Abstract:
An apparatus for conveying a paper along a paper conveying path, the apparatus includes a pair of guide plates for guiding a paper in the paper conveying path, the guide plates being movable between a first position located in the paper conveying path and a second position located out of the paper conveying path and a roller located in the paper conveying path for conveying the paper. The roller is rotated in response to the moving of the guide plates from the first position to the second position so that the paper in the paper conveying path is fed from the guide plates.
Abstract:
An NMOS transistor type nonvolatile semiconductor memory has first and second N-type diffusion layers formed in a P-type silicon layer as a source and a drain; a gate electrode formed on a channel region with an insulating film interposed therebetween, the channel region being sandwiched between the first and second N-type diffusion layers; and a charge storage layer formed in the insulating film. A direction from the first N-type diffusion layer to the second N-type diffusion layer is the same as a crystal orientation of the P-type silicon layer. At the time of rewriting, the hot holes go over a potential barrier of the insulating film to be injected into the charge storage layer.
Abstract:
There is provided a panel structure for an electronic apparatus that is capable of exhibiting two types of design images. During daytime hours for example, a design-applied portion of a panel main body can be visually recognized through a panel made of a light transmitting material. During nighttime hours for example, when light is conducted from one X direction-wise end to the other x direction-wise end in the panel, as well as from the other x direction-wise end to one X direction-wise end in the panel 1, the design-applied portion is shielded with the light illuminating the panel. In this way, by making a difference between the daytime visual impression and the nighttime visual impression of the panel, it is possible to impart two types of design images to the panel structure.
Abstract:
A non-volatile semiconductor memory device includes a substrate, a first insulating film formed on the substrate, a second insulating film formed on the first insulating film, a plurality of granular dots formed in the second insulating film adjacent to the first insulating film as a floating gate, and a control gate formed on the second insulating film. The second insulating film is a high dielectric constant film made of oxide whose dielectric constant is higher than that of the first insulating film and whose heat of formation is higher than that of silicon oxide.
Abstract:
A scanner unit has first and second carriages under an original table glass. The first carriage has a first frame extending from a front side to a rear side along the original table, that is, in a main scan direction. Two rails for supporting both end portions of the first frame such that the first frame may slide in a sub-scan direction are provided on the front side and rear side of the scanner unit. A cold cathode fluorescent lamp is mounted on the first frame. In order to make a high-voltage-side harness of the cold cathode fluorescent lamp as short as possible, an inverter circuit board, which is a lighting circuit, is disposed as close as possible to a positive electrode of the cold cathode fluorescent lamp. A weight is attached on a side opposite to the inverter circuit board, thereby to stabilize a weight balance of the first frame in the main scan direction.
Abstract:
A scanner unit is provided, which can make the amounts of light directed to a read line from the opposite sides of the optic axis plane substantially the same, thereby preventing a shade due to an edge of an attachment portion on a document form occurring.In the scanner unit of the present invention, the carriage mirror 23 and the second carriage 12 of the optical reading device read a document by scanning read lines LL on the document in the scanning direction (R, F) and using light reflected from the document along an optic axis plane PP which contains the read line and extends in perpendicular relation to a document glass table. An exposure lamp 21 and a reflector 22 forming an illumination device illuminate the read line from both sides of the optic axis plane with the light passing along light path L10, L11 and the light passing along light path L20, L21, respectively. An light amount adjusting member, e.g., a filter 25, reduces the amount of light passing along the light path L10, L11 so that the amounts of illumination light directed from both sides of the optic axis plane are made substantially the same at the read line, thereby preventing a shade when reading an edge of an attachment portion on the document.
Abstract:
A Metal Oxide Semiconductor (MOS) transistor includes a gate insulating film disposed on a surface of a silicon substrate. The gate insulating film has a central portion formed on the silicon substrate and comprising a nitride insulating film, and an end portion located on each side of the central portion, the end portion being thicker than the central portion and formed of an oxide insulating film. The MOS transistor also includes a p-type gate electrode formed on the gate insulating film, sidewalls formed on both sides of the gate insulating film and the gate electrode, a pair of p-type source/drain areas formed in surface portions of the silicon substrate, and a channel area located between the pair of source/drain areas.
Abstract:
A semiconductor device has a capacitor insulating film composed of a first and a second silicon nitride film. The surface of a lower electrode of impurity-doped polysilicon is transformed into the first silicon nitride film by thermal nitriding, and thereafter the second silicon nitride film is formed by chemical vapor deposition. An upper electrode is formed on the second silicon nitride film. A silicon oxide film may be formed on the second silicon nitride film by thermal oxidation. The capacitor insulating film which has a thickness of 5 nm or less in equivalent thickness of an oxide film reduces a leakage current and improves a long-term product reliability.
Abstract:
An NMOS transistor type nonvolatile semiconductor memory has first and second N-type diffusion layers formed in a P-type silicon layer as a source and a drain; a gate electrode formed on a channel region with an insulating film interposed therebetween, the channel region being sandwiched between the first and second N-type diffusion layers; and a charge storage layer formed in the insulating film. A direction from the first N-type diffusion layer to the second N-type diffusion layer is the same as a crystal orientation of the P-type silicon layer. At the time of rewriting, the hot holes go over a potential barrier of the insulating film to be injected into the charge storage layer.
Abstract:
A non-volatile semiconductor memory device includes a substrate, a first insulating film formed on the substrate, a second insulating film formed on the first insulating film, a plurality of granular dots formed in the second insulating film adjacent to the first insulating film as a floating gate, and a control gate formed on the second insulating film. The second insulating film is a high dielectric constant film made of oxide whose dielectric constant is higher than that of the first insulating film and whose heat of formation is higher than that of silicon oxide.