Abstract:
This disclosure describes techniques for generating physically unclonable functions (PUF) from non-volatile memory cells. The PUFs leverage resistance variations in non-volatile memory cells. Resistance variations in array of non-volatile memory cells may be produce a bitstring during an enrollment process. The bitstring may be stored in the non-volatile memory array. Regeneration may include retrieving the bitstring from the non-volatile memory array.
Abstract:
This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.
Abstract:
A Hardware-Embedded Delay PUF (HELP) leverages entropy by monitoring path stability and measuring path delays from core logic macros. HELP incorporates techniques to deal with bias. A unique feature of HELP is that it may compare data measured from different test structures. HELP may be implemented in existing FPGA platforms. HELP may leverage both path stability and within-die variations as sources of entropy.
Abstract:
This disclosure describes techniques for generating physically unclonable functions (PUF) from non-volatile memory cells. The PUFs leverage resistance variations in non-volatile memory cells. Resistance variations in array of non-volatile memory cells may be produce a bitstring during an enrollment process. The bitstring may be stored in the non-volatile memory array. Regeneration may include retrieving the bitstring from the non-volatile memory array.
Abstract:
A Hardware-Embedded Delay PUF (HELP) leverages entropy by monitoring path stability and measuring path delays from core logic macros. HELP incorporates techniques to deal with bias. A unique feature of HELP is that it may compare data measured from different test structures. HELP may be implemented in existing FPGA platforms. HELP may leverage both path stability and within-die variations as sources of entropy.
Abstract:
A Hardware-Embedded Delay PUF (HELP) leverages entropy by monitoring path stability and measuring path delays from core logic macros. HELP incorporates techniques to deal with bias. A unique feature of HELP is that it may compare data measured from different test structures. HELP may be implemented in existing FPGA platforms. HELP may leverage both path stability and within-die variations as sources of entropy.