BGA STRUCTURE USING CTF BALLS IN HIGH STRESS REGIONS
    8.
    发明申请
    BGA STRUCTURE USING CTF BALLS IN HIGH STRESS REGIONS 审中-公开
    BGA结构在高应力区域使用CTF BALLS

    公开(公告)号:US20160128207A1

    公开(公告)日:2016-05-05

    申请号:US14992919

    申请日:2016-01-11

    Abstract: A BGA structure having larger solder balls in high stress regions of the array is disclosed. The larger solder balls have higher solder joint reliability (SJR) and as such may be designated critical to function (CTF), whereby the larger solder balls in high stress regions carry input/output signals between a circuit board and a package mounted thereon. The larger solder balls are accommodated by recessing each ball in the package substrate, the circuit board, or both the package substrate and the circuit board. Additionally, a ball attach method for mounting a plurality of solder balls having different average diameters is disclosed.

    Abstract translation: 公开了一种在阵列的高应力区域具有较大焊球的BGA结构。 较大的焊球具有较高的焊点可靠性(SJR),因此可被指定为关键功能(CTF),因此高应力区域中较大的焊球在电路板和安装在其上的封装之间承载输入/输出信号。 通过将封装基板,电路板或封装基板和电路板两者中的每个球凹入来容纳较大的焊球。 另外,公开了一种用于安装具有不同平均直径的多个焊球的球附着方法。

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