Innovative Multi-Purpose Dipping Plate
    11.
    发明申请
    Innovative Multi-Purpose Dipping Plate 有权
    创新型多功能浸渍板

    公开(公告)号:US20140048586A1

    公开(公告)日:2014-02-20

    申请号:US13586132

    申请日:2012-08-15

    IPC分类号: B23K1/20 B23K3/08

    摘要: The present disclosure is directed to an apparatus for the application of soldering flux to a semiconductor workpiece. In some embodiments the apparatus comprises a dipping plate having a reservoir which is adapted to containing different depths of flux material. In some embodiments, the reservoir comprises at least two landing regions having sidewalls which form first and second dipping zones. The disclosed apparatus can allow dipping of the semiconductor workpiece in different depths of soldering flux without the necessity for changing dipping plates.

    摘要翻译: 本公开涉及一种用于将焊剂应用于半导体工件的装置。 在一些实施例中,该装置包括具有适于容纳不同深度的助焊剂材料的储存器的浸渍板。 在一些实施例中,储存器包括具有形成第一和第二浸渍区域的侧壁的至少两个着陆区域。 所公开的装置可以允许将半导体工件浸入不同深度的焊剂中,而不需要改变浸渍板。

    Method for fabricating a multilayer microstructure with balancing residual stress capability
    16.
    发明授权
    Method for fabricating a multilayer microstructure with balancing residual stress capability 有权
    制备具有平衡残余应力能力的多层微结构的方法

    公开(公告)号:US08088692B2

    公开(公告)日:2012-01-03

    申请号:US12575754

    申请日:2009-10-08

    IPC分类号: H01L21/302 H01L21/461

    摘要: A method for fabricating a multilayer microstructure with balancing residual stress capability includes forming a multilayer microstructure on a silicon substrate and conducting a step of isotropic plasma etching. The multilayer microstructure includes a first metal layer and a second metal layer patterned and aligned symmetrically to form etching through holes; a metal via layer surrounding each etching through hole; and an insulating layer filling each etching through hole and disposed between the substrate and the first metal layer. The step of isotropic chemical plasma etching removes the insulating layer in each etching through hole, the insulating layer between the substrate and the metal layer and a portion of the substrate to form a suspended multilayer microstructure on the substrate, during which a chamber pressure larger than vacuum and maintains a ratio between a lateral etching rate and a vertical etching rate between 0.5 to 1 is used; and the reaction gases comprise a gaseous fluoride and oxygen.

    摘要翻译: 用于制造具有平衡残余应力能力的多层微结构的方法包括在硅衬底上形成多层微结构并进行各向同性等离子体蚀刻步骤。 多层微结构包括对称地图案化和对准的第一金属层和第二金属层,以形成蚀刻通孔; 围绕每个蚀刻通孔的金属通孔层; 以及绝缘层,其填充每个蚀刻通孔并且设置在所述基板和所述第一金属层之间。 各向同性化学等离子体蚀刻的步骤去除了每个蚀刻通孔中的绝缘层,衬底和金属层之间的绝缘层以及衬底的一部分,以在衬底上形成悬浮的多层微结构,在此期间室压力大于 使用真空度并保持横向蚀刻速率和0.5至1之间的垂直蚀刻速率之间的比率; 并且反应气体包含氟化物和氧气。