/52 ,  G01N37/00 ,  G01N21/00

    CPC分类号： G01N33/525

    摘要： A test instrument for uniformly spreading a collected specimen on a reagent layer has a first opening for collecting the specimen, a specimen spreading layer having an upper surface a portion of which is exposed to the first opening, the reagent layer provided so that an upper surface thereof is in contact with the lower surface of the specimen spreading layer, and a support layer provided on a lower surface of the reagent layer. Even if the specimen does not attached itself in a uniform distribution over the large area of the first opening, it will be evenly distributed at the second opening, the opening area of which is smaller than that of the first opening at which measurement is performed. When an absorbing layer provided in the proximity of the edge portion of the first opening is supplied with an excess amount of the specimen, a direct path to the absorbing layer is blocked by the inner peripheral region of the first opening so that the absorbing layer is soaked via the spreading layer. Consequently, the specimen is distributed on the reagent layer uniformly and at a fixed concentration irrespective of the amount thereof.

    摘要翻译： 用于将试样层均匀铺展的试验仪器具有用于收集试样的第一开口，具有一部分暴露于第一开口的上表面的试样铺展层，所述试剂层设置成使得上表面 其与试样铺展层的下表面接触，并且设置在试剂层的下表面上的支撑层。 即使试样在第一开口的大面积上没有以均匀分布的方式附着在第二开口处，其开口面积小于进行测量的第一开口的开口面积。 当设置在第一开口的边缘部分附近的吸收层被供给过量的样本时，到达吸收层的直通路径被第一开口的内周区域阻挡，使得吸收层为 通过铺展层浸泡。 因此，不管其量如何，试样均匀地分布在试剂层上。

    Welding method and welding apparatus
    16.
    发明授权
    Welding method and welding apparatus 有权

    公开(公告)号：US10035213B2

    公开(公告)日：2018-07-31

    申请号：US13353841

    申请日：2012-01-19

    申请人： Hideaki Shirai ,  Tsuyoshi Hayakawa

    发明人： Hideaki Shirai ,  Tsuyoshi Hayakawa

    IPC分类号： B23K9/16 ,  B23K9/167 ,  B23K9/29

    CPC分类号： B23K9/164 ,  B23K9/167 ,  B23K9/296

    摘要： An arc welding apparatus disclosed in this specification includes: first electrode; second electrode; and a first gas supply unit which supplies a first shielding gas from the circumference of a base material-side portion of an arc region formed between the first electrode and a base material connected to the second electrode toward the center of the arc region, and controls the ratio of the pressure outside the arc region to the pressure at the center of the arc region to within the range of 70 to 5000.

    Apparatus and method for measuring chemiluminescence
    19.
    发明授权
    Apparatus and method for measuring chemiluminescence 失效
    用于测量化学发光的装置和方法

    公开(公告)号：US5637874A

    公开(公告)日：1997-06-10

    申请号：US393387

    申请日：1995-02-23

    申请人： Katsu Honzawa ,  Kazuhiro Atsumi ,  Fumihiko Shimomura ,  Masayuki Masuko ,  Tsuyoshi Hayakawa

    发明人： Katsu Honzawa ,  Kazuhiro Atsumi ,  Fumihiko Shimomura ,  Masayuki Masuko ,  Tsuyoshi Hayakawa

    IPC分类号： G01N21/75 ,  C12M1/34 ,  G01N21/03 ,  G01N21/76

    CPC分类号： G01N21/76

    摘要： The present invention provides a chemiluminescence measuring apparatus which is small in size and high in operability and has a function of performing accurate quantitative analysis and the like. The apparatus includes at least a box-like housing having an opening, a cover provided on a top surface of the housing and having a through hole for introducing a first detachable vessel into the inner space of the housing, a holder having a concave portion and enclosing the opening of the housing, the hollow chamber having an opening at a side wall thereof and partially housing a second vessel, a photo-sensing unit for detecting luminescence from the second vessel via the through hole of the hollow chamber, and a shutter mechanism for intermittently cutting optical path between the photo-sensing unit and the second vessel. Particularly, the shutter mechanism includes a rotatable hollow chamber partially housing the vessel, provided in the hollow chamber and having an opening at a side wall thereof, and a driving motor rotating the rotatable hollow chamber.

    摘要翻译： 本发明提供一种尺寸小，操作性高的化学发光测定装置，具有进行准确的定量分析等功能。 该装置至少包括具有开口的盒状壳体，设置在壳体的顶表面上的盖，并具有用于将第一可拆卸容器引入壳体的内部空间的通孔，具有凹部和 封闭壳体的开口，中空室在其侧壁处具有开口并且部分地容纳第二容器，用于经由中空室的通孔检测来自第二容器的发光的光感测单元，以及快门机构 用于间歇地切割感光单元和第二容器之间的光路。 特别地，闸门机构包括：可旋转的中空室，其设置在中空室中，部分地容纳容器，并且在其侧壁具有开口;以及驱动马达，其旋转可旋转中空室。