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    Integrated circuit including detection circuit to detect electrical energy delivered by a thermoelectric material
    11.
    发明授权
    Integrated circuit including detection circuit to detect electrical energy delivered by a thermoelectric material 有权
    集成电路，包括检测电路，用于检测由热电材料传递的电能

    公开(公告)号：US08502383B2

    公开(公告)日：2013-08-06

    申请号：US13243620

    申请日：2011-09-23

    Applicant: Pascal Fornara ,  Christian Rivero

    Inventor： Pascal Fornara ,  Christian Rivero

    IPC: H01L23/48 ,  H01L23/52 ,  H01L29/40 ,  H01L27/10 ,  H01L29/73 ,  H01L29/74

    CPC classification number: H01L23/576 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: An integrated circuit includes active circuitry disposed at a surface of a semiconductor body and an interconnect region disposed above the semiconductor body. A thermoelectric material is disposed in an upper portion of the interconnect region away from the semiconductor body. The thermoelectric material is configured to deliver electrical energy when exposed to a temperature gradient. This material can be used, for example, in a method for detecting the repackaging of the integrated circuit after it has been originally packaged.

    Abstract translation: 集成电路包括设置在半导体主体的表面的有源电路和设置在半导体主体上方的互连区域。 热电材料设置在互连区域的远离半导体本体的上部。 热电材料被配置为当暴露于温度梯度时传递电能。 该材料可以用于例如在最初封装集成电路的重新包装检测方法之后。

    Device for detecting an attack against an integrated circuit
    12.
    发明授权
    Device for detecting an attack against an integrated circuit 有权
    用于检测针对集成电路的攻击的装置

    公开(公告)号：US08426234B2

    公开(公告)日：2013-04-23

    申请号：US13239118

    申请日：2011-09-21

    Applicant: Pascal Fornara ,  Christian Rivero

    Inventor： Pascal Fornara ,  Christian Rivero

    IPC: H01L23/02

    CPC classification number: G06K19/07372 ,  H01L23/576 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: An integrated circuit including an intrusion attack detection device. The device includes a single-piece formed of a conductive material and surrounded with an insulating material and includes at least one stretched or compressed elongated conductive track, connected to a mobile element, at least one conductive portion distant from said piece and a circuit for detecting an electric connection between the piece and the conductive portion. A variation in the length of said track in an attack by removal of the insulating material, causes a displacement of the mobile element until it contacts the conductive portion.

    Abstract translation: 一种包括入侵攻击检测装置的集成电路。 该装置包括由导电材料形成并且被绝缘材料包围的单件，并且包括连接到移动元件的至少一个拉伸或压缩细长导电轨道，远离所述件的至少一个导电部分和用于检测的电路 该片与导电部之间的电连接。 在通过去除绝缘材料的攻击中所述轨道的长度的变化导致移动元件的位移，直到其接触导电部分。

    DEVICE FOR DETECTING THE THINNING DOWN OF THE SUBSTRATE OF AN INTEGRATED CIRCUIT CHIP
    15.
    发明申请
    DEVICE FOR DETECTING THE THINNING DOWN OF THE SUBSTRATE OF AN INTEGRATED CIRCUIT CHIP 有权
    用于检测集成电路芯片的基板的薄型化的装置

    公开(公告)号：US20100315108A1

    公开(公告)日：2010-12-16

    申请号：US12797897

    申请日：2010-06-10

    Applicant: Pascal Fornara ,  Christian Rivero

    Inventor： Pascal Fornara ,  Christian Rivero

    IPC: G01R27/08

    CPC classification number: G01R31/2851 ,  G01L9/0042 ,  G06K19/07363 ,  G06K19/07381 ,  H01L22/34 ,  H01L23/576 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: A device for detecting the thinning down of the substrate of an integrated circuit chip, including, in the active area of the substrate, bar-shaped diffused resistors connected as a Wheatstone bridge, wherein: first opposite resistors of the bridge are oriented along a first direction; the second opposite resistors of the bridge are oriented along a second direction; and the first and second directions are such that a thinning down of the substrate causes a variation of the imbalance value of the bridge.

    Abstract translation: 一种用于检测集成电路芯片的基板的减薄的装置，包括在基板的有源区域中连接为惠斯通电桥的条形扩散电阻器，其中：桥的第一相对电阻器沿第一 方向; 桥的第二相对电阻器沿着第二方向定向; 并且第一和第二方向使得衬底的变薄导致桥的不平衡值的变化。

    DEVICE FOR DETECTING AN ATTACK AGAINST AN INTEGRATED CIRCUIT
    16.
    发明申请
    DEVICE FOR DETECTING AN ATTACK AGAINST AN INTEGRATED CIRCUIT 有权
    用于检测针对集成电路的攻击的装置

    公开(公告)号：US20100052128A1

    公开(公告)日：2010-03-04

    申请号：US12538030

    申请日：2009-08-07

    Applicant: Pascal Fornara ,  Christian Rivero

    Inventor： Pascal Fornara ,  Christian Rivero

    IPC: H01L23/00 ,  H01L21/321

    CPC classification number: G06K19/07372 ,  H01L23/576 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: An integrated circuit including an intrusion attack detection device. The device includes a single-piece formed of a conductive material and surrounded with an insulating material and includes at least one stretched or compressed elongated conductive track, connected to a mobile element, at least one conductive portion distant from said piece and a circuit for detecting an electric connection between the piece and the conductive portion. A variation in the length of said track in an attack by removal of the insulating material, causes a displacement of the mobile element until it contacts the conductive portion.

    Abstract translation: 一种包括入侵攻击检测装置的集成电路。 该装置包括由导电材料形成并且被绝缘材料包围的单件，并且包括连接到移动元件的至少一个拉伸或压缩细长导电轨道，远离所述件的至少一个导电部分和用于检测的电路 该片与导电部之间的电连接。 在通过去除绝缘材料的攻击中所述轨道的长度的变化导致移动元件的位移，直到其接触导电部分。

    Device for detecting an attack against an integrated circuit
    19.
    发明授权
    Device for detecting an attack against an integrated circuit 有权

    公开(公告)号：US08610256B2

    公开(公告)日：2013-12-17

    申请号：US12538030

    申请日：2009-08-07

    Applicant: Pascal Fornara ,  Christian Rivero

    Inventor： Pascal Fornara ,  Christian Rivero

    IPC: H01L23/02

    CPC classification number: G06K19/07372 ,  H01L23/576 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: An integrated circuit including an intrusion attack detection device. The device includes a single-piece formed of a conductive material and surrounded with an insulating material and includes at least one stretched or compressed elongated conductive track, connected to a mobile element, at least one conductive portion distant from said piece and a circuit for detecting an electric connection between the piece and the conductive portion. A variation in the length of said track in an attack by removal of the insulating material, causes a displacement of the mobile element until it contacts the conductive portion.

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