Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes

    公开(公告)号:US20240094256A1

    公开(公告)日:2024-03-21

    申请号:US17968552

    申请日:2022-10-18

    CPC classification number: G01R1/07314 G01R1/06722 G01R1/06738 G01R3/00

    Abstract: Probes for contacting electronic components include compliant modules stacked in a serial configuration, which are supported by a sheath, exoskeleton, or endoskeleton which allows for linear longitudinal compression of probe ends toward one another wherein the compliant elements within the compliant modules include planar springs (when unbiased). Alternatively, probes may be formed from single modules or back-to-back modules that may share a common base/standoff. Modules may allow for lateral and/or longitudinal alignment relative to array structures or other modules. Planar springs may be spirals, interlaced spirals having common or offset longitudinal levels, with similar or different rotational orientations that are functionally joined, and planar springs may transition into multiple thinner spring elements along their lengths. Compression of probe tips toward one another may cause portions of spring elements to move closer together or further apart.

    Buckling beam probe arrays and methods for making such arrays including forming probes with lateral positions matching guide plate hole positions

    公开(公告)号:US11821918B1

    公开(公告)日:2023-11-21

    申请号:US17240962

    申请日:2021-04-26

    CPC classification number: G01R1/06744 G01R1/06761 G01R1/07357

    Abstract: Embodiments are directed to the formation of buckling beam probe arrays having MEMS probes that are engaged with guide plates during formation or after formation of the probes while the probes are held in the array configuration in which they were formed. In other embodiments, probes may be formed in, or laterally aligned with, guide plate through holes. Guide plate engagement may occur by longitudinally locating guide plates on probes that are partially formed or fully formed with exposed ends, by forming probes within guide plate through holes, by forming guide plates around probes, or forming guide plates in lateral alignment with arrayed probes and then longitudinally engaging the probes and the through holes of the guide plates. Final arrays may include probes and a substrate to which the probes are bonded along with one or more guide plates while in other embodiments final arrays may include probes held by a plurality of guide plates (e.g. 2, 3, 4 or even more guide plates) with aligned or laterally shifted hole patterns.

    Cantilever Microprobes for Contacting Electronic Components and Methods for Making Such Probes
    19.
    发明申请
    Cantilever Microprobes for Contacting Electronic Components and Methods for Making Such Probes 审中-公开
    用于接触电子元件的悬臂式微孔和制造这种探头的方法

    公开(公告)号:US20140231264A1

    公开(公告)日:2014-08-21

    申请号:US14260072

    申请日:2014-04-23

    Abstract: Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to various designs of cantilever-like probe structures. Some embodiments are directed to methods for fabricating such cantilever structures. In some embodiments, for example, cantilever probes have extended base structures, slide in mounting structures, multi-beam configurations, offset bonding locations to allow closer positioning of adjacent probes, compliant elements with tensional configurations, improved over travel, improved compliance, improved scrubbing capability, and/or the like.

    Abstract translation: 本文公开的实施例涉及用于与电子电路等进行临时或永久接触的柔性探针结构。 具体地,实施例涉及悬臂式探针结构的各种设计。 一些实施例涉及制造这种悬臂结构的方法。 在一些实施例中,例如,悬臂探头具有延伸的基部结构,在安装结构中滑动,多光束配置,偏移粘合位置,以允许相邻探针,具有张力构型的柔顺元件,改善的行程,改善的顺应性,改进的擦洗 能力和/或类似物。

    Electrochemically Fabricated Structures Having Dielectric or Active Bases and Methods of and Apparatus for Producing Such Structures
    20.
    发明申请
    Electrochemically Fabricated Structures Having Dielectric or Active Bases and Methods of and Apparatus for Producing Such Structures 审中-公开
    具有电介质或活性碱的电化学结构和用于生产这种结构的方法和装置

    公开(公告)号:US20140209470A1

    公开(公告)日:2014-07-31

    申请号:US14184362

    申请日:2014-02-19

    CPC classification number: C25D1/003 B81C1/00373 B81C2201/0181 B81C2201/019

    Abstract: Multilayer structures are electrochemically fabricated on a temporary (e.g. conductive) substrate and are thereafter bonded to a permanent (e.g. dielectric, patterned, multi-material, or otherwise functional) substrate and removed from the temporary substrate. In some embodiments, the structures are formed from top layer to bottom layer, such that the bottom layer of the structure becomes adhered to the permanent substrate, while in other embodiments the structures are formed from bottom layer to top layer and then a double substrate swap occurs. The permanent substrate may be a solid that is bonded (e.g. by an adhesive) to the layered structure or it may start out as a flowable material that is solidified adjacent to or partially surrounding a portion of the structure with bonding occurring during solidification. The multilayer structure may be released from a sacrificial material prior to attaching the permanent substrate or it may be released after attachment.

    Abstract translation: 多层结构在临时的(例如导电的)衬底上电化学地制造,然后在永久(例如电介质,图案化,多材料或其他功能)的衬底上结合并从临时衬底去除。 在一些实施例中,结构由顶层到底层形成,使得结构的底层变得粘附到永久性基底上,而在其它实施例中,结构由底层到顶层形成,然后是双层衬底交换 发生。 永久性基材可以是与层状结构结合的固体(例如通过粘合剂),或者可以作为在凝固期间发生结合而邻近或部分地围绕结构的一部分固化的可流动材料开始。 多层结构可以在附着永久性基底之前从牺牲材料上释放,或者在附着后可以释放多层结构。

Patent Agency Ranking