Abstract:
In one embodiment, a sense amplifier for sensing a binary state of a memory cell coupled to a bit line and a complementary bit line and for writing a binary state into the memory cell is provided. The sense amplifier includes: a first pair of switches including a first switch coupled to a node on the bit line and a second switch coupled to a node on the complementary bit line; a signal detector having a first input terminal coupled to the first switch and a second input terminal coupled to the second switch, the signal detector configured to sense voltages on the bit line and the complementary bit line through the first pair of switches during a read operation; a second pair of switches, wherein a first switch in the second pair couples between the node on the bit line and ground and is responsive to a data signal to be written to the memory cell and a second switch couples between the node on the complementary bit line and ground and is responsive to a complementary data signal to be written to the memory cell, wherein if either the data signal or the complementary data signal is true, a corresponding bit line is grounded so as to force the binary state of memory cell into an appropriate value during a write operation; and wherein the first pair of switches are controlled such that they turn on during a read operation while the signal detector determines the binary state of the memory cell, the first pair of switches being off during the write operation whereby a capacitance presented to the bit line and the complementary bit line by the sense amplifier is lower during the write operation than during the read operation.
Abstract:
The present invention relates to a system and method for increasing the manufacturing yield of a plurality of memory cells used in cell arrays. A programmable fuse, having both hardware and software elements, is used with the plurality of memory cells to indicate that at least one memory cell is unusable and should be shifted out of operation. The software programmable element includes a programmable register adapted to shift in an appropriate value indicating that at least one of the memory cells is flawed. The hardware element includes a fuse gated with the programmable register. Shifting is indicated either by software programmable fuse or hard fuse. Soft fuse registers may be chained together forming a shift register.
Abstract:
In one embodiment, NMOS transistors have their source coupled to a common source node such that the NMOS transistors conduct a leakage current if the common source node is grounded. To reduce this leakage current, the common source node is raised in potential. Similarly, PMOS transistors have their source coupled to a common source node such that the PMOS transistors conduct a leakage current if the common source node is charged to a power supply voltage VDD. To reduce this leakage current, the common source node is lowered in potential.
Abstract:
Data encoding system and method for implementing robust non-volatile memories. A data bit is stored using two memory cells. The data bit is represented by setting a voltage level of a first memory cell to a first voltage level and setting a voltage level of a second memory cell to a second voltage level. In one embodiment, the first voltage level and the second voltage level are of opposite polarity. In one embodiment, to store a data bit having the value “0,” the first memory cell is set to a first voltage level and the second memory cell is set to a second voltage level of opposite polarity to the first voltage level, and to store a data bit having the value “1,” the first memory cell is set to a third voltage level and the second memory cell is set to a fourth voltage level of opposite polarity to the third voltage level. In an illustrative embodiment, the first voltage level is of substantially equal magnitude, and of opposite polarity, to the second voltage level, the third voltage level is of substantially equal magnitude, and of opposite polarity, to the fourth voltage level, the first voltage level is substantially equal to the fourth voltage level, and the second voltage level is substantially equal to the third voltage level. In one embodiment, the data stored according to the present invention is read out by comparing the relative voltages of the first and second memory cells with a differential sense amplifier.
Abstract:
The present invention relates to a system and method for providing redundancy in a hierarchically memory, by replacing small blocks in such memory. The present invention provides such redundancy (i.e., replaces such small blocks) by either shifting predecoded lines or using a modified shifting predecoder circuit in the local predecoder block. In one embodiment, the hierarchal memory structure includes at least one active predecoder adapted to be shifted out of use; and at least one redundant predecoder adapted to be shifted in to use.
Abstract:
An imaging device includes a plurality of photo-diodes that operate as optical pixels arranged in a plurality of columns on a single CMOS substrate. The outputs of the multiple pixel sensors, or photo-diodes, are examined to determine if a one pixel, or a region of pixels are in saturation. If so, then the pixel gain is adjusted to correct or compensate for the image distortion in the region. For example, the gain of the charging amplifier or operational amplifier can be adjusted to correct for saturation. This can be done in real-time since hardware is being tuned for the correction instead of software.
Abstract:
The present invention relates to a system and method for providing redundancy in a hierarchically memory, by replacing small blocks in such memory. The present invention provides such redundancy (i.e., replaces such small blocks) by either shifting predecoded lines or using a modified shifting predecoder circuit in the local predecoder block. In one embodiment, the hierarchal memory structure includes at least one redundant predecoder adapted to be shifted in for at least one active predecoder of a plurality of predecoders adapted to be shifted out.
Abstract:
A decoder providing asynchronous reset, redundancy, or both. an asynchronously-resettable decoder with redundancy. The decoder has a synchronous portion, responsive to a clocked signal; an asynchronous portion coupled with an asynchronous circuit; a feedback-resetting portion, which substantially isolates the synchronous portion from the asynchronous portion coupled with, and interposed between the synchronous portion in response to a asynchronous reset signal; a signal input; a first memory output coupled with a first memory cell group; a second memory output coupled with a second memory cell group; and a selector coupled between the signal input, the first memory output, and the second memory output. This decoder can be memory row-oriented, and thus provide an asynchronously-resettable row decoder with row redundancy, or an asynchronously-resettable column decoder with column redundancy.
Abstract:
A hierarchical memory structure having memory cells, and sense amplifiers and decoders coupled with the memory cells to form first tier memory module, and subsequent tiers being formed by having (n-1)-tier memory modules, which are coupled with (n)-tier sense amplifiers and (n)-tier decoders. Also provided are a single-ended sense amplifier having sample-and-hold reference, and a charge-share limited-swing-driver sense amplifier; an asynchronously-resettable decoder; a wordline decoder having row redundancy; a redundancy device having redundant memory cells operated by a redundancy controller; a diffusion replica delay circuit; a high-precision delay measurement circuit; and a data transfer bus circuit imposing a limited voltage swing on a data bus. Methods are provided for a write-after-read operation without an interposed precharge cycle, and write-after-write operation with an interposed precharge cycle are provided, either operation being completed in less than one memory access cycle.
Abstract:
The present invention relates to a system and method adapted to increase memory cell and memory architecture design yield. The present invention includes memory architecture having a decoder and a multi-bank memory. The decoder is adapted to decode addresses. The multi-bank memory interacts with the decoder, wherein the multi-bank memory includes at least one output data bit adapted to complete a word for a failing bank in the multi-bank memory.