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公开(公告)号:US11812620B2
公开(公告)日:2023-11-07
申请号:US18206040
申请日:2023-06-05
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han , Brian Cronquist
CPC classification number: H10B80/00 , H01L24/08 , H01L24/80 , H01L25/0657 , H01L25/18 , H01L25/50 , H10B12/20 , H01L2224/08145 , H01L2224/80895 , H01L2224/80896 , H01L2924/1431 , H01L2924/1436
Abstract: A semiconductor device, the device including: a first level including a plurality of first memory arrays, where the first level includes a plurality of first transistors and a plurality of metal layers; a second level disposed on top of the first level, where the second level includes a plurality of second memory arrays, where the first level is bonded to the second level, where the bonded includes oxide to oxide bonding regions and a plurality of metal to metal bonding regions, where the plurality of first memory arrays includes a plurality of first DRAM (Dynamic Random Access Memory) cells, and where the plurality of second memory arrays includes a plurality of second DRAM (Dynamic Random Access Memory) cells.
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公开(公告)号:US11800725B1
公开(公告)日:2023-10-24
申请号:US18104299
申请日:2023-02-01
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han , Brian Cronquist
CPC classification number: H10B80/00 , H01L23/481 , H01L23/5286 , H01L24/08 , H01L25/18 , H01L25/50 , H01L2224/08145
Abstract: A 3D device including: a first level including first transistors and a first interconnect; a second level including second transistors and overlaying the first level; and at least eight electronic circuit units (ECUs), where each of the at least eight ECUs includes a first circuit, the first circuit including a portion of the first transistors, where each of the at least eight ECUs includes a second circuit including a portion of the second transistors, where each of the at least eight ECUs includes a first vertical bus, where the first vertical bus provides electrical connections between the first circuit and the second circuit, where each of the at least eight ECUs includes at least one processor and at least one memory array, where the second level is bonded to the first level, and where the bonded includes oxide to oxide bonding regions and metal to metal bonding regions.
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公开(公告)号:US20230146353A1
公开(公告)日:2023-05-11
申请号:US17665560
申请日:2022-02-06
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han
IPC: H10B43/27 , H01L29/47 , H01L29/78 , H01L29/167 , H01L23/528 , H01L27/02 , H01L29/792 , H10B43/10 , H10B43/20
CPC classification number: H10B43/27 , H01L29/47 , H01L29/7827 , H01L29/167 , H01L23/5283 , H01L27/0207 , H01L29/792 , H10B43/10 , H10B43/20 , H10B41/10
Abstract: A 3D device, the device including: a first level including logic circuits; a second level including a plurality of memory circuits, where the first level is bonded to the second level, where the bonded includes oxide to oxide bonds, and where the first level includes at least one voltage regulator circuit.
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公开(公告)号:US20230015040A1
公开(公告)日:2023-01-19
申请号:US17951099
申请日:2022-09-23
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han , Brian Cronquist
IPC: H01L23/00 , H01L25/065 , H01L25/18 , H01L23/48 , H01L25/00
Abstract: A 3D device including: a first level including first transistors and a first interconnect; a second level including second transistors, the second level overlaying the first level; and at least eight electronic circuit units (ECUs), where each of the at least eight ECUs includes a first circuit, the first circuit including a portion of the first transistors, where each of the at least eight ECUs includes a second circuit, the second circuit including a portion of the second transistors, where each of the at least eight ECUs includes a first vertical bus, where the first vertical bus includes greater than eight pillars and less than three hundred pillars, where the first vertical bus provides electrical connections between the first circuit and the second circuit, where the second level is bonded to the first level, and where the bonded includes oxide to oxide bonding regions and metal to metal bonding regions.
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公开(公告)号:US20220149012A1
公开(公告)日:2022-05-12
申请号:US17581977
申请日:2022-01-24
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han , Brian Cronquist
IPC: H01L25/065 , H01L25/18 , H01L25/00
Abstract: A 3D device comprising: a first level comprising first transistors, said first level comprising a first interconnect; a second level comprising second transistors, said second level overlaying said first level; a third level comprising third transistors, said third level overlaying said second level; a plurality of electronic circuit units (ECUs), wherein each of said plurality of ECUs comprises a first circuit, said first circuit comprising a portion of said first transistors, wherein each of said plurality of ECUs comprises a second circuit, said second circuit comprising a portion of said second transistors, wherein each of said plurality of ECUs comprises a third circuit, said third circuit comprising a portion of said third transistors, wherein each of said ECUs comprises a vertical bus, wherein said vertical bus comprises greater than eight pillars and less than three hundred pillars and provides electrical connections between said first circuit and said second circuit.
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公开(公告)号:US11296115B1
公开(公告)日:2022-04-05
申请号:US17524737
申请日:2021-11-11
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han
IPC: H01L27/11582 , H01L29/47 , H01L29/78 , H01L29/167 , H01L23/528 , H01L27/11565 , H01L27/02 , H01L27/11578 , H01L29/792 , H01L27/11514 , H01L27/11551 , H01L27/11519
Abstract: A 3D device, the device including: a first level including logic circuits; a second level including a plurality of memory circuits, where the first level is bonded to the second level, where the bonded includes oxide to oxide bonds, and where the device includes first redundancy circuits to replace a faulty logic circuit and a second redundancy circuit to replace a faulty memory circuit.
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公开(公告)号:US11069697B1
公开(公告)日:2021-07-20
申请号:US17235879
申请日:2021-04-20
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han , Eli Lusky
IPC: G11C16/04 , H01L27/11556 , G11C5/06 , H01L27/11582 , H01L29/78
Abstract: A 3D memory device, the device including: a plurality of memory cells, where each of the plurality of memory cells includes at least one memory transistor, where each of the at least one memory transistor includes a source, a drain and a channel; a plurality of bit-line pillars, where each of the plurality of bit-line pillars is directly connected to a plurality of the source or the drain, where the bit-line pillars are vertically oriented, where the channel is horizontally oriented, and where the channel includes a circular shape or an ellipsoidal shape.
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公开(公告)号:US20210151450A1
公开(公告)日:2021-05-20
申请号:US16649660
申请日:2018-09-23
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han , Brian Cronquist , Eli Lusky
IPC: H01L27/11556 , H01L23/66 , H01L23/538 , H01L27/11582 , G11C5/02 , G11C5/06
Abstract: A 3D device, the device including: at least a first level including logic circuits; at least a second level including an array of memory cells; at least a third level including special circuits; and at least a fourth level including special connectivity structures, where the special connectivity structures include one of the following: a. waveguides, or b. differential signaling, or c. radio frequency transmission lines, or d. Surface Waves Interconnect (SWI) lines, and where the third level includes Radio Frequency (“RF”) circuits to drive the special connectivity structures, where the second level overlays the first level, where the third level overlays the second level, and where the fourth level overlays the third level.
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公开(公告)号:US20200013791A1
公开(公告)日:2020-01-09
申请号:US16483431
申请日:2018-02-03
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han , Eli Lusky
IPC: H01L27/11556 , H01L27/11582 , H01L21/28 , H01L29/423
Abstract: A 3D memory device, the device including: a first vertical pillar; a second vertical pillar, where the first vertical pillar and the second vertical pillar function as a source or a drain for a plurality of overlaying horizontally-oriented memory transistors, where the plurality of overlaying horizontally-oriented memory transistors are self-aligned being formed following the same lithography step; and memory control circuits, where the memory control circuits are disposed at least partially directly underneath the plurality of overlaying horizontally-oriented memory transistors, or are disposed at least partially directly above the plurality of overlaying horizontally-oriented memory transistors.
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公开(公告)号:US20170133395A1
公开(公告)日:2017-05-11
申请号:US15344562
申请日:2016-11-06
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Jin-Woo Han
IPC: H01L27/115 , G11C16/04 , G11C16/16 , G11C16/08 , G11C16/10 , H01L29/792 , G11C14/00
CPC classification number: H01L27/11568 , G11C11/5621 , G11C14/0018 , G11C16/0466 , G11C16/08 , G11C16/10 , G11C16/16 , G11C16/24 , H01L27/11565 , H01L28/00 , H01L29/7831 , H01L29/792 , H01L29/7923
Abstract: A semiconductor device, including: a plurality of non-volatile memory cells including a first memory cell and a second memory cell, where the plurality of non-volatile memory cells includes source diffusion lines and drain diffusion lines, at least one of the source diffusion lines and drain diffusion lines are shared by the first memory cell and the second memory cell, where the first memory cell includes a thin tunneling oxide of less than 1 nm thickness, and where the second memory cell includes a thick tunneling oxide of greater than 2 nm thickness.
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