Abstract:
A plurality of memory devices of mixed type (e.g., DRAMs, SRAMs, MRAMs, and NAND-, NOR- and AND-type Flash memories) are serially interconnected. Each device has device type information on its device type. A specific device type (DT) and a device identifier (ID) contained in a serial input (SI) as a packet are fed to one device of the serial interconnection. The device determines whether the fed DT matches the DT of the device. In a case of match, a calculator included in the device performs calculation to generate an ID accompanying the fed DT for another device and the fed ID is latched in a register of the device. In a case of no-match, the ID generation is skipped and no ID is generated for another device. The DT is combined with the generated or the received ID depending on the device type match determination. The combined DT and ID is as a packet transferred to a next device. Such a device type match determination and ID generation or skip are performed in all devices of the serial interconnection. With reference to device type provided to the interconnected devices, IDs are sequentially generated. The SI containing the DT, the ID and an ID generation command is transmitted in a packet basis to a next device.
Abstract:
A memory controller of a data storage device which communicates with a host, has channel control modules each being configurable to have at three different pinout assignments for interfacing with two different types of memory devices operating with different memory interface protocols. One pinout assignment corresponds to a memory interface protocol where memory devices can be connected in parallel with each other. Two other pinout assignments correspond respectively to inbound and outbound signals of another memory interface protocol where memory devices are serially connected with each other. In this mode of operation, one channel control module is configured to provide the outbound signals while another channel control module is configured to receive the inbound signals. Each memory port of the channel control modules includes port buffer circuitry configurable for different functional signal assignments. The configuration of each channel control module is selectable by setting predetermined ports or registers.
Abstract:
A memory controller of a data storage device, which communicates with a host, is configurable to have at least two different pinout assignments for interfacing with respective different types of memory devices. Each pinout assignment corresponds to a specific memory interface protocol. Each memory interface port of the memory controller includes port buffer circuitry configurable for different functional signal assignments, based on the selected memory interface protocol to be used. The interface circuitry configuration for each memory interface port is selectable by setting a predetermined port or registers of the memory controller.
Abstract:
A dual function memory device architecture compatible with asynchronous operation and synchronous serial operation. The dual function memory device architecture includes one set of physical ports having two different functional assignments. Coupled between the physical ports and core circuits of the memory device are asynchronous and synchronous input and output signal paths or circuits. The signal paths include shared or dedicated buffers coupled to the ports, asynchronous and synchronous command decoders, a network of switches, and a mode detector. The mode detector determines the operating mode of the dual function memory device from a port, and provides the appropriate switch selection signal. The network of switches routes the input or output signals through the asynchronous or synchronous circuits in response to the switch selection signal. The appropriate command decoder interprets the input signals and provides common control logic with the necessary signals for initiating the corresponding operation.
Abstract:
Apparatus and methods for carrying out operations in a non-volatile memory cell having multiple memory states are disclosed. One of the methods is a method for programming N bits in a non-volatile memory cell configured to store up to N+1 bits, where N is an integer greater than zero. The method for programming includes programming N bits of data in the cell. The method for programming also includes programming an additional bit of data that is a logical function of the N bits of data in the cell. The cell is configured to provide 2N+1 threshold voltage ranges for bit storage and, in accordance with the logical function: i) a first set of 2N threshold voltage ranges of the 2N+1 threshold voltage ranges are used to store the N bits of data; and ii) a remaining second set of 2N threshold voltage ranges alternating with the first set are unused.
Abstract:
A memory system architecture has serially connected memory devices. The memory system is scalable to include any number of memory devices without any performance degradation or complex redesign. Each memory device has a serial input/output interface for communicating between other memory devices and a memory controller. The memory controller issues commands in at least one bitstream, where the bitstream follows a modular command protocol. The command includes an operation code with optional address information and a device address, so that only the addressed memory device acts upon the command. Separate data output strobe and command input strobe signals are provided in parallel with each output data stream and input command data stream, respectively, for identifying the type of data and the length of the data. The modular command protocol is used for executing concurrent operations in each memory device to further improve performance.
Abstract:
A threshold voltage distribution scheme for multi-level Flash cells where an erase threshold voltage and at least one programmed threshold voltage lie in an erase voltage domain. Having at least one programmed threshold voltage in the erase voltage domain reduces the Vread voltage level to minimize read disturb effects, while extending the life span of the multi-level Flash cells as the threshold voltage distance between programmed states is maximized. The erase voltage domain can be less than 0V while a program voltage domain is greater than 0V. Accordingly, circuits for program verifying and reading multi-level Flash cells having a programmed threshold voltage in the erase voltage domain and the program voltage domain use negative and positive high voltages.
Abstract:
A storage system sized to fit within a standard magnetic hard disk drive (HDD) form factor. The storage system includes a solid state disk (SSD) and a cooling means thermally coupled to the body of the SSD. The components of the SSD occupy a smaller volume of space than magnetic HDD's. In particular, while the SSD has width and length dimensions matching those of the HDD form factor, the SSD has a height dimension that is less than the HDD form factor. Accordingly, the volume of space between the HDD form factor height and the SSD height is beneficially occupied by the cooling means. The storage system can be then be used as a direct replacement for HDD as it can fit within HDD bays configured for the standardized HDD form factor.
Abstract:
A NAND flash memory bank having a plurality of bitlines of a memory array connected to a page buffer, where NAND cell strings connected to the same bitline are formed in at least two well sectors. At least one well sector can be selectively coupled to an erase voltage during an erase operation, such that unselected well sectors are inhibited from receiving the erase voltage. When the area of the well sectors decrease, a corresponding decrease in the capacitance of each well sector results. Accordingly, higher speed erasing of the NAND flash memory cells relative to a single well memory bank is obtained when the charge pump circuit drive capacity remains unchanged. Alternately, a constant erase speed corresponding to a single well memory bank is obtained by matching a well segment having a specific area to a charge pump with reduced drive capacity. A reduced drive capacity charge pump will occupy less semiconductor chip area, thereby reducing cost.
Abstract:
A method and system for extending the life span of a flash memory device. The flash memory device is dynamically configurable to store data in the single bit per cell (SBC) storage mode or the multiple bit per cell (MBC) mode. In the MBC storage mode, the cell can have one of multiple possible states, where each state is defined by respective threshold voltage ranges. In the SBC mode, the cell can have states with threshold voltages corresponding to states of the MBC storage mode which are non-adjacent to each other to improve reliability characteristics of the cell.