Circuit property measurement method
    11.
    发明授权
    Circuit property measurement method 有权
    电路性能测量方法

    公开(公告)号:US07173433B2

    公开(公告)日:2007-02-06

    申请号:US11055698

    申请日:2005-02-11

    CPC classification number: G01R35/007 G01R31/2822 H01L2924/0002 H01L2924/00

    Abstract: In a high frequency circuit property measurement method, prior to property measurements of a high frequency circuit with RF measurement probe heads, RF measurement probe heads are calibrated using a calibration pattern comprising a signal line having a characteristic impedance and extending on a dielectric substrate, a first GND pad having one end disposed close to and at an interval from a first end of the signal line, a second GND pad having one end disposed close to and at an interval from a second end of the signal line, and a conductor electrically coupling the first GND pad to the second GND pad.

    Abstract translation: 在高频电路特性测量方法中,在具有RF测量探针头的高频电路的性质测量之前,使用包括具有特征阻抗并在电介质基底上延伸的信号线的校准图案校准RF测量探头, 第一GND焊盘,其一端靠近信号线的第一端并且间隔设置;第二GND焊盘,其一端靠近信号线的第二端并以一定距离设置;电导体 第一个GND焊盘到第二个GND焊盘。

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