Abstract:
A delay circuit includes a clock delay line, a command delay line, a delay line control block, and a shared shift register block. The clock delay line delays an input clock and generates a delayed clock. The command delay line delays a command signal and generates a delayed command signal. The delay line control block generates a control signal according to a result of comparing phases of a feedback clock which is generated as the delayed clock is delayed by a modeled delay value and the input clock. The shared shift register block sets delay amounts of the clock delay line and the command delay line to be substantially the same with each other, in response to the control signal.
Abstract:
A clock generation circuit includes a delay line, which delays an input clock and generates a delayed clock, a delay modeling unit, which delays the delayed clock by a modeled delay value and generates a feedback clock, a phase detection unit, which compares phases of the input clock and the feedback clock and generates a phase detection signal, a filter unit, which receives the phase detection signal and generates phase information, generates an update signal when a difference between the numbers of phase detection signals with a first and a second level generated is greater than or equal to a threshold value, and generates the update signal after a lapse of a predetermined time when the difference is less than the threshold value, and a delay line control unit, which sets a delay value of the delay line in response to the update signal and the phase information.
Abstract:
A semiconductor device includes a strobe transmission circuit configured to output an oscillation strobe signal, through a first delay path circuit, as a strobe signal when a first measurement operation is performed and configured to output the oscillation strobe signal through a second delay path circuit as the strobe signal when a second measurement operation is performed, and a calibration circuit configured to compare the number of times the strobe signal toggles during the first measurement operation to the number of times the strobe signal toggles during the second measurement operation to calibrate the delay amounts of the first and second delay path circuits to be the same.
Abstract:
A processing-in-memory (PIM) device includes a plurality of multiplication and accumulation (MAC) units, each of the MAC units including a memory bank and a MAC operator, and a control circuit configured to control the plurality of MAC units to perform an all MAC mode operation in which MAC operations are performed in all MAC units, among the plurality of MAC units, or a dispersion MAC mode operation in which the MAC operations are performed in some MAC units, among the plurality of MAC units.
Abstract:
A bias generation circuit may include a bias generator and compensator. The bias generator may be configured to generate a bias voltage based on a reference voltage. The compensator may be configured to detect level changes of a power voltage. The compensator may be configured to control a level of the bias voltage based on detection results.
Abstract:
A transceiver includes a duobinary conversion circuit configured to determine a level of an input signal which is a duobinary signal according to an intermediate voltage, a first reference voltage higher than the intermediate voltage, and a second reference voltage lower than the intermediate voltage, and to convert the input signal into a non-return-to-zero (NRZ) signal; and a control circuit configured to generate one or more control signals to substantially remove inter-symbol interference (ISI) between symbols of the input signal, and to adjust the first reference voltage, or the second reference voltage, or both according to the level of the input signal.
Abstract:
A buffering circuit includes a first signal input/output unit that generates an output bar signal in response to an input signal, a second signal input/output unit that generates an output signal in response to an input bar signal, and a connection unit that electrically connects and disconnects an output node of the first signal input/output unit and a current sink node of the second signal input/output unit to/from each other in response to a control signal, and electrically connects and disconnects a current sink node of the first signal input/output unit and an output node of the second signal input/output unit to/from each other in response to the control signal.
Abstract:
A semiconductor memory apparatus includes a resistive memory cell; a data sensing unit configured to sense an output voltage, formed by a sensing current supplied to the resistive memory cell, based on a reference voltage, and output data having a value corresponding to the sensing result; and a reference voltage generation unit comprising a dummy memory cell including first and second resistors having first and second resistance values, respectively, and configured to output a voltage formed by the sensing current supplied to the dummy memory cell as the reference voltage.
Abstract:
A reset signal generation apparatus includes a reset signal generation unit and a reset signal expansion unit. The reset signal generation unit enables a reset signal and an enable signal in response to a reset input signal, and disables the reset signal in response to a pulse width extension signal. The reset signal expansion unit generates the pulse width extension signal that is enabled for a predetermined time, in response to the enable signal.
Abstract:
A bias generation circuit may include a bias generator and compensator. The bias generator may be configured to generate a bias voltage based on a reference voltage. The compensator may be configured to detect level changes of a power voltage. The compensator may be configured to control a level of the bias voltage based on detection results.